Manuel d'utilisation / d'entretien du produit E1445A du fabricant Agilent Technologies
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Agilent 75000 SERIES C Agilent E1445A Arbitrary Function Generator Servi ce Manu al Seri al Numbers This manua l a ppli es dir ectl y to ins trume nt s w ith se r ia l num be r s prefixed with 31 44A. Copyr igh t© Ag ilen t Techn olo gies , Inc . 1992- 2005 Ma nu al Par t Numb er: E144 5-9 00 11 Prin te d: Nov emb er 2005 Editio n 2 Print ed in U.
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Contents Cha pt er 1 - Gen eral In fo rmat ion Intr oduct ion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 Safet y Con sid erati ons . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 Warni ngs an d Caut ions .
Chap te r 3 - A d jus tme n ts Intr oduct ion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 83 Requ ired Eq uip ment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 83 Recomm en ded En vir onment .
Ce rtif ic ati o n Agile nt T echno logies cer tifi es tha t this pr oduct m et it s pu blishe d spec ificatio ns at th e time of ship ment from the f acto ry.
F ra m e or chass is gro und t er mi nal — ty pi - cally c onn ects to the equ ipment’ s metal frame . Alter nati ng c urr ent ( AC). Dire ct cu r re nt (D C) . Indi ca tes ha za rd ous volta ge s. Ca lls atte nt i on to a pr oce dur e, pr ac tic e, or condi t ion t hat co ul d ca use bodi ly i nj ury or deat h.
DECLARATION OF CONFORMITY According to ISO/IEC Guide 22 and CEN/CENELEC EN 45014 Revision: B.01 Issue Date: 1 June 2001 Document E1445A.DOC Manufacturer’s Name: Agilent Technologies, Incorporated Manufacturer’s Address: 815 – 14 th St.
Notes 6 Agi le nt E1 44 5A Se rv i ce M an ua l.
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Chapter 1 Genera l Informati on Introduction This manu al co nta i ns in fo rm a ti on r eq uir e d to te st, trou ble sh oot , and r e pa ir the Agi lent E144 5A C-Size VXI Arbit rary Fu nc ti on Ge ne rat or (AFG). See th e Ag il en t E14 45A User’ s Man ual for addi ti onal i nforma ti on.
Safe ty Considerations This product is a Safety Cl ass I i nst ru me nt tha t i s pr ovi de d wit h a prote ct iv e earth t ermin al whe n insta lle d in t he m ainf rame .
WARNI NG USING AUTOTRANSFORMERS. If t he mainframe is to be en er g ized vi a an a u tot r an sf or m er ( for volta ge reduc t io n) ma ke sure t he common terminal is connected to neutral (that is, the grounde d sid e of the ma in’s s upply). CAPACITOR VOLTAG ES.
Inspection/ Shipping This se ct io n desc ribe s in it ia l ( in comi ng) ins pect io n an d shi ppi ng gui de li nes fo r t he AF G . Initi al Insp e ctio n Use the st ep s in F igu re 1-2 a s gui deli nes to pe r for m in it ia l i nspec ti on of the AFG.
Shippi ng Gui de lin es Fo ll ow the st eps in F igu re 1-3 to retu rn the AFG to an Agile nt Tech nol ogi es Sales and Supp ort Offic e or Servi ce Cente r. * We r ecom mend th at y ou us e t he sam e sh i ppi ng m ate rial s as th os e us ed in f ac tor y pa ckag ing (av ail able f rom Ag il en t T ech n ologie s).
Environment The rec omm e nde d ope r atin g environm ent for the Agilent E144 5A AFG i s: Environment Temperature Humidity Operating 0 o C t o +55 o C <65% rel ative (0 o C to +40 o C) Storage and.
Recommended Test Equipment Table 1- 1 li sts the te st eq uipment rec omm ended for testi ng, adju sting, an d ser vici ng the AF G. Es sentia l req uiremen ts f or eac h piece o f tes t equi pment are desc ribe d in the Re qui re me nts colum n. Table 1-1.
16 Gen eral Inf ormatio n Agile nt E14 45A S ervic e Manua l.
Chapter 2 Verification Tests Introduction The thre e leve ls of test pro c edu res de scribed in this cha pte r are used to verify tha t the Agil en t E1445 A: • is fully func ti onal (Fu nc tion a .
Comma nd Co upling Many of the AFG SCPI comm ands are value- coupl ed. In or der to prev ent "Se tti ngs Conflict" e rror s, co uple d c om mands must be sent con tigu ously by placing them in th e sam e prog r am line , or by suppre ssi ng the end-of- line termin ator.
Func tion al Veri fi cati on : Se lf-T est Descripti on The AF G self-t est p erforms the fo llowi ng intern al c hecks: • interna l int e rrupt line s • wave form sele ct RAM • segm ent se quen.
Fu nc tion al Veri fica tion : Ref I n/M ark er Ou t Test Descripti on The pur pos e of thi s te st is to chec k the Re f /S a mpl e In and Ma r ke r Ou t por ts. An ex te r na l ref e renc e is c onne c te d to th e Ref/Samp le In port and sen t to the Mark er Ou t port.
