Manuel d'utilisation / d'entretien du produit MODEL 8719ET du fabricant Agilent Technologies
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User ’s G uide Ag ilent T ech no logies 8719E T/20ET/22 ET 8 719ES/20 ES/22 ES Netw ork An alyzer s P art Nu mber : 0 872 0-90 392 Pr inte d in USA J u ne 2002 Sup e rse de s : F ebr uary 20 01 © Copyr i ght 1999–2 0 0 2 Agi lent T ec hnologies , Inc .
ii Notic e The i nf ormation conta ined in t hi s document is s ubject to change wit hout notice . Agilent T echnolog ies makes no w arranty of any kind with r egard to this material, inc luding but not limited to , the i mplied w arranties of m erchantabil ity and fitnes s for a partic ular purpose .
iii S afety N ote s The following safety notes are used throughout this m anual. F a mil iari ze yourse lf with each of the notes a nd its meaning before operat ing this instr ument. All p ertinent s afety notes for using this p r oduct ar e located in Cha p ter 8 , “Safety and Regulatory In form atio n.
iv Docu me ntation M ap The Installa tion an d Qu ick S tart Gu id e provides proc ed ures for installing , c onfiguring , a nd verifyi ng the oper a tion of the analyzer . It also will hel p you f a m iliariz e yourself wi th the basi c operati on of the a nalyz er .
Contents Contents-v 1. Making Mea surements Usi n g Thi s Chapter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-2 More Instr ument Fu nctions Not De scrib ed in This Gu ide . . . .
Contents-vi Contents Usi ng Li mit Lin es to T est a D evice. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-72 Set t ing Up the Mea suremen t P arameter s . . . . . . . . . . . . . . . . . . . . . . . . . . .
Contents Contents-vii P erformi ng a P ower Met er (S ource) Ca libra tion Over the RF Ra nge . . . . . . . . . . . . . . . . 2-15 Sett ing th e Anal y zer to Make a n R Chann el Meas u rement . . . . . . . . . . . . . . . . . . . . . . . .2-17 High Dynamic Ra nge Swept R F/IF Con vers i on Loss .
Contents-viii Contents 4. Pri ntin g, P lott i ng, an d Sa vi ng M ea sur eme nt R e sul t s Usi ng This Chapt er . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4- 2 Pri nting or Plot ting Y our Measure ment Re s ult s .
Contents Contents-ix What Y ou Can Save to the A nal yzer’ s Inter nal Memor y . . . . . . . . . . . . . . . . . . . . . . . . . . 4-36 What Y ou Ca n Sav e to a Floppy Disk . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Contents-x Contents Inc reasi ng Dynami c Rang e . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5- 15 Incr ease t he T est P ort Input Po wer . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Contents Contents-xi Mat ched Adapters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6 - 4 5 Modif y th e Cal Ki t Thru Defin itio n . . . . . . . . . . . . . . . . . . . . . . . . . . .
Contents-xii Contents Swep t Lis t Fr equency Sweep (H z) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-17 P ow er S weep (dBm) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Contents Contents-xiii The TRL Cali brati on Proc edure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-7 2 GPIB O perati on . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Contents-xiv Contents.
1-1 1 Maki ng Measur ement s.
1-2 Making Measurements Using This C hapter Using This C hapter This cha pter contai ns the foll owing example proc edures for making m ea surements . Mi xer and ti me domain measurement s are cov ered in Chapter 2 , "Ma king Mixer Measurements (Opt io n 08 9 Onl y)" and Chapter 3 , “Making Ti m e Domain Measurement s.
1- 3 Making Measur ements More I nstrument Fun ctions Not Described in This Guide More Inst rument Funct ions Not Describ ed in This Gui de T o learn abo ut instrument func tions not c overed in this user’ s guide , refer to the follow ing chapters in the refer ence guide .
1-4 Making Measurements Making a Basic Measur ement Making a Basic Meas urement There are f ive basic s teps when you are m aking a measurement. 1. Connect the d evice und er test a nd any requi r ed test eq uipment. CA UTI ON Damage m ay result t o the devic e under test (DUT ) if i t i s sensitive to the analyzer’ s default output power level.
1- 5 Making Measur ements Making a Basi c Measurement Set ting the Frequen cy R ange T o s e t the center frequency to 134 MH z, press: T o set the span to 3 0 MHz, press: NO TE Y ou could al so press the and keys and e nter the fr equency range limi ts as start f requency and s top frequenc y values .
1-6 Making Measurements Making a Basic Measur ement Step 5. Outpu t the measurement results . T o create a p rinted co p y of the measurement result s, p ress: (or ) Refer to Chapt er 4 , “Printi ng , Plotting , and Saving Measurement Results ,” for procedure s on how to set up a pri nter and defi ne a print, p lot, or save resul ts.
1- 7 Making Measur ements Measuring Magnitud e and Insertion P hase Response Mea su ring M agnitude an d Insertion Pha se Response This measurement ex amp le shows y ou how to meas ure the maximum amp.
1-8 Making Measurements Measuring Magni tude and Inser ti on Phase Response If the channels a r e coupled ( the default condition), this calib r ation is valid for b oth channels . 4. Reconnect your t est device. 5. T o better v iew the measurement tr a ce, press: 6.
1- 9 Making Measur ements Measuring Magnitud e and Insertion P hase Response Fi gure 1-4 E xample Insert ion Phase Re sponse M easurement The phase r esponse shown in Figu r e 1 -5 is undersample d ; that i s, t here is m ore than 18 0 ° phase del ay between fr equency points .
1-10 Making Measurements Using Di splay Funct ions Using Display Functions This sec tion provi d es the neces sary informatio n for using the displa y functions . These functio ns are ver y helpful for displayi ng measurement data so tha t it wil l be easy to r ead.
1- 11 Making Measur ements Using Displa y Functions Titling the Active Channel Display 1. Press to a ccess the title menu. 2. Press and enter the title y ou want for your measurement d isplay . • If you ha ve a DIN keyboard at tached to the analyzer , type the ti tle you want from the keyboard.
1-12 Making Measurements Using Di splay Funct ions Viewing Both Primary Measurement Channels In s om e cases , you may want to view more than one measured parameter a t a time . Simulta neous gain and pha se measurements , for e xample, are us eful in evaluating stabili ty in negati ve feedback a m plifi er s.
1- 13 Making Measur ements Using Displa y Functions Fi gure 1-8 Example Dual C hannel with Split Display On 3. T o re tu rn t o a sing le-g rati cul e d isp la y , p re ss : . NO TE Y ou can contr ol the sti m ulus funct ions of the tw o channels i ndependent of each other by pressing .
1-14 Making Measurements Using Di splay Funct ions However , there ar e two config ur ations tha t w ill no t sweep continuousl y . 1. F or analyzer s with source attenuators , with c hannel 1 ha ving.
1- 15 Making Measur ements Using Displa y Functions Figure 1 -9 Th ree-C han nel Di splay 4. Press Chan 4 ( or press , set to O N ). This en ables channel 4 and the screen now displays f our separate g rids as show n in Figu re 1-1 0 . Channel 4 is i n the lower -right quadr a nt of the s creen.
1-16 Making Measurements Using Di splay Funct ions Figur e 1-1 0 F our -C hann el Dis p lay 5. P ress . Observe that th e a mber LED adjacen t to the key is l it and the CH4 indicator on the dis play has a box around i t. This indica tes that cha nnel 4 is no w active and c an be configured.
1- 17 Making Measur ements Using Displa y Functions Once made active , a channel c an be confi gured independentl y of the other channel s in most variables except stim ulus. F or example , once channel 3 is active , you c an change its for mat to a Smith chart by p ressing .
1-18 Making Measurements Using Di splay Funct ions 4 P aram Disp lays S oft ke y The menu does two thing s : • provides a quick wa y to s et up a four -parameter disp lay • gives inf ormation for usi ng softkeys i n the menu Figu re 1-1 1 show s the f i rst screen.
1- 19 Making Measur ements Using Displa y Functions Using Memory T races and Memory Math Functions The analyzer has four a vailable memory tr aces , one p er channel. Memo ry traces are t otally channel dep endent: c ha nnel 1 cannot access the c hannel 2 memory trace or v ice versa.
1-20 Making Measurements Using Di splay Funct ions T o V iew th e Measure me nt Dat a and Mem ory Trace The anal y zer default s etting s how s you t he current measureme nt data for the active channel .
1- 21 Making Measur ements Using Displa y Functions Blanking the Display Pressing switches off the analyze r display while leav ing the instr um ent in i ts current measur ement state .
1-22 Making Measurements Using Di splay Funct ions Adjusting the Colors of the Display Setting Display Intensity T o adjust the intensi ty of the disp lay , pr ess and rotate the f ro nt panel knob , us e the ( ) ( ) keys , or use the numeric al keyp ad to s et the intensity value between 50 and 1 00 per cent .
1- 23 Making Measur ements Using Displa y Functions NO TE Ma ximum viewi ng with the LCD displa y is achieve d when primary color s or a combination o f t hem are sel ec ted at ful l brig htnes s ( 100%). T abl e 1-2 lists the recommended color s and thei r correspondi ng tint numbers .
1-24 Making Measurements Using Marker s Using Markers The key disp lays a m ov able activ e marker on the screen and p r ovides ac c ess to a serie s of menus to control up to five displa y m arkers for each channe l. M ark ers are used to obtain numerical rea d ings of m easured values .
1- 25 Making Measur ements Using Markers NO TE U sin g wil l als o af fect mar ke r sea rch and positi oning functions w hen the v a lue enter ed in a s earch or position ing function does not exist a s a measurement p oint. The marke r will be positioned to the clos est adjacent p oint that sa tisfies the s e arch o r po si tion in g va lu e.
1-26 Making Measurements Using Marker s Fi gu re 1-13 Active and Inactive Mark e r s E xamp le • T o switch of f all of t he m arkers , press . T o Mo ve Marker Inform ation Off the Grids If m a rke.
1- 27 Making Measur ements Using Markers Figure 1 -14 M arker In forma t ion M o ved int o the S oftk ey Menu Are a 4. Restore the s oftkey menu and move the marker inf or mation back onto the gra ticules: Pre ss . The di splay wi ll be sim ilar t o Fig ure 1-1 5 .
1-28 Making Measurements Using Marker s Fi gu re 1-15 Marker Informati on on the Gratic u les Y ou ca n also restore the s of tkey menu by pressi ng a hardkey which opens a menu (such as ) or p ressing a sof tkey .
1- 29 Making Measur ements Using Markers Figure 1 -16 M arker 1 a s the Referen ce M arker E xam ple 4. T o c hang e the reference marker to mark er 2, p res s : T o Activate a Fixed Mar ker When a ref er ence marker i s fixed, it does not rely on a c urrent t r ace to m a intain i ts fixed position.
1-30 Making Measurements Using Marker s Fi gu re 1-17 Exampl e of a Fixed Reference Marker Using MKR ZE RO Using the Key to Activate a F ixe d Referen c e Marker 1.
1- 31 Making Measur ements Using Markers Fi gu re 1-18 Example of a Fixe d Reference Marke r Using ( ∆ )REF=( ∆ )FIXED MK R T o Couple and Uncouple Display Markers At a preset state , the markers ha ve the sa m e stimulus val ues on eac h channel, but they can be uncoup led so that each channe l has independent markers .