Func tion al Veri fi cat ion: St art A rm I n Test Descripti on The p urpo se of t his t est is to check t he St ar t Arm In por t. Th e "T RIG OUT " port of the Co mman d Mod ule is used to send a S ta r t Arm sign a l to the A FG. Te st P roc edur e 1.
Fun ctio nal V erific atio n: Star t Ar m In Te st (con t’d ) Te st P roc edur e (c ont’ d) 4. Set up the AFG to outpu t a 1 MHz sine w av e, with an exte r n a l S ta rt Arm so urce: FREQ 1E 6; Se t fr e q to 1 M H z :V OLT 4VP P Set AFG am pl it ude ARM :LAY 2 :SOU R EXT External St ar t Arm sourc e IN IT :IMM I nit ia te 5.
Func tion al Veri fica ti on: Gat e In Test Descripti on The pur pos e of thi s te st is to chec k the ga tin g f unc tion . The "TRIG OU T " port of the Co mmand Mod ule is used to gat e th e ou tput . Te st P roc edur e 1. Reset th e AFG: *RST;*CLS Reset AFG an d cl ear statu s registe rs 2.
Func tion al Veri fica tion : Gate In Te st ( cont’ d) Te st P roc edur e (c ont’ d) 4. Se t up t h e A F G t o ou t p ut a 1 MHz sin e wa ve wi th a n ex te rn al g at e sour ce: TR IG: GATE : SO.
Func tion al Veri fica tion : Outpu t Rel ay T est Descripti on The purpos e of thi s te st is to check the out put r e la y. Te st P roc edur e 1. Reset th e AFG: *RST;*CLS Reset AFG an d cl ear statu s registe rs 2. Set up eq uipm e nt a s shown in Figur e 2-4 : 3.
Func tion al Veri fi cati on Ex am ple P r og ram This pro gram perform s the Func tional Verif ic a tion Test s fo r th e AF G . An Agi lent E140 5/E1 4 06 Comm an d Mo dule is r e quire d f o r this te st .
Func tion al Veri fi cati on Exam pl e Pr og ram (co nt ’d) 450 !---------- Su bpr ogr am s ---------- 460 SUB Re set_afg 470 COM @Afg,@Cm d_mod,INT EGER Don e 480 OUTP UT @A fg ;"* RS T; *CLS&.
Func tion al Veri fi cati on Exam pl e Pr og ram (co nt ’d) 890 Reset_af g 900 ! 910 CLEAR SCREEN 920 PRINT "REF IN/MARKER OUT TEST" 930 P RINT 940 ! 950 !Test conne ctions 960 PRINT "Conn ect Scope to ’M arker Out ’ on the E 144 5A.
Func tion al Veri fi cati on Exam pl e Pr og ram (co nt ’d) 1340 PRI NT "Ve rif y th at no signal app ears on the sco pe. " 1350 PRIN T "Press ’Continu e’ to se nd a STA RT A RM .
Func tion al Veri fi cati on Exam pl e Pr og ram (co nt ’d) 1760 REPEAT 1770 OUTP UT @ C md_m od; " O UTP :E XT: LE V 1" 1780 WAIT 1 1790 OUTP UT @ C md_m od; " O UTP :E XT: LE V 0&qu.
Func tion al Veri fi cati on Exam pl e Pr og ram (co nt ’d) 2140 SUB Key _press 2150 COM @Afg, @ Cm d_m od , INTEG ER Don e 2160 Done =1 2170 DISP 2180 SUBEN D 2190 ! 2200 SUB W ai t _for_ cont 2210.
O p er at i o n Verification Operation Veri ficati on is a subset of th e Pe rform a nce Ve rifi cati on te sts that follow. For the AF G , Op era tio n Verifica tio n c o nsis ts of the follow i ng t.
Test 2-1: DC Zer os Descripti on The pur pos e of thi s te st is to verify th at the AFG me e ts it s specificat ions for DCV acc uracy for an outp ut of zer o volt s. An ar bit rar y wavefo rm consi stin g of zer os is us e d. The am pli tude is varied in or de r to te st e a ch atte nuato r.
Test 2-1: DC Zer os (cont’ d) Te st P roc edur e (c ont’ d) 3. Cr eat e a user-def ined wavefo rm made up of zeros: LIST: SEG M: SEL ZE R OS Select segm ent name LIST: SEGM: DEF 8 # of segme nt po.
Test 2-1: DC Zer os (cont’ d) Te st P roc edur e (c ont’ d) Table 2- 1. DC Zero s Test P oints Attenuation (d B) Ampl itud e (vo l ts ) Filter Test Limits (vo l ts ) 0 .99 1 2 4 8 13 14 30 10.23750 9.13469 9.12416 8.13192 6.45941 4.07560 2.29187 2.
Test 2-1: DC Zer os (cont’ d) Ex am ple P r og ram This pro gr am pe rform s the DC Zeros test. An arbit r ary wave fo rm, con sist ing of z eros , is use d with va riou s amp lit u de s to test a variet y of atten ua tor an d filt er combin at ion s .
Test 2-1: DC Zer os (cont’ d) Exam pl e Pr og ram (co nt ’d) 440 PRINT 460 FOR Filter=0 TO 2 470 S ELECT Filt er 480 CASE 0 !No filter 490 OUT PUT @Afg ;"OUTP: FILT OFF" 500 F il ter$=&q.
Test 2-2: DC Ac curacy Descripti on The pur pos e of thi s te st is to verify th at the AFG me e ts it s specificat ions for DC acc uracy . Equi p men t Setu p • Conne c t equipm ent as shown in Figur e 2-5 • Set DMM to DCV, aut o ra nge Te st P roc edur e 1.
Test 2-2: DC Ac curacy (co nt ’d) Te st P roc edur e (c ont’ d) Table 2- 2. DC Accu racy Test Points Amplitude (volts ) Filter Test L imits (vo l ts ) 10.2375 5.0 0.0 -5. 0 -10.24 10.2375 -10.24 10.2375 -10.24 None None None None None 250 kHz 250 kHz 10 MHz 10 MHz 10.
Test 2-2: DC Ac curacy (co nt ’d) Exam pl e Pr og ram (co nt ’d) 270 !--- ---- -- - Set u p A F G ---- -- ---- 280 OUTPUT @Af g; "*RST" !R eset AFG 290 WAIT .
Test 2-3: DC O ffset Descripti on The pur pos e of thi s te st is to verify th at the AFG me e ts it s specificat ions for DC o ffset ac cu racy. Equi p men t Setu p • Conne c t equipm ent as shown in Figur e 2-5 • Set DMM to DCV, aut o ra nge Te st P roc edur e 1.
Test 2-3: DC O ffset (c on t’d ) Te st P roc edur e (c ont’ d) Perform st e ps 5 - 7 for e ac h o ffset li sted in Table 2- 3: 5. If neces sary, chan ge t he AFG ou tput am pli tude : VOLT:OFFS 0; Se t o f fset to 0 :V OLT <amplit ude> Set ampl it ude where <amp litude > is t he v alue s peci fied in Tabl e 2-3 .
Test 2-3: DC O ffset (c on t’d ) Ex am ple P r og ram This pro gram perform s the DC Off set Test . 10! RE-STORE " DC_OFFSET" 20 COM @Afg 30 DIM Offs et(1:6 ) 40 ! 50 !- -- -- -- --- S et .
Test 2-3: DC O ffset (c on t’d ) Exam pl e Pr og ram (co nt ’d) 440 FOR I= 1 TO 6 450 IF I<=4 THEN 460 V out= 2.2919 470 ELSE 480 Vout=.407 56 490 E ND IF 500 ! 510 I F Vout <>Vou t _ol d.
Test 2-4: AC Ac curacy Descripti on The pur pos e of thi s te st is to verify th at the AFG me e ts it s specificat ions for AC acc uracy at 1 kHz. Equi p men t Setu p • Conne c t equipm ent as shown in Figur e 2-5 • Set DMM to ACV, aut o ra nge Te st P roc edur e 1.
Test 2-4: AC Ac curacy (co nt ’d) Te st P roc edur e (c ont’ d) 4. Set t he AFG output amp litude : VOLT <amplitude> VR M S Se t amp l i t ud e where <amp litude > is t he v alue s peci fied in Tabl e 2-4 . 5. Tri gger t he DM M and record t he r eadi ng.
Test 2-4: AC Ac curacy (co nt ’d) Ex am ple P r og ram Thi s progra m per forms t he AC Acc uracy T est. 10! RE-STORE "AC_LEVELS" 20 DIM Vout(1:9) ,Fi lter(1 :9 ) 30 ! 40 !- -- -- -- --- S.
Test 2-4: AC Ac curacy (co nt ’d) Exam pl e Pr og ram (co nt ’d) 420 FOR I= 1 TO 9 430 SELECT Filt er(I ) 440 CASE 0 450 OUT PUT @Afg ;"OUTP: FILT OFF" !No filt er 460 F il ter$="NO.
Test 2-5: AC F lat nes s - 250 kHz F ilter Descripti on The pur pos e of thi s te st is to verify th at the AFG me e ts it s specificat ions for AC flatne ss with the 250 kHz filt er e na b le d. Equi p men t Setu p • Conne c t equipm ent as shown in Figur e 2-6 • Set DMM to ACV, aut o ra nge Te st P roc edur e 1.
Test 2-5: AC Flat nes s - 250 kHz F ilter ( con t’d) Te st P roc edur e (c ont’ d) 3. Set t he AFG output to the re ference f requenc y ( 1 kHz ): FREQ 1000 Set freque ncy 4. Measure the am pli t ude with the DMM a nd c onv e rt th e re ad ing to dBm.
Test 2-5: AC Flat nes s - 250 kHz F ilter ( con t’d) Te st P roc edur e (c ont’ d) Table 2-5. AC F latn ess Test P oints - 250 kHz Filt er Freq uen cy (Hz) Test Limits* ± (dB error) Freq uenc y (Hz ) Test Limi ts* ± (dB erro r) 10E3 20E3 30E3 40E3 50E3 60E3 70E3 80E3 90E3 100E3 110E3 120E3 130E3 0.