1-32 Making Measurements Using Marker s T o Us e P olar F ormat Markers The anal yzer can dis play the mar ker value as magnitude and phas e, or as a real/i maginary pa ir: gi ves l ine ar ma gnit ude a nd p hase , gi ves l og mag nit ude and phase , gives the r eal value fi r st, then the imaginary value.
1- 33 Making Measur ements Using Markers T o Use Smith Chart Markers F or greater a ccuracy when us ing markers in t he Smith c hart format, a ctivate the discrete mark er mo de.
1-34 Making Measurements Using Marker s Fi gu re 1-21 Exampl e of Impedance Smith C hart M ar k ers T o Set Measur ement P a rameters Using Ma rkers The anal y zer allows you to set m ea surement parameter s with the m arkers , without g oi ng throug h the usual key s equence .
1- 35 Making Measur ements Using Markers Setting the Stop Frequency 1. Press a nd turn the f ront panel knob , or enter a value fro m the front panel keypad to p osition the m arker at the va lue t ha t you w a nt for the stop fr eq uency . 2. Press to change the stop freq uenc y value to the value of t he active mark er .
1-36 Making Measurements Using Marker s Fi gu re 1-24 Exampl e of Setting the Center Frequency Using a Marker Setting the F re quency Span Y ou can set the span equal to the spacin g between two markers . If yo u set the ce nter frequency before you s et the fr eq uency span, you will ha ve a bette r view of t he area of inter est.
1- 37 Making Measur ements Using Markers Figure 1 -25 Exam ple of Set ting the Frequen cy Span Using Mar k er Set ting the Display Refer ence V alue 1. Press a nd turn the f ront panel knob , or enter a value fro m the front panel keypad to p osition the m arker at the va lue t ha t you w a nt for the analyzer di s play refere nc e v alue.
1-38 Making Measurements Using Marker s 1. P ress . 2. Press and t urn the fr ont p anel knob , or enter a val ue from the fr ont panel keypad to p osition the marker a t a poi nt of interes t.
1- 39 Making Measur ements Using Markers T o Search for a Specific Amplitude These f unc tions place the marker a t an ampli tude-related point o n the t race. I f you s witch on t rack ing, the analyz er searches ev ery new trace for the ta r get point.
1-40 Making Measurements Using Marker s Fi gure 1-29 Example of Searching for the M in imum Amplitu d e Using a Marker Searching f or a T arget A mplitude 1. Press to a ccess the m a rker searc h m enu. 2. Press to mov e the active m a rker to t he target poi nt on the measurement tra c e.
1- 41 Making Measur ements Using Markers Searching for a Bandwidth The analyzer can automatical ly calcula te and display the bandwidth (BW :), center frequency ( CENT:) , Q, and loss of the device und er test at the center f requency .
1-42 Making Measurements Using Marker s T o Calculate the Statistics of the Measurement Data This func tion calc ulates the mean, s tandard devi a tion, and p eak -to-pea k values o f the secti on of the displa yed trace between the activ e mark er and t he delta referenc e.
1- 43 Making Measur ements Measuring Electrical Length and Ph ase Distortion Mea su ring E lectrical Length an d Phase Distor tion Elec trical L eng th The analyzer mathematically implements a func ti on simila r to the m echa nica l “line stretc hers” of ea r lier analy zers.
1-44 Making Measurements Measuring Electri cal Length and P hase Disto rtion Y ou ma y also w ant to se lect setting s for the num b er of data p oints , a v eraging , and I F bandwidth. 3. Substitute a thru f or the dev i ce and perfor m a response c alibration b y pressing : 4.
1- 45 Making Measur ements Measuring Electrical Length and Ph ase Distortion The measur em ent value tha t the ana lyzer displa y s repres ents the electr ical leng th of your d ev ice relati ve to the speed of lig ht in free space . The p hysical leng th of your dev ice is related to this value by the propagation velo city of its medium.
1-46 Making Measurements Measuring Electri cal Length and P hase Disto rtion Deviati on F rom Line ar Phase By adding electric a l length to “flatten out ” the phase respo ns e, y ou have removed the line ar phase shift through y our device . T he deviati on from l inear phase shif t throug h your devic e is all that remains .
1- 47 Making Measur ements Measuring Electrical Length and Ph ase Distortion The default apertur e is the total f requency span divided by the number of points across the display (i.
1-48 Making Measurements Measuring Electri cal Length and P hase Disto rtion Fi gu re 1-38 Group Delay Example Measurement wit h Smoothing 5. T o increase the ef fective gr oup delay aperture , by inc.
1- 49 Making Measur ements Characterizing a D uplexer (ES Anal yz ers On ly) Ch ara cterizin g a Duplexer (E S Analyz ers Only) This measurement ex amp le demons tr ates how to characteri ze a 3-port d ev ice , in this case a duplexer , using f our- parameter di s play mod e.
1-50 Making Measurements Characterizi ng a Duple xer (ES A nalyzers Onl y) 3. Set up cha nnel 1 f or the Tx - Ant stim ulus para meters ( st art/stop f r equency , power level, IF bandwidth ). In t his example , a wide f requency range t hat cover s both the Tx-Ant a nd Ant-Rx paramete rs has been c hosen.
1- 51 Making Measur ements Characterizing a D uplexer (ES Anal yz ers On ly) 15.Set up a 2-gratic ule, 4 -parameter dis p lay with tr ansmission meas ur ements on the top grati c ule and r ef lecti on m easurements on the bottom gra ticule: Pre ss , then s et to .
1-52 Making Measurements Measuring Ampl if iers Measur in g Amplifi ers The anal y zer allows you to measure the transmissi on and reflec ti on chara c teristics of many ampli fier s and a c tive d ev ic es .
1- 53 Making Measur ements Measuring Ampli fi er s Measuring Gain Compr ession Gain compress i on occurs w hen the inp ut power of an am plifier is increased to a level t hat reduces the gain of the a mplifier and causes a nonl i near increa s e in output power .
1-54 Making Measurements Measuring Ampl if iers 4. T o produce a nor m alized tra ce that repres ents gain compr ession, perfor m either step 5 or step 6 . (Step 5 uses trace ma th and ste p 6 uses uncoup led channels and the di s play function .) 5. Press to p r oduce a normali zed trace .
1- 55 Making Measur ements Measuring Ampli fi er s Fi gure 1-44 Gain Compression Using Linear Sweep and 12.If w a s selected , recouple the channel stimulus by press ing: 13.T o place t he marker exact ly on a measurement point, press: 14.T o set the CW frequency bef ore going int o the power s w eep mode, press: 15.
1-56 Making Measurements Measuring Ampl if iers NO TE A receiver c alibration w ill improve the a ccuracy of thi s measurement. Ref er to Chapter 6 , “Cal ibrating f or Increased Mea surement Ac c uracy .
1- 57 Making Measur ements Measuring Ampli fi er s Measuring Gain and Reverse Isolation Simultaneously (ES Analyzers Only) Since a n amplifie r will ha v e high g ain in the fo rward dir ec t io n an d h ig h isol atio n in the reverse d irection, the gain (S 21 ) will b e much grea ter than the r everse isol ation (S 12 ).
1-58 Making Measurements Measuring Ampl if iers Fi gu re 1-46 Gain and Reverse Isolat ion.
1- 59 Making Measur ements Measuring Ampli fi er s Making High P ower Measuremen ts with Option 085 (ES Analyzers Only) Analyzers eq ui pped with Opt ion 085 can b e configured t o m easure high p ower devices .
1-60 Making Measurements Measuring Ampl if iers 5. Switch on the booster amplifier . 6. Using a pow er meter , measure the output power from the coupled ar m and the open port of the coupler . NO TE Depending on the power meter being us ed, addit iona l attenuation may ha ve to be added between the c oupler port a nd the power m eter .
1- 61 Making Measur ements Measuring Ampli fi er s Fi gure 1-48 High P ower T est Setup (Step 2a) Fi gure 1-49 High P ower T est Setup (Step 2b ) Selec ting P ow er Ran ges and Att enu ator Setting s 14.Selec t a p ow er r a nge that will not exc eed the maximum estim a ted power l evel t hat will force the DUT into com p ression.
1-62 Making Measurements Measuring Ampl if iers 16.Estimate the maxi m um amount of gain that could be provided b y the DUT and, a s a result, the maximum amount of p ower that c ould be recei ved by TEST PORT 2 wh en the DUT is in compressio n.
1- 63 Making Measur ements Measuring Ampli fi er s Wi th the previous poin ts in mind, t he amount of attenua ti on can be calcul a ted f rom the fol lowing equations: • Attenuator A = +20 dBm − 13 dB − ( − 10 d Bm). At tenuator A = +1 7 dB • Attenuator B = +30 dBm − 13 dB − ( − 10 dBm) .
1-64 Making Measurements Measuring Ampl if iers Fi gu re 1-51 High P ower T est Setup (Step 3) 26.Make any other desired high p ow er measurement s. Ratio measurement s suc h a s gain w i ll be c orrectly displayed . However , the displaye d absolute p ow er levels on the analyzer will not b e correct.
1- 65 Making Measur ements Measuring Ampli fi er s Making High P ower Measuremen ts with Option 012 (ES Analyzers Only) Analyzers eq ui pped with Opt ion 012 can b e configured t o m easure devi c es that have high power outputs .
1-66 Making Measurements Measuring Ampl if iers With the p re vious points i n mind , the a mount of att enuation c a n be ca lc ul ated f r om the following equati ons : • Attenuator v a lue = +2 0 dBm − 13 dB − ( − 10 dBm). A tten ua tor V a lue = +17 dB 3.
1- 67 Making Measur ements Using the Swept List M ode to T est a De vice Using t he Swept List Mode to T est a Dev ice When using a l ist frequenc y sweep, the analyzer has the abili ty to sweep a rbitrary frequency seg ments, each co nta ining a l ist of freq uency points .
1-68 Making Measurements Using the Swept Li st Mode t o T est a Devi ce 2. Set the f ollowing meas ur ement parameters: or on ET model s: Observe the Characteristics of the F ilter Fi gu re 1-55 Characteristics of a Fi lter • Generally , the passband of a fil ter exhibits l ow loss.
1- 69 Making Measur ements Using the Swept List M ode to T est a De vice Set Up the Lower Stopband P arameters 3. T o set up the segment f or the l ow er stopband, press 4.
1-70 Making Measurements Using the Swept Li st Mode t o T est a Devi ce 8. T o maximize the dynami c range i n the stopband (increasing t he incident p ow er and narrowing t he IF bandwidth) , press: 9. P ress . Calibrate and Measure 1. Remove the D UT and perform a ful l two-por t calibration.
1- 71 Making Measur ements Using the Swept List M ode to T est a De vice Fi gure 1-57 Fil ter M easurements Using Linear Sweep and Swept List Mode (P ower: 0 dBm/I F BW : 3700 Hz) Using Linea r Sweep .