Test 2-6: AC F lat nes s - 10 MH z Filte r Descripti on The pur pos e of thi s te st is to verify th at the AFG me e ts it s specificat ions for AC flatne ss with the 10 M Hz filt er e na ble d. Equi p men t Setu p • Conne c t equipm ent as shown in Figur e 2-6 • Set DMM to ACV, aut o ra nge Te st P roc edur e 1.
Test 2-6: AC Flat nes s - 10 M Hz Filte r ( cont’d ) Te st P roc edur e (c ont’ d) 7. Set up the Power Me te r: Units - Watts Power Range - aut o Reference Oscillator - O N NOTE Follo w the Pow e r Mete r m an ufactu re r’ s inst ructions for perform i ng an auto ca libr ation and corr e cti ng for the powe r se ns or.
Test 2-6: AC Flat nes s - 10 M Hz Filte r ( cont’d ) Te st P roc edur e (c ont’ d) 10. Ca lc ul at e th e corr ecti on factor th at wi ll be use d to r e fer e nc e th e Pow e r M et er to th e DM.
Test 2-6: AC Flat nes s - 10 M Hz Filte r ( cont’d ) Te st P roc edur e (c ont’ d) Table 2- 6. AC F latness Test Poin ts - 10 MHz Filter Freq uen cy (Hz) Test Limits* ± (dB error) Freq uenc y (Hz ) Test Limi ts* ± (dB erro r) 400E3 800E3 1.2E6 1.
Test 2-7: F reque ncy Accu ra cy Descripti on The pur pos e of thi s te st is to verify th at the AFG me e ts it s specificat ions for fr eque nc y accura cy . Equi p men t Setu p • Conne c t equipm ent as shown in Figur e 2-8 • Set Coun ter to: Freque nc y, 50 Ω input im pedance Te st P roc edur e 1.
Test 2-7: F reque ncy Accu ra cy (con t’d ) Te st P roc edur e (c ont’ d) 3. Set ref ere nc e osc illa tor to INT1 or I NT 2, as sp e cifie d in Tabl e 2-7: ROSC:SOUR I NT1 Set ref os c t o INT1 or ROSC:SOUR I NT2 Set ref os c t o INT2 4.
Test 2-7: F reque ncy Accu ra cy (con t’d ) Te st P roc edur e (c ont’ d) Tabl e 2-7. Freq uency Accuracy T est P oints Ref Oscillator Source M arker Source Squarewave Frequ ency (Hz) Test Limi ts.
Test 2-7: F reque ncy Accu ra cy (con t’d ) Exam pl e Pr og ram (co nt ’d) 250 !- -- -- ---- - S et u p A FG - ---- -- --- 260 OUTPUT @A fg;" *RST" !R eset AFG 270 WAIT .
Test 2-8: Du ty Cy cle Descripti on The pur pos e of thi s te st is to verify th at the AFG me e ts it s specificat ions for squa re wa ve duty cycle. Du ty cy cle i s d eterm ined by meas uri ng pos itiv e pulse width.
Test 2-8: Du ty Cy cle (co nt’ d) Te st P roc edur e (c ont’ d) 4. Se t the AFG fr eque ncy ran ge as speci fied in Tabl e 2-8 : FR EQ :RA NG MA X Enabl e dou bli ng or FR EQ :RA NG MI N Disa ble doub ling 5.
Test 2-8: Du ty Cy cle (co nt’ d) Ex am ple P r og ram This pro gr am pe rform s the Duty Cyc le Test . 10! RE-STORE " DUTY_CYCLE" 20 DIM Freq(1:4) , Range $( 1 :4)[10] 30 ! 40 !- -- -- --.
Test 2-8: Du ty Cy cle (co nt’ d) Exam pl e Pr og ram (co nt ’d) 410 ! Take r eadi ng s her e 420 PRI NT "Out pu t Frequ ency =";Freq( I );" Hz " 430 PRI NT 440 PRINT "Rea d posit i ve pulse width ( aver age at leas t 10 period s).
Test 2-9: T otal H arm on ic Di sto rtion Descripti on The pur pos e of thi s te st is to verify th at the AFG me e ts it s specificat ions for sin e wave total harmo n ic dist ortion (THD) .
Test 2-9: T otal H arm on ic Di sto rtion (co nt ’d) Te st P roc edur e 1. Reset th e AFG: *RST;*CLS Reset AFG an d cl ear statu s registe rs 2. Se t the AFG t o outp ut a sine wave wi th th e 10 M .
Test 2-9: T otal H arm on ic Di sto rtion (co nt ’d) Te st P roc edur e (c ont’ d) Table 2-9. T HD Test Points Frequency (Hz ) Tes t Lim its * (dBc) 100 E3 250 E3 1 E6 4 E6 10 E6 -60 -60 -48 -36 -36 * T hrough 9th harm onic Ex am ple P r og ram This pro gr am perfor m s the Tota l Ha rmoni c Distortio n Te s t.
Test 2-9: T otal H arm on ic Di sto rtion (co nt ’d) Exam pl e Pr og ram (co nt ’d) 230 PRINT "Con nect Spectrum Anal yze r to AFG O utput . " 240 DISP "Pre ss ’ C onti nue’ whe.
Test 2-9: T otal H arm on ic Di sto rtion (co nt ’d) Exam pl e Pr og ram (co nt ’d) 600 ! Mea sur e har mo ni cs 2- 9 610 Sum_amp_s qr= 0 620 F OR Har monic=2 TO 9 630 GOS UB Meas_a mp 640 Sum_amp.
Test 2-10 : S pur iou s/No n-H armo nic Dist or tion Descripti on The pur pos e of thi s te st is to verify th at the AFG me e ts it s specificat ions for non -harm onic and spu rious di stortion.
Test 2-10 : S pur iou s/No n-H armo nic Dist or tion ( con t’d) Te st P roc edur e (c ont’ d) Pe r form st e ps 3 an d 4 f or ea ch f req u enc y ran ge listed in Tabl e 2-10 : 3. Se t the Spect ru m Analyze r start freque nc y and stop frequen cy to th e values li sted in Table 2- 10.
Test 2-10 : S pur iou s/No n-H armo nic Dist or tion ( con t’d) Ex am ple P r og ram This pro gr am pe rfor m s the Sp ur ious /Non-harmo nic Tes t. 10 ! RE-ST ORE " NON_HARM" 20 DIM Start.
Test 2-10 : S pur iou s/No n-H armo nic Dist or tion ( con t’d) Exam pl e Pr og ram (co nt ’d) 400 !- -- -- ---- - P e r form tes t -- ---- -- -- 410 FOR I= 1 TO 9 420 CL EAR SCREE N 430 PRINT &qu.
Performance Test Record Ta bl e 2- 11 , Performan ce T est Recor d for th e Agile nt E144 5A AFG , i s a form you c a n co py a nd use to r e co rd perfo rma nc e ve ri ficati on test result s for the AFG. Tabl e 2-11 shows AF G accur acy , m easu rem ent unc e rtainty, and t est ac curacy r at io ( TAR) va lues.
Te st Ac cu rac y Ratio (TA R) Test Accurac y Rati o (TAR ) for the E144 5A is defined as: AFG Accur acy/ Measure ment Un cer taint y, i.e. , TA R = Max imum − Expected Reading Measurement Uncertaint y For singl e-si ded measure ments , Test Acc ur acy R atio is no t defined, so ’NA’ (Not A ppl ic a ble ) wil l ap pear in the TAR column .
Table 2- 11. Perfo rmance Test Reco rd fo r the Ag ilent E 1445A (Pag e 1 of 7) Test Fa cility: Name _____ ________ ____ ________ ____ ____ ____ Address _____ ________ ________ ________ ________ City/Stat e __ ________ ____ ________ ____ ________ _ Phon e _____ ________ ____ ____ ________ ____ ____ Repo rt No.
Table 2- 11. P erformance T est Record f or t he Agi lent E1445A ( Page 2 of 7) Mode l ______ ____ ________ ____ ____ ___ Report No. ________ ____ ________ ____ ____ Da te _______ ________ Test Equipm en t Used : De scr ip tion Mode l No. Trace N o. Cal D ue Dat e 1.
Table 2- 11. Perfo rmance Test Reco rd fo r the Ag ilent E 1445A (Pag e 3 of 7) Mode l ______ ____ ________ ____ ____ ___ Report No. ________ ____ ________ ____ ____ Da te _______ ________ Test Desc ription* Minimum M easure d Re ading Maxi mum Mea s Uncert TAR Test 2-1.
Table 2- 11. Perfo rmance Test Reco rd fo r the Ag ilent E 1445A (Pag e 4 of 7) Mode l ______ ____ ________ ____ ____ ___ Report No. ________ ____ ________ ____ ____ Da te _______ ________ Test Descri ption Minimum M easure d Re ading Maxi mum Mea s Uncert TAR Te st 2-2.
10 MHz Fi lte r: 7.239 V (0 dB att en) 7.1561 _____ ____ ___ 7. 322 8 2.4 6E -3 > 10:1 Table 2- 11. Perfo rmance Test Reco rd fo r the Ag ilent E 1445A (Pag e 5 of 7) Mode l ______ ____ ________ ____ ____ ___ Report No.
Table 2- 11. Perfo rmance Test Reco rd fo r the Ag ilent E 1445A (Pag e 6 of 7) Mode l ______ ____ ________ ____ ____ ___ Report No. ________ ____ ________ ____ ____ Da te _______ ________ Test Descri ption Minimum M easure d Re ading Maxi mum Mea s Uncert TAR Test 2-6.
Table 2- 11. Perfo rmance Test Reco rd fo r the Ag ilent E 1445A (Pag e 7 of 7) Mode l ______ ____ ________ ____ ____ ___ Report No. ________ ____ ________ ____ ____ Da te _______ ________ Test Descri ption Minimum M easure d Re ading Maxi mum Mea s Uncert TAR Test 2-7.
82 V er if i c at ion Te s ts Ag il en t E1 44 5A Ser v i c e Manu al.
Chapter 3 Adjustmen ts Introduction The proced ur es in this chapt er sho w how to pe r fo rm the fo llowi ng ele ct ro nic ad justments for the A F G : • DC Acc uracy • AC Flatness ( 250 kHz and 10 MHz fi lter s) • Sk ew NOTE The DC adjus tment pro cedure shoul d be p erformed before t he AC flatness adju stment pr ocedures.