1-72 Making Measurements Using Limit Lin es to T est a D evi ce Using Lim it Li nes to T est a Dev ice Limit testi ng is a measur ement technique that compa res m eas urement data to constraints that y ou define. Depending on the results of this c om parison, the analyzer will indicate i f your d evice eit her passes or f ails the test.
1- 73 Making Measur ements Using Limi t Lines to T est a Device 3. Substitute a thr u for the device and per form a response c alibration by pressing: 4.
1-74 Making Measurements Using Limit Lin es to T est a D evi ce 5. T o terminate the flat l i ne segment by establishing a single poi nt limit, p r ess: Figu re 1-59 shows the f lat limi t lines that .
1- 75 Making Measur ements Using Limi t Lines to T est a Device • T o crea te a limit line that t es ts the hi g h side of the bandpass f ilter , press: Fi gure 1-60 Example F lat Limit Lines Creating a Sloping Limit Line This example procedur e shows you how to make limits that test the shap e factor of a SA W filter .
1-76 Making Measurements Using Limit Lin es to T est a D evi ce 1. T o access the limits menu a nd activate the limit li nes, press: 2. T o establi s h the start f r eque ncy a nd l imits f or a s l oping limit li ne that t es ts the low s ide of the fi lter , press: 3.
1- 77 Making Measur ements Using Limi t Lines to T est a Device Fi gure 1-61 Sloping Limit Lines Creating Sing le P oint Limits In this ex ample proc ed ure, the following limits ar e set: • from − 23 d B to − 28 .5 dB at 14 1 MH z • from − 23 dB to − 28 .
1-78 Making Measurements Using Limit Lin es to T est a D evi ce Fi gu re 1-62 Exampl e S i n gle P oints Limit Line Editing Limit Segments This e xa mple shows you how to edit the upper lim it of a li m it line . 1. T o access the limits menu a nd activate the limit li nes, press: 2.
1- 79 Making Measur ements Using Limi t Lines to T est a Device Running a Limit T est 1. T o acce s s the lim its menu and acti vate the limit l ines , press: Reviewing the Limit Line Segments The limit ta ble data tha t you ha ve previousl y entered is shown on the anal yzer display .
1-80 Making Measurements Using Limit Lin es to T est a D evi ce 1. T o offset a ll of the segm ents in the limit ta ble by a fi xed frequency , (for ex a mple, 3 M H z ), pre ss: The analy ze r bee ps an d a FAIL n otation appears on the analyzer displa y , as shown in Figu re 1-63 .
1- 81 Making Measur ements Using Ripple Limits to T est a Device Usin g Ripple Limit s to T est a Device Setting Up the List of Ripple Limits to T es t Two tasks ar e involved in p reparing f or ripple t esting: • First, s et up the a na lyzer setti ng s to v iew the freq uenc y of i nterest.
1-82 Making Measurements Using Rippl e Limits to T est a Device Fi gu re 1-65 Conne ctions for an Example Ripple T e st Measurement 2. Press and c hoose the measurement s ettings .
1- 83 Making Measur ements Using Ripple Limits to T est a Device Fi gure 1-66 Filt e r P ass Band Before Ripple T est Setting Up Limits for Ripple T esting This sect ion instructs you on setti ng up the r ipple test parameters.
1-84 Making Measurements Using Rippl e Limits to T est a Device 1. T o access the ripple te s t menu, press: 2. T o access the ripple te s t edit m enu, press . 3. Add the f i rst fr eq uency band ( Frequency Band 1 ) to be tes ted by press ing . 4. Set the l ower frequency value of F requency Band 1 b y pressing: 5.
1- 85 Making Measur ements Using Ripple Limits to T est a Device 3. Mak e the cha ng es to the selected b a nd by press i ng: a. and the new value t o change the l ower frequency of the frequency b a nd. b . and the new value to cha nge the upper frequency of t he frequency b a nd.
1-86 Making Measurements Using Rippl e Limits to T est a Device Dele ting Exis ting Freq uency B and s Frequ ency band limits m ay be del eted for testi ng the ripp le.
1- 87 Making Measur ements Using Ripple Limits to T est a Device Fi gure 1-67 Filt e r P assband with Ripple T e st Activat e d As the analyze r measures the ripple, a message is di splayed ind i cati.
1-88 Making Measurements Using Rippl e Limits to T est a Device • If the r ipple t est fails , the ripple limits a re drawn on the displa y for each f requency band.
1- 89 Making Measur ements Using Ripple Limits to T est a Device T o di splay t h e rippl e va lue, press . Pressin g this soft ke y tog gle s between , , and . from the Ripple T est Menu until ON is display ed on the softkey . Pressing this s oftkey toggle s the anal y zer between r ipple test o n and rippl e test off sta tus.
1-90 Making Measurements Using Rippl e Limits to T est a Device Fi gu re 1-69 Filter P ass B and with Absolute Ripple V alue for Band 1 Activated View ing the Ripple V alue in Margin Format When is select ed, the mar gi n by whic h the r ipp le v alue p assed or fa iled is d isplayed.
1- 91 Making Measur ements Using Ripple Limits to T est a Device Figu re 1-70 shows the r ipple test with margin r ipple value d isplaye d for Fr equency Band 2. Notic e that Frequ ency Band 2 passes t he ripple test with a ma rgin of 0.097 dB . The plus s i gn ( + ) indicates thi s band p asses the ri pple test b y the amount displayed.
1-92 Making Measurements Using Band widt h Limit s to T est a Bandpass Filter Usi ng Bandwi dth Li m it s to T est a B andpass Fi lter The bandwid th testing mode c an be used to test the ba nd width of a bandpass filt er .
1- 93 Making Measur ements Using Band widt h Limit s to T est a Bandpass Filter Fi gure 1-72 Connections for a Bandp ass Filter Example Measu reme nt 2. Press and choo s e the measur em ent setti ngs. F or this exa m ple, the measurement setti ngs are as fol low s: a.
1-94 Making Measurements Using Band widt h Limit s to T est a Bandpass Filter 3. Substitute a thru f or the dev i ce and perfor m a response c alibration b y pressing : 4.
1- 95 Making Measur ements Using Band widt h Limit s to T est a Bandpass Filter Activating the Bandwidth T est 1. Start the band w idth test b y pressing the s of tkey until ON is displaye d. The bandwid th test co ntinues to run unti l the softkey is ret ur ned to the OF F position.
1-96 Making Measurements Using Band widt h Limit s to T est a Bandpass Filter Fi gu re 1-75 Band widt h Markers Placed 40 dB Below the Bandpass P eak Displa yin g the B andw idth V alue 1. Display the bandwidth v a lue by pres s ing the softkey until ON is dis p layed on the softkey .
1- 97 Making Measur ements Using Band widt h Limit s to T est a Bandpass Filter Fi gure 1-76 Filt e r P ass Band with Bandwid th V alue Displayed.
1-98 Making Measurements Using T est Sequencing Using T est Sequencing T est se quenci ng a llows you to automate r ep eti ti ve tasks . As you m ake a m easur ement, the analyzer m emorizes the key strokes . Later you can repea t the enti re sequence b y pressing a singl e key .
1- 99 Making Measur ements Using T est Sequenci ng Figure 1 -77 T e st Seq uencing He lp Ins truction s 2. T o selec t a sequence p osition in w hich to stor e your sequence , pres s: This cho i ce select s sequence posi tion #1. The d efault ti tle is SE Q1 for this sequence.
1-100 Making Measurements Using T est Sequencing The previous key strokes wi ll create a displayed l ist as show n: Start of Sequence RECALL PRST STAT E Tran s: FWD S 21 (B/ R) LOG M AG CENTER 13 4 M/u SP AN 50 M/u SC AL E/DIV A UTO S CAL E 4.
1- 101 Making Measur ements Using T est Sequenci ng 3. T o move the c ursor to the command that yo u w ish to d elete, press: or • If you wi sh to scroll through the s equence wit hout executing each line as you do so , yo u can pr ess the key an d scroll thro ug h t he com m an d l ist ba ckward s.
1-102 Making Measurements Using T est Sequencing The foll ow ing li s t is the c ommands entered i n "Creating a Sequence" on page 1-98 . Notice t hat for long er sequences , only a po r tion of the list c an appear on the screen at one time .
1- 103 Making Measur ements Using T est Sequenci ng Changing the Sequence T itle If y ou are storing s equences on a disk, you should replac e the default titles (SEQ1, SEQ2, …) . 1. T o selec t a sequence tha t you wa nt to retit le, p ress: and s elect the p articul a r sequence s oftkey .
1-104 Making Measurements Using T est Sequencing Storing a Sequence on a Disk 1. T o fo rm at a di sk, re fe r t o Chapter 4 , “Printing , Plotting , and Sav ing Measurement Results .” 2. T o save a s equence to the interna l disk, press: and selec t the parti cular sequence s oftkey .
1- 105 Making Measur ements Using T est Sequenci ng Printing a Sequence 1. Confi g ure a compat ible printer to the analyzer . (Refer to th e “Options and Ac cessories” chap ter of the reference guid e.) 2. T o pri nt a sequence, p ress : and the sof tkey for the d esired sequenc e.
1-106 Making Measurements Using T est Sequencing Comm an ds Th at R equi re a C lean Swee p Many fr ont panel commands di s rupt the s weep in progres s, f or example , changing the channel or measurement type .
1- 107 Making Measur ements Using T est Sequenci ng NO TE P resetting the instrument does no t run the Auto Seq uence automatical ly . Gosub Sequence Command The softkey , l oc ated in the Sequencing menu, activates a feature that all ows the sequence to branch of f to anot her sequence , then r eturn to the or iginal sequence .
1-108 Making Measurements Using T est Sequencing The TESTSET I/O bits are set using the and keys under the key s . The v alues of the outputs (pins 1 1, 22, a nd 23) are des cri be d in T a ble 1- 5 .
1- 109 Making Measur ements Using T est Sequenci ng Electrica l specifi c ations f or TTL high: • vol ts(H) ≥ 2. 7 v olt s (V ) • current = 2 0 microamps ( µ A) Electrica l specifi c ations f or TTL low: • vol ts(L) ≤ 0. 4 vo lt s (V) • curr en t = 0.
1-110 Making Measurements Using T est Sequencing T e st Set Inter co nnec t Cont rol Fi gu re 1-79 T est Set Interconnect Pi n Designations Control of the ext er nal swi tch (8762B Option T24) can be d one through the test set inter face on the r ear panel of the analyzer .
1- 111 Making Measur ements Using T est Sequenci ng T able 1-5 T est Set Interconnect Pin Designation Pin Num ber Pin Desc ri ptio n Pin 1 No Connec tion (NC) Pin 2 S weep dela y: holds off sweeps unt.
1-112 Making Measurements Using T est Sequencing TTL Out Menu The softkey provides acc ess to the TTL out menu. This m enu allows you to choos e between the f ollowing output parameters of the TTL o utput signal: • • • • The TTL outp ut signals ar e sent to the s equencing BNC rear panel output.
1- 113 Making Measur ements Using T est Sequenci ng Loop counter decision making The anal y zer ha s a numeric r egister c alled a l oop counter . The value of this r egister ca n be set by a s equence , and it can b e incriminated or decremented ea ch ti me a sequence repeats itself .