Calibr ati on Command s (co nt’ d) • CALibra tion:SE Cure[ :ST ATe] <mode>[, <code>] enabl es ( <mode> = ON) or disables ( <mod e> = OFF) cali bration sec ur ity . The sec ur ity c ode is r equir e d f or CAL:S EC: STAT OF F , bu t the co de is optio nal for CA L :S E C:S TA T ON .
Calibr ati on Command s (co nt’ d) • CALibrati on:DATA:FILTer <block> trans f ers the tw o c a libr a tio n cons tants that are use d to de te r min e the freq ue nc y poin ts that will be cali brated for the 10 MHz f ilter. The q uery fo rm re turns the cu rr ent cons tants in IEEE-488.
Defeat ing Cali bration Security If the ca libr a tio n security c ode is unk nown, the sec u rity f e at ur e ca n be defe ated by dis assembl ing t he AF G and mov ing t he j umper on co nnector J10 4 (see F i gure 3- 1) to the unse c ure d posi tion (left-mo st pins).
DC Adjustment Procedure Descripti on A DC adjustment is performed on the AFG by reading a serie s of volta ges and resistances output by the AFG, the n entering those values back into the AFG. After all me asurements have been completed, new c alibration constants are calculated and stor ed in non- volatile memory.
DC A dju stm ent P roced ur e (con t’d ) Ad ju stme nt P roc ed ur e 1. Reset th e AFG: *RST;*CLS Reset AFG an d cl ear statu s registe rs 2. Enable c al ibr a tion on the AFG: CAL:SEC:ST AT OFF, <securit y code> Ca l securi ty off where <code > is th e AFG’s secu rit y code (fa ct ory-se t to " E1445A") .
DC A dju stm ent P roced ur e (con t’d ) Te st P roc edur e (c ont’ d) 5. Tri gger t he DM M and note th e r eading. 6. Send the rea din g to the AFG : CAL:DC:POINT? <reading > where <reading> is the DMM rea ding from step 5. The AFG will retur n, in or de r, the num ber of the cur ren t cal po int and an error c ode .
DC A dju stm ent P roced ur e (con t’d ) Ex am ple P r og ram 10 ! RE-STORE "DC_ADJ UST" 30 !This prog ram per f orms t he f irmw ar e-g uided D C adjus t men t proce dure 40 !for the E1 445A Ar bi trar y Func tion Gener at or. An 3458 A DMM 50 !is require d.
DC A dju stm ent P roced ur e (con t’d ) Exam pl e Pr og ram (co nt ’d) 450 IF Cal_point=3 0 THEN !Speci al case -- set range no w 460 OUT PUT @Dmm; "RANGE 1 0" 470 E ND IF 480 ! 490 OUT.
DC A dju stm ent P roced ur e (con t’d ) Exam pl e Pr og ram (co nt ’d) 900 CASE =31 !Cal poi nt 31 910 OUTPUT @Dmm; "RANGE 10" 920 CASE =33 !Cal point 33 930 OUTPUT @Dmm; "RANGE .1" 940 CASE =41,=43 !Cal point 41,43 950 OUT PUT @Dmm;"F UNC DCV;RANGE .
AC F lat nes s Ad jus tment Pro ced ure - 250 kHz F ilte r Descripti on This pro ced u r e adjus ts the AC calibr a tio n c o nsta nt s f or th e 25 0 kH z filte r. The AC F la tness Te st f or the 250 kH z f ilte r (s ee Ch a p te r 2) is per f or me d wi th AC co rre c tion s di s a bl ed .
AC F lat nes s Ad jus tment Pro ced ure - 10 M Hz F ilte r Descripti on This pro ce du r e ad jus t s the AC c a libr a tio n c o nsta nt s f or th e 10 MH z fil ter. The A C F la tne ss Te st f or the 10 MH z f ilte r (see Ch a pte r 2) is perf o rme d wi th AC co rre c tion s di s a bl ed .
AC F lat nes s Ad jus tment P roced ure - 10 M Hz F ilte r (co nt’ d) Ad ju stme nt P roc ed ur e (c ont’ d) NOTE Rev A.02.00 (use the *IDN? command to de te rmi ne the firmw are re vision ) allo .
AC F lat nes s A djus tm ent Pro ced ure (c on t’d ) Ex am ple P r og ram 10! RE-STORE "AC_FL AT" 30 !This prog ram perf orm s the A C f la tn ess ad j ust me nt procedur e f or 40 !the E14 45A Arb itr ary Funct ion G en er ato r. An 3458 A DMM 50 !and an Agil ent 8902 A Mea sur ing R eceive r are requi red .
AC F lat nes s A djus tm ent Pro ced ure (c on t’d ) Exam pl e Pr og ram (co nt ’d) 420 F l atness: SUB Flatness(F ilter$, Mode$) 430 COM @A fg,@Dmm, @Pwr_mtr ,@An aly zer,S ecur e_co de$ 440 COM .
AC F lat nes s A djus tm ent Pro ced ure (c on t’d ) Exam pl e Pr og ram (co nt ’d) 830 OUT PUT @Afg;"F UNC SIN;"; !S ine 840 OUTPUT @Afg;":VOLT "&VAL$(Ampl_dbm)&".
AC F lat nes s A djus tm ent Pro ced ure (c on t’d ) Exam pl e Pr og ram (co nt ’d) 1270 Offs et_fa ctor =Dmm_re f 1280 PRINT "CORRECT ION FACTOR =" ;Cor rect_ factor 1290 PRINT 1300 PRI.
AC F lat nes s A djus tm ent Pro ced ure (c on t’d ) Exam pl e Pr og ram (co nt ’d) 1690 !Use regist er com m ands to ge t to 10. 8M Hz 1700 OUT P UT @A fg;"DIAG :PO KE #HE000A1 , 8,0" !.
AC F lat nes s A djus tm ent Pro ced ure (c on t’d ) Exam pl e Pr og ram (co nt ’d) 2180 OUT PU T @ Afg ;Ac _cal_c ons(*) !L oad ar ra y 2190 OUTPUT @Afg USING "# ,K";CHR$ (10),END !LF,E.
AC F lat nes s A djus tm ent Pro ced ure (c on t’d ) Exam pl e Pr og ram (co nt ’d) 2640 DISP "C onne ct Pow er Met er to AFG O ut pu t , then pr ess ’Continu e’" 2650 PAUSE 2660 DIS.
AC F lat nes s A djus tm ent Pro ced ure (c on t’d ) Exam pl e Pr og ram (co nt ’d) 3080 FO R I=1 TO M ax_con 3090 Cal_re al(I) =Cal _refle ct(I ) 3100 IF I=1 THEN Ca l_rea l(I )=Cal_ reflec t( I).
AC F lat nes s A djus tm ent Pro ced ure (c on t’d ) Exam pl e Pr og ram (co nt ’d) 356 0 !Che ck f or va l id ca l 3570 Max_filter _db= M AX(C al _real (6 ),Cal _r eal(7 ),0) 3580 Min_filte r_d b.
AC F lat nes s A djus tm ent Pro ced ure (c on t’d ) Exam pl e Pr og ram (co nt ’d) 4020 SUB Sy st_err(Address) 4030 COM @Af g, @ D mm,@ P wr_ mtr ,@A n al yzer , Secur e_c ode$ 4040 COM /Fl at/ I.
AC F lat nes s A djus tm ent Pro ced ure (c on t’d ) Exam pl e Pr og ram (co nt ’d) 4430 ELSE 4440 Block(1 )=N 4450 Block(2 )=Div 4460 ! 4470 OUTP UT @ A fg;"C AL: SEC : STA TE O FF , "&.
AC F lat nes s A djus tm ent Pro ced ure (c on t’d ) Exam pl e Pr og ram (co nt ’d) 4910 ! 4920 SUB Sec ur ity_c ode 4930 COM @Af g, @ D mm,@ P wr_ mtr ,@A n al yzer , Secur e_c ode$ 4940 COM /Fl .
AC F lat nes s A djus tm ent Pro ced ure (c on t’d ) Exam pl e Pr og ram (co nt ’d) 5380 For ma t_ num : DE F FNFor m at _num $( Val ue,N ot _e xp_m ax , INTEG ER Le ngt h, Not _ex p_img$,Exp_ img$ ) 5390 INTEGER Di ff 5400 SEL ECT ABS(Value) 5410 CASE <1.
Skew DAC Adjustment Procedure Descripti on This p ro cedu re comp en sates for ti me de la ys be tw e e n the AFG ’s tw o DAC s. The ske w se ttin g which produ c es th e lo w es t se co nd ha r mon ic am plit ude is found and l oaded into non- volat ile memo ry.
Skew DAC Adjustment Procedure (cont’d) Ad ju st ment P roc ed ur e (c ont’ d ) 2. Se t up th e AF G to ou t p ut a n 11 dB m, 4 MH z si n e w av e : FUNC SIN; :V OLT 11 DBM ; :FR EQ 4 E6 IN IT :IMM 3.
Skew DAC Adjustment Procedure (cont’d) Ex am ple P r og ram 10 ! RE-STORE "SKEW_CAL" 20 COM @A fg, @ A nalyze r ,Secu r e_ code $[ 20] 30 INTEGER D ac _bits,Dac_wo r d,Mi n_w or d,M ax_w o.
Skew DAC Adjustment Procedure (cont’d) Exam pl e Pr og ram (co nt ’d) 440 !- -- ---- -- - Per form cal -- -- -- ---- 450 OUTPUT @Afg ;"*R ST;*CLS;* OPC?" !R eset AFG 460 ENTER @ A fg; R .
Skew DAC Adjustment Procedure (cont’d) Exam pl e Pr og ram (co nt ’d) 890 !Set variable s fo r nex t loop 900 MAT SEARCH Me as_array,L OC MIN;Lo c_min !Get locatio n of min r dg 910 Cal_word=W or .