1-114 Making Measurements Using T est Sequencing t o T est a Devi ce Using T est Sequencing t o T est a Device T est se quenci ng a llows you to automate r ep eti ti ve tasks . As you m ake a m easur ement, the analyzer m emorizes the key strokes . Later you can repea t the enti re sequence b y pressing a singl e key .
1- 115 Making Measur ements Using T est Sequenci ng to T est a Device The fol lowing seque nc es will be created: SEQUE NCE SEQ1 Start of Se que nc e CENTE R 134 M /u SPAN 50 M/u DO SEQUE NCE SEQUE NC.
1-116 Making Measurements Using T est Sequencing t o T est a Devi ce T o create a second sequence that will perform a d esi re d measurement function, decre m ent the loop counter , and call i tself u.
1- 117 Making Measur ements Using T est Sequenci ng to T est a Device This will c reate the f ollowing di s played l ists: Start of Sequence LOOP COUNTER 7 x1 INTERNAL DISK DATA ONLY ON DO SEQUENCE SE.
1-118 Making Measurements Using T est Sequencing t o T est a Devi ce • The plot fi le names gene r ated by th is sequence will be: PL00007.FP through PL00001.
1- 119 Making Measur ements Using T est Sequenci ng to T est a Device This wil l create a displayed l ist for seq uence 2, a s shown: Start of Se que nc e INTER NAL DI SK DATA ARR AY ON FILEN AME FILE 0 SAVE FIL E 3.
1-120 Making Measurements Using T est Sequencing t o T est a Devi ce.
2-1 2 Ma king Mixe r M easur ement s (Optio n 089 Only).
2-2 Making Mix er Measurements (Option 089 Only) Using This C hapter Using This C hapter This cha pter contai ns the foll owing: • Information on mixer measuremen t capabiliti es.
2- 3 Making Mixer Measurements (Option 089 Only) Mixer Measur ement Capabili ties Mixer Measurement Capab ilit ies The analyzer is capable o f measuring t he following m ixer (frequenc y converter ) p.
2-4 Making Mix er Measurements (Option 089 Only) Measurement Consi der ati ons Measurement Cons iderations In mixer transmission meas ur ements , you ha ve RF and LO inputs a nd an IF outp ut. Also emanati ng f rom the IF port are several other mixing products of the RF and L O signals .
2- 5 Making Mixer Measurements (Option 089 Only) Measuremen t Consider ations Fi gu re 2-2 Conversion Loss versus Output F re quency without At ten uat ors at Mixer P orts Fi gu re 2-3 Examp le of Con.
2-6 Making Mix er Measurements (Option 089 Only) Measurement Consi der ati ons Eliminating Unwanted Mixing and Leakage Signals By pla c ing fil ters between t he m ixer’s IF port and the receiver’s input por t, you can eli mi nate unw a nted mixing a nd leakage si g nals from e ntering the ana lyzer’s rec eiver .
2- 7 Making Mixer Measurements (Option 089 Only) Measuremen t Consider ations Fi gu re 2-5 Examp le of Conversion Loss versus Output F reque ncy with Correct IF Signal P ath Filterin g an d Attenuat i.
2-8 Making Mix er Measurements (Option 089 Only) Measurement Consi der ati ons Figure 2 -6 Exam ples of U p C onvert ers a nd Dow n Co nverte r s In s ta ndard mixer m easurements , the i np ut of the.
2- 9 Making Mixer Measurements (Option 089 Only) Measuremen t Consider ations Figu re 2-7 D own Con ver ter P o rt Co nnec tion s • In an up co nv erter measur em ent where the softkey is selected ,.
2-10 Making Mix er Measurements (Option 089 Only) Measurement Consi der ati ons Frequ ency offset meas urements do no t begin until all of the f requency off set mode parameters are set.
2- 11 Making Mixer Measurements (Option 089 Only) Measuremen t Consider ations Setting the power r a nge to manual prevents the i nternal sour c e attenuato r from switchi ng when changi ng power level s.
2-12 Making Mix er Measurements (Option 089 Only) Measurement Consi der ati ons 6. Y ou ca nnot trust R c hannel power se ttings without know ing about the offset inv olved.
2- 13 Making Mixer Measurements (Option 089 Only) Con version Loss Using t he Frequency Of fset Mode Convers ion Loss U sin g the Frequency Of fset Mode Conversio n loss is the m easure of ef f ic i ency of a mix er . It is the ra tio of si d e-ba nd IF power to RF sig na l power , and is us ually expr essed in dB .
2-14 Making Mix er Measurements (Option 089 Only) Con version Loss Using t he Frequency Of fset Mode Setting Measurement P arameters for the P ower Meter Calibration 1.
2- 15 Making Mixer Measurements (Option 089 Only) Con version Loss Using t he Frequency Of fset Mode P erforming a P ower Meter (Source) Calibration Over the RF Range 1. Calibrate and zero the power m eter . 2. Set the power m eter’s a d dress: (where aa is the GPIB address of the power mete r ) 3.
2-16 Making Mix er Measurements (Option 089 Only) Con version Loss Using t he Frequency Of fset Mode 5. T o perform a one sweep power meter c alibration o ver the RF frequency range at 0 dBm ( − 10 .
2- 17 Making Mixer Measurements (Option 089 Only) Con version Loss Using t he Frequency Of fset Mode Setting the Analyzer to Make an R Channel Measurement 1.
2-18 Making Mix er Measurements (Option 089 Only) Con version Loss Using t he Frequency Of fset Mode 4. Turn on freq uency offset op eration b y pressing . Notice in thi s high-s ide LO , down convers ion configura tion, the analy zer’s sourc e is actually s weeping b a ckwards , as shown in Fi gur e 2 -13 .
2- 19 Making Mixer Measurements (Option 089 Only) Con version Loss Using t he Frequency Of fset Mode 5. T o view t he conversion loss in the b est verti cal resoluti on, press . Fi gu re 2 -15 Conversion Los s Example M easurement In this measurement , you set the input power and measured the outp ut power .
2-20 Making Mix er Measurements (Option 089 Only) High Dynamic Rang e Swept RF/IF Con ver si on Lo ss Hig h Dynamic Ran g e Swept RF/IF Co nversion Loss The frequenc y of f set mode ena bles the testi.
2- 21 Making Mixer Measurements (Option 089 Only) High D ynamic Range Swept RF/IF C onver sion Loss Figur e 2-16 C onne ctions f or P ow er Mete r Calib ration 3. Select t he a nalyzer a s the sy s tem control ler: 4. Set the power m eter’s a d dress: (where aa is the p ow er meter GPIB a ddress) 5.
2-22 Making Mix er Measurements (Option 089 Only) High Dynamic Rang e Swept RF/IF Con ver si on Lo ss NO TE Because power me ter c al ibrati on r eq uir es a l onger sweep ti me, you m a y w a nt to reduce the number of points before pressing .
2- 23 Making Mixer Measurements (Option 089 Only) High D ynamic Range Swept RF/IF C onver sion Loss Using the Mixer Measurement Diagra m While the a nalyzer is s till set to the IF f requency rang e, pres s : Note the RF frequency val ues on the diagram.
2-24 Making Mix er Measurements (Option 089 Only) High Dynamic Rang e Swept RF/IF Con ver si on Lo ss P erform the High Dyna mic Range Measur ement 1. Return the analyzer to t he IF fre q uency range. Press . 2. Make the connec tions shown i n Fig ure 2- 19 3.
2- 25 Making Mixer Measurements (Option 089 Only) High D ynamic Range Swept RF/IF C onver sion Loss Fi gu re 2-19 Conn ection s for a H igh Dynamic Range Swept IF Conversion Loss Measurement 4. Set the anal yzers LO frequenc y to match t he frequency of the LO sou r ce by press ing: 5.
2-26 Making Mix er Measurements (Option 089 Only) High Dynamic Rang e Swept RF/IF Con ver si on Lo ss Fi gure 2-20 Example of Swept IF Convers ion Loss Measure me nt.
2- 27 Making Mixer Measurements (Option 089 Only) Fixed IF Mixer Measurements Fi x ed IF Mixer Measur ements A fixed IF can be pr oduced by using b oth a swept RF a nd LO that a re offs et by a certa in frequency . With p roper fil tering , only this offset f requency wil l be present a t the IF port of the mixer .
2-28 Making Mix er Measurements (Option 089 Only) Fixed IF Mixer Measurements NO TE Y ou may have to cons ult the us er ’s guide of the ext er nal source being used t o determine how to set the source t o receive SCPI c ommands.
2- 29 Making Mixer Measurements (Option 089 Only) Fixed IF Mixer Measurements Putting the A nalyzer into Tu n ed Receiver Mod e Setting Up a Frequency List Sweep of 26 P oints P erforming a Response C.
2-30 Making Mix er Measurements (Option 089 Only) Fixed IF Mixer Measurements Initializ in g a Loop Counter V alue t o 2 6 Ad dres s ing a nd C onfi gurin g t he T wo Sou rc es Input as title: F REQ :.
2- 31 Making Mixer Measurements (Option 089 Only) Fixed IF Mixer Measurements TUNE D RE CEI VE R EDIT L IST ADD CW FR EQ 100M /u NUMB ER OF P OI NTS 26x1 DONE DONE LIST F REQ B TITL E POW: LE V 6DB M .
2-32 Making Mix er Measurements (Option 089 Only) Fixed IF Mixer Measurements Sequence 2 Setup The fol lowing seque nc e makes a seri es of measurements until all 26 CW measurements are made a nd the l oop counter value is equal to zero.
2- 33 Making Mixer Measurements (Option 089 Only) Fixed IF Mixer Measurements Press and the analyzer will displ ay the foll owing sequence c omma nds: SEQU ENCE SE Q2 Star t of Sequ ence WAIT x 1 x1 M.
2-34 Making Mix er Measurements (Option 089 Only) Fixed IF Mixer Measurements When the sequen ces are fini shed you should ha ve a r es ult as show n in Figu re 2-23 . Fi gure 2-23 Example Fixed IF Mixer Measu re men t The disp layed trace represents the conversion l oss of the mixer at 26 p oints .
2- 35 Making Mixer Measurements (Option 089 Only) Phase or Gro up Delay M easurements Ph ase or Gr oup Dela y Measu rements F o r i nfo rm atio n o n gr oup de lay p rin c ipl e s, refer to "Settin g the Electri cal Delay" on page 1-37 .
2-36 Making Mix er Measurements (Option 089 Only) Phase or Grou p Delay M easurements An importa nt character istic to r em ember when sel ec ting a c alibrati on m ixer is that the dela y of the devi ce should b e kept as l ow as possib le. T o do this , se lect a mixer w ith very wide bandw idth (wider band w idth results in smaller delay).
2- 37 Making Mixer Measurements (Option 089 Only) Phase or Gro up Delay M easurements Fi gu re 2-24 Connections for a Group Delay Measur e ment 6. T o selec t the converter type and a high-si d e LO measurement conf iguration, press: 7. T o view t he measurement resul ts on the a na lyzer’ s displa y , press: 8.
2-38 Making Mix er Measurements (Option 089 Only) Phase or Grou p Delay M easurements 10.Replace the "c alibra tion" mixer w ith the dev ice under tes t. If measuring group dela y , set the dela y equal to the "calibr ation" mixer d elay (fo r example − 0.
2- 39 Making Mixer Measurements (Option 089 Only) Amplitude a nd Phase T racking Amp litude and Phase Tracking The match b etween mixers is defined as t he absolute di fference i n amplitude or p ha se response over a spec ifi ed frequ ency range .
2-40 Making Mix er Measurements (Option 089 Only) Con version Compression Using the Frequency Off set M ode Co nv er sio n C o mp r es sio n U si ng th e Freq u enc y O ffs et Mo de Conver s ion compress ion is a measure of the maximum RF i np ut signal level where the mixer p rovides l inear operati on.
2- 41 Making Mixer Measurements (Option 089 Only) Con version Compression U sing the F r equency Of fset Mode 4. T o set the analy zer to the d esired power swe ep range, press: 5.
2-42 Making Mix er Measurements (Option 089 Only) Con version Compression Using the Frequency Off set M ode 8. Make the connec tions as shown in Fi gur e 2 -29 . CA UTI ON T o prevent connec tor damage, use an adap ter (part number 1 250-1462) as a connector saver for R CHANNEL IN .
2- 43 Making Mixer Measurements (Option 089 Only) Con version Compression U sing the F r equency Of fset Mode The measurements setup diagram i s shown in Figure 2-3 0 . Fi gu re 2-30 Measu r e ment Setup Diagram Shown on Analyzer Display 12.T o view the mixer’s outp ut power as a f unc tion of its i nput power , press: 13.
2-44 Making Mix er Measurements (Option 089 Only) Con version Compression Using the Frequency Off set M ode The measurement r esults show the mixer’s 1 dB c om pression p oint. By changing the target value , yo u can eas ily lo cate other compress ion poi nts (for example , 0.
2- 45 Making Mixer Measurements (Option 089 Only) Isolatio n Example Measurements Isolatio n Examp le Measu rements Isolati on is the m easure of s ignal le a kage in a mixer . F eedthroug h is specifi c ally the f or ward signa l lea kag e to the IF po r t.
2-46 Making Mix er Measurements (Option 089 Only) Isolat ion Example Measur em ents 4. Make the connec tions as shown in Fi gur e 2 -33 . Fi gure 2-33 Connections for a Response Calibrat ion 5. P erform a resp onse calibrat ion by pressi ng . NO TE A full 2-port cali bration will increase the acc uracy of isolati on measurements .
2- 47 Making Mixer Measurements (Option 089 Only) Isolatio n Example Measurements 7. T o adjus t the di s play sc ale, p ress: The measur em ent results show the mixer’ s LO to RF isol ation.
2-48 Making Mix er Measurements (Option 089 Only) Isolat ion Example Measur em ents NO TE Isolatio n is dependent on L O power leve l and frequency . T o ensure good tes t result s, y ou should ch oose these pa r ameters as c lose to ac tua l opera ting condit ions as possib le.
2- 49 Making Mixer Measurements (Option 089 Only) Isolatio n Example Measurements NO TE Y ou may see spurious responses on the anal y zer trac e due to inte rference caused by L O to IF l eakage in the m ixer . This can be r educed with a veraging or by r educing the I F bandwidth.
2-50 Making Mix er Measurements (Option 089 Only) Isolat ion Example Measur em ents SWR / Return Loss Refl ect ion coeffi cient ( Γ ) is d efined as the ratio betwe en the refl ec ted volta ge (V r ) and inc ident voltage ( V i ).
3-1 3 Ma king T i me Domai n Meas urements.
3-2 Making Tim e Domain Measurements Using This C hapter Using This C hapter This cha pter contai ns the foll owing: • An intro d uction to time domain measurements • Example proced ur es for m a .
3- 3 Making Time D o main Measurements Intr oduction to Time D omain Measur ements Introdu ction t o Time Domain Measu rement s The analyzers with Option 010 all ow y ou to measure the time domain response of a device . Time domain a na lysis is us eful for isolating a device p roblem in ti me or i n distance .
3-4 Making Tim e Domain Measurements Int roduction t o Time D om ain Measurements Fi gure 3-1 Device Frequency Domain and Ti me Domain Reflection R esponses The time domain measure ment shows the ef f.
3- 5 Making Time D o main Measurements Making T ransmission Response Measurements M aki ng Tr an smission R esponse Me asurem e nts In this ex ample measurement there are thr ee components of the transmissi on response: • RF leakage at ne ar zero time • the main trav el path thro ugh the device (1.
3-6 Making Tim e Domain Measurements Making T ransmission Response M easurements 5. T o transform t he d ata f r om the f requenc y domai n to t he time domai n and set the sweep from 0 s to 6 µ s , press: The other ti me domain modes , low pass step and l ow pass impulse, ar e descr i bed in "Time Domain Low P ass Mode" on p age 3-15 .
3- 7 Making Time D o main Measurements Making T ransmission Response Measurements 11.T o activat e the gating f unction to r em ove any unwanted responses , press: As show n i n Figu r e 3-4 , only respons e from the main path is disp layed.
3-8 Making Tim e Domain Measurements Making T ransmission Response M easurements Fi gure 3-5 Gate Shape • T o see the ef fect of the gating i n the frequenc y dom ain, pre s s: This pl aces the gated response in mem ory . Fi gur e 3 -6 shows the effect of remov ing the RF leakage and the tripl e travel s ignal path usi ng gating .
3- 9 Making Time D o main Measurements Making Reflection Response Measurements Making Reflection Re sp onse Measurements The time domain response of a reflecti on measurement is o ften compared with the time domain reflect ometry ( TDR) measurements .
3-10 Making Tim e Domain Measurements Making Reflection Response Measurements Figu re 3 -8 Devic e Re s p onse in the Frequency Domain 5. T o transform t he data from t he frequency do m a in to the time domain, p ress: 6.
3- 11 Making Time D o main Measurements Making Reflection Response Measurements 8. T o positi on the marker on t he reflecti on of inter est, press : and tur n the front p anel knob, or enter a v a lue from the front panel key pad .
3-12 Making Tim e Domain Measurements Time Do m ain Bandpass Mode Ti me Doma in Bandpass Mode Thi s mo de is ca ll ed b and pass becau s e it wo rks with ban d-lim i ted de vic es. Trad it ional TD R requir es that the test device be able to op erate down to dc .
3- 13 Making Time D o main Measurements Time Domain B andpass Mode Fi gu re 3-10 A Re flec t ion Measu r e ment of Two Cables The ripples in reflec tion coeffi cient versus frequency in the frequency d omain measurement are caused by the reflections a t each connector "beati ng" against ea ch other .
3-14 Making Tim e Domain Measurements Time Do m ain Bandpass Mode Transmission Measurements Usin g Bandp ass Mode The bandp a ss mode can a l so transfo rm transmission m easurements to t he time domain. F or example, thi s m o d e can provide inf ormation about a surface acoustic w ave (SA W) filter that i s not apparent in the fre quency domain.
3- 15 Making Time D o main Measurements Time Domai n Lo w Pass Mode Time Domain Low P ass M ode This mode is used to simul a te a tr a ditional time domain refl ectometry (TDR) measurement. It provides i nformati on to determine the type of disc ontinuity ( resistive , capacitiv e, or i nductive) tha t is pr esent.
3-16 Making Tim e Domain Measurements Time Do m ain Low P ass Mode Minim um Al lo wable Stop Freque ncies The lowest analyzer meas urement frequency is 5 0 MHz, ther efore for each value of n there is a minimum allowa b le stop f requency that c an be used.
3- 17 Making Time D o main Measurements Time Domai n Lo w Pass Mode The real format can also be used in the low pass impul s e mode , but for the best dyna m i c range f or simultaneous l y viewing large and small discontinuit ies, use the log magnitude fo rmat .
3-18 Making Tim e Domain Measurements Time Do m ain Low P ass Mode F ault Location Measurements Using Low P ass As desc ribed, the l ow pass mode ca n simulate t he T DR response of the tes t device. This resp ons e contains i nformation usef ul in deter mi ning the t ype of di s continuity pr esent.
3- 19 Making Time D o main Measurements Time Domai n Lo w Pass Mode Fi gu re 3-14 Low P ass Step Measurements of Com mon Cable F aults (Real For m at) Transmission Measurements in Time Doma in Low P a.
3-20 Making Tim e Domain Measurements Time Do m ain Low P ass Mode Fi gure 3-15 Time Domain Low P ass M easure m ent of an Amplifier Small Signal Transient Response Interpr e tin g the Low P ass Step .
3- 21 Making Time D o main Measurements Time Domai n Lo w Pass Mode Fi gu re 3-16 Transmission Measurements Using Low P ass Impulse Mode.
3-22 Making Tim e Domain Measurements T ransfor ming CW Time Measurements in to the Frequenc y Domain Tr ansf orm in g CW Time Measurements int o the Frequency Domain The anal yzer can dis play the a mplitude and p has e of CW signals v ersus time .
3- 23 Making Time D o main Measurements T ransf or ming CW Time M easurements into the Frequen cy Domain Interpreti ng the F orward Tran sform Ho riz ont al Axis In a fr equency domain t r ansform of a CW time measureme nt, the horizont al axis is measured in uni ts of f requenc y .
3-24 Making Tim e Domain Measurements T ransfor ming CW Time Measurements in to the Frequenc y Domain Figure 3 -19 Sepa ratin g th e A mplit ude an d P hase Comp onen ts of T est -Devic e-Ind uce d Mo.
3- 25 Making Time D o main Measurements T ransf or ming CW Time M easurements into the Frequen cy Domain Fi gu re 3-20 Range of a F orward T ransform Measurement T o increase the f requency domain m easurement range , increas e the span.
3-26 Making Tim e Domain Measurements Masking Masking Masking occurs when a discont inui ty (fault) c losest to the reference plane affects the resp ons e o f each subsequent dis continuity . This happens because the ener gy reflected f rom the f irst disconti nuity never reaches s ubsequent disc ontinuities .
3- 27 Making Time D o main Measurements Windowi ng Windowin g The analyzer provides a wind owing feature tha t makes time d om a in measurement s more useful for isolati ng and identif y ing individua l responses . Windowing i s needed bec a use of the abrupt t ransitions i n a frequenc y domain measur em ent at the sta rt and sto p frequencies .
3-28 Making Tim e Domain Measurements Window ing Choose one of the thr ee window shapes l isted or use the knob to s elect any windowing pulse width ( or ris e ti me for a step stim ulus) be tween t he soft key value s . The time domain stimul us sidelobe levels depend only on the w indo w selected.
3- 29 Making Time D o main Measurements Windowi ng Fi gu re 3-23 Th e Ef fects of Windowing on th e T ime Domain Responses of a S h ort Circ uit (Real F o r mat).
3-30 Making Tim e Domain Measurements Range Range In the time domain, r ange is d efined as t he length in time that a me asurement can be made withou t encounteri ng a repetition of the res ponse, c a lled a liasing .
3- 31 Making Time D o main Measurements Range In this ex ample, t he range i s 100 ns , or 30 meters el ectrical l ength. T o prevent the time domain resp onses from ove rlapping , the test device must b e 30 meters or less in e lectrical length for a transmiss i on measurement ( 15 meters for a reflect ion measurement).
3-32 Making Tim e Domain Measurements Resoluti on Resolu tion Two dif ferent resoluti on terms a re used in the ti me domain: • response res olution • range resoluti on Response Resolution Time do.
3- 33 Making Time D o main Measurements Resolution F or example, a cable wit h a teflo n dielectric (0.7 rel a tive veloc ity facto r ), measured und er the condit ions stated a b ove, ha s a fault l ocation measur em ent response r esoluti on of 0.45 centimeter s.
3-34 Making Tim e Domain Measurements Resoluti on Range Resolution Time domain r ange resol ution is def ined as the ability to locate a single response in ti me. I f only one r es pons e i s present, range resolution is a measur e of how c l os ely you can p i npo int the p ea k of t ha t response .
3- 35 Making Time D o main Measurements Gat ing Gating Gating pr ov ides the f lexibility of sele c tively re m oving time domain responses . The remaining ti m e domain resp onses can then be transformed b a ck to the f requency d om ain.
3-36 Making Tim e Domain Measurements Gat ing Fi gure 3-27 Gate Shape Selecting Gate Shape The four gate shapes available a re listed in T a bl e 3 -4 . Ea ch gate ha s a differ ent passband fl a tness, c utof f rate, a nd sidelobe levels . The passb and ripple and si delobe level s are descr iptive of the gate shape .
4-1 4 P rint ing, Pl ottin g, a nd Sa vin g Mea surement Results.
4-2 Printing, Pl otting, and S aving Measurement Resul ts Using This C hapter Using This C hapter This cha pter contai ns instructi ons for the following t a sks: • Printing or plotting y our measur.
4- 3 Printing, Pl otting, and S aving Measurement Resul ts Printi ng or Plo tting Y our M easurement Resul ts Printi ng or P lotti ng Y our Measur ement Result s Y ou c an print your m easurement resu.
4-4 Printing, Pl otting, and S aving Measurement Resul ts Confi guring a Print Function Co nf igu ring a Prin t Function All c opy configur ation setti ngs are stor ed in non- volatile memory . Therefore , they a re not affected if yo u press or switc h off the a nalyzer power .
4- 5 Printing, Pl otting, and S aving Measurement Resul ts Confi guring a Print Fu nct ion 3. Select one of the foll owing printer interfaces: • Choose if y our printe r has a GPIB i nterface , and then configure t he print func tion as f ollows: a.
4-6 Printing, Pl otting, and S aving Measurement Resul ts Defi ning a Print F unct ion Defi ning a Print Fu nction NO TE The print d efinition is set to default values whenever th e power is cyc l ed. However , you can sa ve the pri nt definiti on by sav i ng the instr ument state.
4- 7 Printing, Pl otting, and S aving Measurement Resul ts Defi ning a Print Fu nct ion T o Reset the P rinting P arameters to Defa ult V alues 1. Pre ss .
4-8 Printing, Pl otting, and S aving Measurement Resul ts Printi ng One Measurement Per P age Printi ng One Meas u r ement P er P a ge 1. Configure and define t he print functi on, as ex plai ned in "Conf i guring a Print Functi on " on page 4- 4 an d "D efining a Print Function" on page 4- 6 .
4- 9 Printing, Pl otting, and S aving Measurement Resul ts Printi ng Multiple M easurements P er Page Printin g Mu lt iple Measurements P er P age 1. Configure and define the print f unct ion, as explaine d in "Configuri ng a Print Function " on page 4-4 and "Defining a Print Function " on page 4-6 .
4-10 Printing, Pl otting, and S aving Measurement Resul ts Confi gur in g a Plot Function Configu rin g a Plot Fu nct ion All c opy configur ation setti ngs are stor ed in non- volatile memory . Therefore , they a re not affected if yo u press or switc h off the a nalyzer power .
4- 11 Printing, Pl otting, and S aving Measurement Resul ts Confi guring a P lot Fu nct ion Informati on regarding a printer c ompatibil ity guide (an up-to-date l ist of pri nters that are c ompa tible wit h the network anal y zer) i s avail a ble i n "P rinti ng or Plotting Y our Measurement Res ults" on page 4-3 .
4-12 Printing, Pl otting, and S aving Measurement Resul ts Confi gur in g a Plot Function If Y ou Are Pl otting to a P en Plot ter 1. Press and then until ap pears. 2. Configure the analyzer for one of the f oll owing plotter i nterfaces: • Choose i f your p lotter has a GPIB interf ace, and then conf igure the p lot function a s follows: a.
4- 13 Printing, Pl otting, and S aving Measurement Resul ts Confi guring a P lot Fu nct ion If Y ou Are Plotting Measurement Results to a Disk Drive The plot files tha t yo u gen erate from the a nalyze r , conta i n the H PGL represent ation of t he measurement di s play .
4-14 Printing, Pl otting, and S aving Measurement Resul ts Confi gur in g a Plot Function Fi gu re 4-4 A ut om atic Fi le Naming Convention for LIF F ormat T o Output the P lot Files • Y ou ca n plot the f iles to a plotter from a personal c omputer .
4- 15 Printing, Pl otting, and S aving Measurement Resul ts Defin ing a P lot Function Defining a Plot Function 1. Pre ss . Choosing Disp lay Eleme nts • Choose which of the foll owing measurement disp lay element s that you want to ap p ear on your plot: ❏ Choose if you want the measurement data trace to appear on your plot.
4-16 Printing, Pl otting, and S aving Measurement Resul ts Defi nin g a Plot Function NO TE The peripheral ignores w hen you are p lotting t o a qua dra nt. Selecting P en Numbers and Colors • Press and select the plot el em ent where you w ant to cha ng e the pen num b er .
4- 17 Printing, Pl otting, and S aving Measurement Resul ts Defin ing a P lot Function Selecting Line Types • Pr ess and select ea ch plo t element line t ype that you w ant to modi fy . — Select to modify the line type for the dat a trace . Then enter t he new line ty pe (see Figure 4 -6 ), foll owed by .
4-18 Printing, Pl otting, and S aving Measurement Resul ts Defi nin g a Plot Function Fi gu re 4-7 Locations of P1 an d P2 in Mode Choosing Plot Speed • Press until the pl ot speed appea r s that you w a nt. ❏ Choose for normal plo tting. ❏ Choose for plott ing directly on transparenci es.
4- 19 Printing, Pl otting, and S aving Measurement Resul ts Plot ting One Measurement Per P age U sing a P en Plot ter Plot ting One Meas urement P er P a ge Using a P en Plot t er 1. Configure and d efine t he plot, as ex plained in " Conf ig uring a Plot Function" on pa g e 4-10 and "D efining a Pl ot Function" on page 4-15 .
4-20 Printing, Pl otting, and S aving Measurement Resul ts Plot ti ng Multi pl e Measur em ent s P er Page Using a Pen Pl otter Plottin g Mu ltiple Measurements P er P age Using a P en Plo tter 1.
4- 21 Printing, Pl otting, and S aving Measurement Resul ts Plottin g Multiple M easurements P er P age Using a P en Plotter If Y ou Are Plotting to a n HPGL Compatible Printer 1. Configure and d efine t he plot, as ex plained in " Conf ig uring a Plot Function" on pa g e 4-10 and "D efining a Pl ot Function" on page 4-15 .
4-22 Printing, Pl otting, and S aving Measurement Resul ts T o View Plot Files on a PC T o View P lot F i les on a PC Plot files can be v iewed and manipula ted on a PC usi ng a word proce s sor or g r aphics pres enta tion prog ram. Plot fi les contain a text s tr eam of HPGL (Hewlett- Pa ckard Graphics L anguage) c omma nds.
4- 23 Printing, Pl otting, and S aving Measurement Resul ts T o View Plot Fil es on a PC Using Ami Pro T o view plot files in Ami Pro, per form the f ollowing s teps: 1. From the FILE p ull-down menu, select IMPORT PICT U RE. 2. In the dialog box, change the File Type selecti on to HPGL.
4-24 Printing, Pl otting, and S aving Measurement Resul ts Outp utting Pl ot Fi les fr om a PC to a Plot ter Converting HPGL Files for Use with Other PC Applications A util ity can c onvert hpgl (or .
4- 25 Printing, Pl otting, and S aving Measurement Resul ts Out putt i ng P lot Files f rom a PC t o an HPGL Compatibl e Pri nter Output t in g Plot Files from a PC to an HPGL Compa tible Pri nter T o output the p lot files to an HPGL compat i ble printer , you can use the HPGL initial ization sequence linked in a s eries a s follows: Step 1 .
4-26 Printing, Pl otting, and S aving Measurement Resul ts Outp utting Si ngle Pa ge Plots Usi ng a Pri nter Step 2. Store the exit HPGL mod e and form feed s equence. 1. Create a t est file b y typing in ea ch charact er as shown i n the left c olumn of T a bl e 4 -8 .
4- 27 Printing, Pl otting, and S aving Measurement Resul ts Outputt ing Mult iple P lots to a Singl e Pa ge Using a Printer Output t in g Multiple Plots t o a Single P age Usin g a Printe r Refer to &.
4-28 Printing, Pl otting, and S aving Measurement Resul ts Plot ting Multi pl e Measur ements P er Page fr om Disk Plottin g Mu ltiple Measurements P er P age from Disk The fol lowing procedur es show you how to store plot files on a LIF formatte d disk.
4- 29 Printing, Pl otting, and S aving Measurement Resul ts Plot ting Multipl e Measurements Per P age f rom Disk T o Plot Multiple Measurements on a Full P age Y ou m ay want to plot v a rious fil es to the s a me page , for exampl e, to show measurement data traces for diff erent input s ettings, or para m eters , on the sa m e gratic ul e.
4-30 Printing, Pl otting, and S aving Measurement Resul ts Plot ting Multi pl e Measur ements P er Page fr om Disk Figu re 4-1 0 shows pl ots for bot h the frequenc y and time domai n r esponses of the same dev ice . Fi gu re 4-10 Plotting Two F iles on the Same P age T o Plot Measur ements in P age Quadrants 1.
4- 31 Printing, Pl otting, and S aving Measurement Resul ts Plot ting Multipl e Measurements Per P age f rom Disk 4. Press . The analyzer assigns the f irst available d efault f ilename for t he selec ted quadrant . F or example , the analyzer w ould assi g n PLOT01 LU if t here were no other lef t-upper quadrant p lots o n the disk.
4-32 Printing, Pl otting, and S aving Measurement Resul ts Tit li ng the Displa yed Measurement T itling the Dis played Measurement 1. Press to access t he title menu. 2. Press and enter the ti tl e you w ant for your measurement disp lay . • If you hav e a DIN keyboard attac hed to the analyzer , type the tit le you wa nt from the keyboard.
4- 33 Printing, Pl otting, and S aving Measurement Resul ts Configur ing t he Anal yzer to Prod uce a Time St amp Config uring the Analyzer to Produ ce a Time S t amp Y ou c an set a cl ock, and then activate i t, if yo u want the time and date to appear on y our hardcopies .
4-34 Printing, Pl otting, and S aving Measurement Resul ts Pri nti ng or Plotting the List V alues or Operati ng P arameter s Printing or Plot ting the List V alues or Operati ng Pa r a m e t e r s Press a nd selec t the informatio n that you w ant to appear on y our hardcopy .
4- 35 Printing, Pl otting, and S aving Measurement Resul ts Solvi ng Pr oblems with P rinting or Plot ting Solving P roblems w ith Printin g or Plotting If y ou encounter a p r oblem when you a re printing or plotti ng, c heck the fol lowing li s t for po ssi ble cau ses : • Look in the analyzer displa y message area.
4-36 Printing, Pl otting, and S aving Measurement Resul ts Savin g and Recalling Instrument States Savi ng and R ecalli ng Instrument States Places Where Y ou Can Save • analyzer in ternal memory .
4- 37 Printing, Pl otting, and S aving Measurement Resul ts Savin g and Recalling Instrument States What Y ou Ca n Save to a Floppy Disk Y ou c an save a n instrument state and measurement results t o a disk.
4-38 Printing, Pl otting, and S aving Measurement Resul ts Savin g an Instrument State Saving an Instru ment State 1. Press a nd select one o f the storage d evices: ❏ ❏ ❏ connect an external disk drive to the analyzer ’ s GPIB connector , and co nf igure as f ollows: a.
4- 39 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s Saving M easurement R esults Instrument states combined wi th measurements re s ults can only be saved t o disk. Fil es that conta in data-only , and the v arious sa v e optio ns avail a ble under the key , ar e also o n ly valid for disk saves.
4-40 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s Fi gu re 4-13 Data P r oc essing Fl ow Diagram NO TE If the anal y zer has a n active two-p ort measurement cali bration, all four S-para m eters wil l be sav ed with the measurement resul ts.
4- 41 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s If you sele c t , , or , the data is stored to disk i n IEEE-64 bit real format ( for LIF disks ), and 32 bit PC format for DOS disks . This ma kes the DOS da ta files ha lf the si ze of the LI F file s.
4-42 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s If , or , or is s elected, a CIT Ifile i s save d for eac h displa yed channel wi th the suffi x lett er “D”, or “F”, follo wed by a number . The number f ollowing “D” a nd “F” f iles is t he channel number .
4- 43 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s The "format" choice is selected b y the curr ent selectio n under the FORMA T menu.
4-44 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s Saving in T extu al (CSV) F orm T e xt u al mea sure m en t res ult s can b e save d in a co m ma-s e par ate d va lue (C S V ) fo rm a t a n d imported into a sprea dsheet applicat ion.
4- 45 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s How the A nalyz er Nam es T hese Files S equen tially When text fi les are sa ved, the ana lyzer generat es the file names automaticall y in the following format: txtcss.
4-46 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s Saving in Grap hical (JP EG) F orm Graphical measurement results can be sav ed in JPEG format a nd used as a n illustr a tion in a text editor or desktop p ublishing a pp lication .
4- 47 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s Instrument St ate Files When an instrume nt state is sa ved to a floppy disk, som e or all of the followi ng fil es may be p rod u ced .
4-48 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s Files with .d1 a nd .d2 Fil e Exte nsions There are tw o type of fi les with .d 1 and . d 2 file e xtensions . There i s Fil eXX .d1 ( or .d2) a nd Dat aX X .d 1 (o r .
4- 49 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s Files w i t h .g0 File Extensio n FileXX.g0 , produced only when is t ur ned ON , is a b inary file containin g the acti ve measurement tra ce and di splay graticule.
4-50 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s Raw Arrays On the analyzer , press the Data cr eated the fir st time in this manner wi l l be sa ved as fil ena me “FILE00.
4- 51 Printing, Pl otting, and S aving Measurement Resul ts Re-Sa ving an Instr umen t State Re-Savin g an I n strument State If y ou re-save a file , the analyzer overwrites t he existing fi le contents . NO TE Y ou cannot re- save a fi le that c ontains data on ly .
4-52 Printing, Pl otting, and S aving Measurement Resul ts Delet ing a File Deleting a F ile 1. P ress . 2. Choose fr om the foll ow ing storage devices: ❏ ❏ ❏ (If nec essary , refer to the ex ternal disk set up procedure in "Sa ving an Instrument St a te" on page 4- 38 .
4- 53 Printing, Pl otting, and S aving Measurement Resul ts Renami ng a File Renaming a File 1. Pre ss . 2. Choose from the f ollowing stor age devices : ❏ ❏ ❏ (I f necessary , refer to the ext er nal disk s etup procedure i n "Sav ing an Instrument State" on p age 4-38 .
4-54 Printing, Pl otting, and S aving Measurement Resul ts Recalling a File Recalling a File 1. P ress . 2. Choose fr om the foll ow ing storage devices: ❏ ❏ ❏ (If nec essary , refer to the ex ternal disk set up procedure in "Sa ving an Instrument St a te" on page 4- 38 .
4- 55 Printing, Pl otting, and S aving Measurement Resul ts Solving Pr oblems with Saving or Recalling Files Solving P roblems wit h Savin g o r Recalling Files If y ou encounter a p r oblem when you .
4-56 Printing, Pl otting, and S aving Measurement Resul ts Solvi ng Prob lems with Savi ng or Recal ling Fil es.
5-1 5 Optimi zing Me asurem ent Results.
5-2 Optimizing Measur em ent Results Using This C hapter Using This C hapter This cha pter descri bes tec hni ques and analy zer functions tha t help y ou a chiev e the best measurement r esults .
5- 3 Optimizing Measurement R esults T aking C ar e of Microwa ve Connectors T aking Ca re of M icrow ave Connecto rs Proper co nnec tor car e a nd connecti on techniques are critic al for accur ate, r epeatable measurements . Refer to the calibrati on kit documentati on for connecto r care informati on.
5-4 Optimizing Measur em ent Results Increasing Measurement Accuracy In creasing Measurement Accur acy The fol lowing all contribute t o loss of a ccuracy i n a measurement.
5- 5 Optimizing Measurement R esults Increasing Measur em ent Accuracy T emperature Drift Electrica l character istics will change wi th temperature due to the thermal expansion characte ristics of d evices withi n the analyzer , cali bration device s, tes t devices , cab les, and adapters .
5-6 Optimizing Measur em ent Results Increasing Measurement Accuracy Y ou can acti v a te a p or t extens ion by pressing . Then enter the delay to t he reference p lane.
5- 7 Optimizing Measurement R esults Main t aining T est P o rt Out put P ower During Sweep Retrace M ain taining T e st P ort Output P o wer D uring S we e p Retra ce During sta nd ard operati on, the anal y zer provi d es output power d uring its forward frequency sw eep , but may not p r ovi de outp ut power during its s w eep re trac e .
5-8 Optimizing Measur em ent Results Making Accu rate Measureme nt s of El ectrically Long Devices Maki ng Accura te Measuremen ts of Elect rically Long Devices A d evice wit h a long electr ical del .
5- 9 Optimizing Measurement R esults Making Accurate Measurem ents of Elect ri call y Long De vices De creas i ng the Sweep Rat e The sweep r a te can be dec reased by inc reasing the a nalyzer’s s w eep time .
5-10 Optimizing Measur em ent Results Increasing Sweep Speed Incre asing Sweep S peed Y ou can incre a se the anal yzer sweep speed b y avoi d ing the use o f some fea tures that requir e computational ti me for impl ementation and upda ti ng, s uch as bandwidth marker tracki ng.
5- 11 Optimizing Measurement R esults Increasing S w eep Speed Sw eep S pee d-R elat ed Err or s IF delay occurs dur ing swept measurement s when the si gnal from t he analyzer sourc e is delay ed in reac hing the anal yzer receiver because of an electricall y long devi ce.
5-12 Optimizing Measur em ent Results Increasing Sweep Speed T o Set the Auto Sweep T ime Mode Auto s w eep time mode i s the defa ul t mode (the preset mode). T his mode m aintains the fast es t sweep speed possible f or the c ur rent measurem ent settings .
5- 13 Optimizing Measurement R esults Increasing S w eep Speed T o View a Sing le Measur ement Channel View ing a single channel wil l increase th e measurement speed if the analyze r’s cha nnels are in a lternate, or uncoupled m ode. 1. Pre ss . 2.
5-14 Optimizing Measur em ent Results Increasing Sweep Speed • Cont inuou s: In this mode the analyz er will switc h between the test ports on every sweep . Although thi s type o f test set switching provides the g reatest me a surement accu r acy , it re qu i re s a re v erse sw eep fo r e ve ry fo rwar d sw eep.
5- 15 Optimizing Measurement R esults Increasing Dynamic Range Increa sing Dynamic Rang e Dynamic range i s the di f ference b etw een the ana lyzer’s maximum all owable in p ut level and minimum measurabl e power . F or a measurement to be valid, input signals m ust be within thes e boundaries .
5-16 Optimizing Measur em ent Results Reducin g N oise Reduci ng Noise Y ou can use two a nalyzer f unctions to hel p reduce the effect of noise on the data trace: • activate m ea surement a v eragi.
5- 17 Optimizing Measurement R esults Reducin g N oise T o Use Direct Sampler Access Configurations (Option 012 Only) Direct s ampler access to both the A and B samplers c an decre a se the noi s e floor of the analyzer .
5-18 Optimizing Measur em ent Results Reducin g Receiver Crosst alk Reduci ng Rece iver Cro sstal k T o reduce r eceiver c r osstalk you c a n do the f ollowing: • P erform a resp onse and isolat ion measurement c a libration. • Set the s w eep to the alternate mode .
6-1 6 Cali brat ing f or I ncr eased Measu remen t Accu racy.
6-2 Cali brat ing for Increased Measur ement Accuracy How to Use Th is Chapter How to Use This Cha pte r This cha pter i s divided int o the foll owing subjects: • "Calibrat ion Considerati ons.
6- 3 Calibrating f or Increased M easurement Accuracy Intr oduction Introd uction The accuracy of network anal ysis is g r eatly inf luenced by fact ors external t o the network analyzer .
6-4 Cali brat ing for Increased Measur ement Accuracy Cali bration C onsiderations Ca libr ati on Co nsi de r atio ns Measurement P arameters Calibra tion procedur es are paramete r- specific, rather than c hannel-speci f ic.
6- 5 Calibrating f or Increased M easurement Accuracy Calibrati on Consi derations • 90 to 100 dB: I solation c alibration i s recommended with test port power g reater t ha n 0 dBm. F or this isol ation cali b ration, averaging shoul d be turned on w ith an a veraging facto r at least f our times the measurement av er aging fac tor .
6-6 Cali brat ing for Increased Measur ement Accuracy Cali bration C onsiderations Frequency Response of Calibration Standards In or d er for th e response of a refer ence standard to show as a dot o n the smith chart displ ay format, i t must hav e no phase shift w i th res p ect to fr equency .
6- 7 Calibrating f or Increased M easurement Accuracy Calibrati on Consi derations T able 6-1 Calibration Stan d ard Types and Expected Phase Shift T est Port Conn ector T ype Standa rd T ype Expected Phase Shift 7-mm Short 180 ° Type-N ma le 3.5-mm mal e Offset S hort 3.
6-8 Cali brat ing for Increased Measur ement Accuracy Cali bration C onsiderations Fi gu re 6-1 Typical Re spon se s of Calibration S tandards after Calibration Interpolated Error Correction Y ou may .
6- 9 Calibrating f or Increased M easurement Accuracy Calibrati on Consi derations NO TE T he preset sta te of the i nstrument can b e configured so that int er polated error cor rection is on or off . Press to c onf ig ur e the pres et state of i nterpolated er ror correc tion.
6-10 Cali brat ing for Increased Measur ement Accuracy Pr ocedur es f or E rr or Correcting Y our M easurements Proc edur es for Error Correct ing Y our Measur ements This sec tion has exampl e proced.
6- 11 Calibrating f or Increased M easurement Accuracy Pro cedures fo r Err or Correctin g Y our Measurements NO TE Resp onse calib ration is not as accurate as other cali bration methods . En han ce d R e spo nse and En hanced Reflection Transmis s i on or reflect ion measurement w hen improved accurac y is desired.
6-12 Cali brat ing for Increased Measur ement Accuracy Frequen cy Response Er ror Correction s Fr e q uency R espon se Error Correc t ions Y ou can remove the frequency re s ponse of the test setup fo.
6- 13 Calibrating f or Increased M easurement Accuracy Frequency Response Erro r C orr ections Fi gure 6-2 S ta n dard Connect ions for a Response Error Correct ion for Reflecti on Measurement 7. T o measure t he standard when t he display ed trace has s ettled, pres s or .
6-14 Cali brat ing for Increased Measur ement Accuracy Frequen cy Response Er ror Correction s Response Error Correction for Transmission Measurements 1.
6- 15 Calibrating f or Increased M easurement Accuracy Frequency Response Erro r C orr ections NO TE Do n ot use an open or short stand a rd for a transmission r esponse correc tion. NO TE Y ou can sa v e or st or e the measur em ent correc tion to use for later measurements .
6-16 Cali brat ing for Increased Measur ement Accuracy Frequen cy Response Er ror Correction s Figure 6-4 St anda rd Conne ctions f or a Rec eiver C alibratio n 3. T o choose a non-ratioe d measurement, pr ess : F or ES analyzers , press . This s ets the sour ce at PORT 1.
6- 17 Calibrating f or Increased M easurement Accuracy Frequenc y Response and Isolation Er ror Corr ections Frequen cy Response an d Isolat ion Er ror Corr ections Y ou c an make a response and isola.
6-18 Cali brat ing for Increased Measur ement Accuracy Frequen cy Response and Isolation E rror C orrections 7. Make a "thru" connection b etween the point s where you wil l connect your device und er test. NO TE Include any adapters that y ou will ha ve in the d evice measurement.
6- 19 Calibrating f or Increased M easurement Accuracy Frequenc y Response and Isolation Er ror Corr ections 12.Return the a v eraging to the ori gina l state of the measurement. F or example , reduc e t he av er aging fac tor by at l ea st four times or turn a veraging of f .
6-20 Cali brat ing for Increased Measur ement Accuracy Frequen cy Response and Isolation E rror C orrections 5. If your calibra tion kit is dif ferent tha n the kit s peci f ied under the sof t key , .
6- 21 Calibrating f or Increased M easurement Accuracy Frequenc y Response and Isolation Er ror Corr ections The anal y zer displ ays WAIT - MEA SU RIN G C AL ST AND ARD during the sta ndard measurement. T he anal y zer underli nes the softkey tha t you sel ec ted after it fi ni shes the meas ur ement, and c om putes the er ror coeffi cients .
6-22 Cali brat ing for Increased Measur ement Accuracy Enhanced Frequency Response Err or Correcti on Enha nced F requen cy Respons e Error Co rrecti on The enhanc ed frequenc y response error c orrec.
6- 23 Calibrating f or Increased M easurement Accuracy Enhanced Frequency Response Erro r Correcti on 6. T o selec t the correc tion type, pr ess and s el ect the c orrection ty pe.
6-24 Cali brat ing for Increased Measur ement Accuracy Enhanced Frequency Response Err or Correcti on 12.T o measure the sta ndard, when the d isplaye d trace ha s settl ed , press: , se lect the ty p e of lo ad y ou are us ing , and then pr ess when the analyze r has finished m easuring the load.
6- 25 Calibrating f or Increased M easurement Accuracy Enhanced Frequency Response Erro r Correcti on b. Activate at l east four times more av er ages than d esired duri ng the devic e measurement. c. Pr ess . d. Return t he averaging to the orig inal state of the measurement , and press .
6-26 Cali brat ing for Increased Measur ement Accuracy One-P ort Reflection Error C orrection On e -P o rt Re fl ection Error Co rrec t ion • removes dir ec tivity errors of t he test se tup • rem.
6- 27 Calibrating f or Increased M easurement Accuracy One-Po rt Reflection Erro r C orrection NO TE Include any a d apters that you will ha ve in the dev ice measurement . That is , connect the c alibration standard to the p articular connector where y ou will connect your d evice under test.
6-28 Cali brat ing for Increased Measur ement Accuracy One-P ort Reflection Error C orrection The analyzer d isplay s the corre cted data tr a ce. T he analyzer al s o shows the notation Cor to the left of t he screen, i ndicating that the cor rection is s w itched on for this channel.
6- 29 Calibrating f or Increased M easurement Accuracy Full T w o- P or t Erro r Correction (ES Anal yzers Onl y) Ful l Two- P ort Erro r C orrect ion (E S A nalyze r s On ly) • removes directi vity.
6-30 Cali brat ing for Increased Measur ement Accuracy Full T wo-P ort Error Correcti on (ES Analyzers Only) Figur e 6-9 St anda rd Conne ctio ns for Full Tw o -P ort E rror C o rrection 6.
6- 31 Calibrating f or Increased M easurement Accuracy Full T w o- P or t Erro r Correction (ES Anal yzers Onl y) 14.Make a "thru" connectio n between the poi nts where you wil l connect y our device und er test a s shown i n Fi gu re 6- 9 .
6-32 Cali brat ing for Increased Measur ement Accuracy Full T wo-P ort Error Correcti on (ES Analyzers Only) 17.T o compute the er r or coeff icients , press : The analyzer d isplay s the corre cted measurement tr a ce. The analyzer a lso shows t he notation Cor at the left of the screen, i ndicating that error c orrectio n is on.
6- 33 Calibrating f or Increased M easurement Accuracy Po wer Meter Measurement Calibrati on P ow er M eter M e asu reme nt Calib ratio n A GPIB-compatib le power mete r can monitor a nd correct RF source power to a chieve leveled pow er at the te st port.
6-34 Cali brat ing for Increased Measur ement Accuracy P ower Me t er Measurement C alibration Interpolation in P ower Meter Calibration If the frequency is changed in li nea r sweep, or the sta rt/stop pow er is cha nged in power sweep , then t he calibration d ata is inter polated for the new range .
6- 35 Calibrating f or Increased M easurement Accuracy Po wer Meter Measurement Calibrati on ❏ If y ou are modifying the frequency , enter the new value, followed by a , , or key . ❏ If y ou are modifying the correction f actor , enter the new value , follo w ed by the key .
6-36 Cali brat ing for Increased Measur ement Accuracy P ower Me t er Measurement C alibration NO TE Remember to subtrac t the through a rm loss f r om the coupl er arm loss b efore enteri ng it i nto the power l oss table, to ens ure the correct power at the output of t he coupler .
6- 37 Calibrating f or Increased M easurement Accuracy Po wer Meter Measurement Calibrati on 3. Select t he a nalyzer a s the sy s tem control ler: 4. Set the p ow er meter’ s address (“XX” represents the address in the following keystrokes: 5.
6-38 Cali brat ing for Increased Measur ement Accuracy P ower Me t er Measurement C alibration Using Continuous Correction Mode Y ou can set the analyzer to up date the cor rection table at each sweep (as in a l eveling applica tion), using the continuous s ample mode .
6- 39 Calibrating f or Increased M easurement Accuracy Po wer Meter Measurement Calibrati on T o Calibrate the Analyzer Receiver to Measu re A bsol u te P ower Y ou can use the power meter calibrati on as a referenc e to calibrate the analy zer receiver to accuratel y measure absol ute power .
6-40 Cali brat ing for Increased Measur ement Accuracy Cali br ating f or Noninsertabl e Devices Ca libr ating for No ni ns ert able D evic es A tes t device that c annot be c onnected directly into a tr ansmission test c onfiguration i s consider ed to be noninser t able .
6- 41 Calibrating f or Increased M easurement Accuracy Calibrating f or N oni nsert ab le De vices Adapter Rem oval Cal ibration (ES Analyz ers Only) Adapter r em oval calibr ation provid es the most c omplete and acc ur ate proc ed ure for measuring noninsertable dev ices.
6-42 Cali brat ing for Increased Measur ement Accuracy Cali br ating f or Noninsertabl e Devices P erform the 2-P ort Error Corrections 1. Check the firmware to see if y our revision s upports adapter r em oval ca libration by pre ssing: 2. Determine the delay of a dapter A3.
6- 43 Calibrating f or Increased M easurement Accuracy Calibrating f or N oni nsert ab le De vices NO TE Y ou must use t he floppy d isk to store t he following c a librations . Select the floppy dis k by pressi ng . 3. Connect adapter A3 (same sex and c onnector ty p e as the DUT) to adapter A2 on port 2 as s how n in Figu re 6-15 .
6-44 Cali brat ing for Increased Measur ement Accuracy Cali br ating f or Noninsertabl e Devices 6. P erform a ful l 2-port c a libration b etween ports 1 and 2 using c alibration s tandards appropriate for the c onnector type a t port 2 (the co nnec tor type f or adapter A2 ) .
6- 45 Calibrating f or Increased M easurement Accuracy Calibrating f or N oni nsert ab le De vices V erify the Results Since the effect of the adapter has been removed, i t is easy to v erify the accuracy of the techni q ue by simply measuring the ada p ter itsel f.
6-46 Cali brat ing for Increased Measur ement Accuracy Cali br ating f or Noninsertabl e Devices Modify the Cal Kit Thru Definition Wi th this method, it is onl y necessary to use a th r u adapter . The calibr ation kit thru defini tion is modified t o compensa te for the adapter and then sav ed as a user kit.
6- 47 Calibrating f or Increased M easurement Accuracy Minimi z ing Er r or W hen Using Adapte r s 9. Pe rform the des ired calibr a tion with this new user ki t.
6-48 Cali brat ing for Increased Measur ement Accuracy Making No n- Coaxial Measur em ents Making Non- C oaxial Me asu rements Non-coax i al, on- wafer measurement s present a unique set of challeng e.
6- 49 Calibrating f or Increased M easurement Accuracy Making Non - Coaxial Measure m ents If Y ou W ant to Design Y our Own Fixture Ideall y , a fixture shoul d provide a transparent c onnection between the tes t instru ment and the test device.
6-50 Cali brat ing for Increased Measur ement Accuracy Calibrati ng f or Non-Coaxial D evices (ES Analyzers O nly) Calibr ating for No n-Coaxi al Devic es (ES A na lyzers Only) The anal y zer has the capabilit y of making cali b rations u s ing the TRL*/LRM* met hod.
6- 51 Calibrating f or Increased M easurement Accuracy