Skew DAC Adjustment Procedure (cont’d) Exam pl e Pr og ram (co nt ’d) 1280 Wr t _ske w_con:SUB W r t_s kew_c on(INTEG E R Ca l_ word ) 1290 COM @A f g,@ A nalyze r,Secure_ code $ 1300 DIM Id$[ 50] 1310 ! 1320 !Check f irm ware rev 1330 OUTPUT @Afg; "*IDN?" 1340 ENTER @Afg;Id$ 1350 ! 1360 IF POS (Id$," A.
Skew DAC Adjustment Procedure (cont’d) Exam pl e Pr og ram (co nt ’d) 1690 Me as_2 nd_harm:S UB Me as_2 nd_h arm(Reading ) 1700 COM @A f g,@ A nalyze r,Secure_ code $ 1710 OUTP UT @ A nalyze r;&qu.
116 Ad jus t m en ts Ag il en t E1 44 5A Ser v i c e Ma nu al.
Chapter 4 Replac ea ble P art s Introduction This cha pter co ntains in formati on for orderi ng replac eable parts for t he Agile nt E1 445A AF G. Ex ch ang e A ssem blie s Tab le 4 -1 l ists a ssemb lies th at m ay be re place d on an exchan ge bas is (NEW/EXCHANGE ASSEMBLIES).
Table 4-1. Agilent E 1445A Replaceable P arts Ref erence Designa t or Part Number Qty Part Descrip tion Mfr. Code Mf r. P a r t Number NEW/EXCHANGE ASSEMBLIES M E 1445A 1 E14 45A ( N EW) 284 80 ME 144.
Table 4-2. Ag ilent E1445A Reference Designators E1445 A Re ference Designator s A .... ........ .... .... .... .... .... ........ ... as sem bly MP . .... ........ .... .... .... .... .. me c hanica l part CR .. .... .... .... .... ........ .... ....
Figure 4-1. E1445A Replaceable Parts 120 R eplaceab le Part s Agil ent E 1445A Ser vice M anual.
Chapter 5 Servi ce Introduction Th is chapt er c ontains serv ice i nforma tion for the Agilent E1445A AFG, in cludi ng troubl es hoot in g guideli nes and repai r/ma i ntenance gui deline s.
Troubleshooting Techniques To trou ble sh oot an Agilent E1445A probl em , you sho uld first id e n ti fy the prob lem, and then isol ate the cau se t o a us er-r eplac eable part.
Checking fo r Heat Damage Insp ect the AFG f or s igns of abn ormal i nternal ly gen erate d he at such a s disc olo r ed pri nted circui t boards or co mp onents, dam a ge d ins ulation , or evid en ce of arcin g. If ther e is dama ge , do not operate the AFG unt il you have co r rec ted th e prob le m.
Removin g BNC Conne ctors Use the f oll owi ng steps to re mov e the AFG fron t pane l B NC connecto rs (r efer to F igu re 5-2): 1. Uns older wires 2. Remove th e two T 8 tor x sc r ews 3. R em ove the BNC connec tor 4. R evers e th e order to r eins tall the co nnector Figure 5-2.
Rep ai r/ Maintenance Guidelines This se ct io n provides gui deline s fo r repa ir in g a n d ma in taining the Agil ent E1445A AFG, inc l udi ng: • ESD precaut ion s • So lde r in g printe d cir.
126 S erv ice Agil ent E 1445A Ser vice M anual.
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Copyright © Agilent Te chnologies, Inc.1992-2005 *E1445-90011* E1445-90011.
Un point important après l'achat de l'appareil (ou même avant l'achat) est de lire le manuel d'utilisation. Nous devons le faire pour quelques raisons simples:
Si vous n'avez pas encore acheté Agilent Technologies E1445A c'est un bon moment pour vous familiariser avec les données de base sur le produit. Consulter d'abord les pages initiales du manuel d'utilisation, que vous trouverez ci-dessus. Vous devriez y trouver les données techniques les plus importants du Agilent Technologies E1445A - de cette manière, vous pouvez vérifier si l'équipement répond à vos besoins. Explorant les pages suivantes du manuel d'utilisation Agilent Technologies E1445A, vous apprendrez toutes les caractéristiques du produit et des informations sur son fonctionnement. Les informations sur le Agilent Technologies E1445A va certainement vous aider à prendre une décision concernant l'achat.
Dans une situation où vous avez déjà le Agilent Technologies E1445A, mais vous avez pas encore lu le manuel d'utilisation, vous devez le faire pour les raisons décrites ci-dessus,. Vous saurez alors si vous avez correctement utilisé les fonctions disponibles, et si vous avez commis des erreurs qui peuvent réduire la durée de vie du Agilent Technologies E1445A.
Cependant, l'un des rôles les plus importants pour l'utilisateur joués par les manuels d'utilisateur est d'aider à résoudre les problèmes concernant le Agilent Technologies E1445A. Presque toujours, vous y trouverez Troubleshooting, soit les pannes et les défaillances les plus fréquentes de l'apparei Agilent Technologies E1445A ainsi que les instructions sur la façon de les résoudre. Même si vous ne parvenez pas à résoudre le problème, le manuel d‘utilisation va vous montrer le chemin d'une nouvelle procédure – le contact avec le centre de service à la clientèle ou le service le plus proche.
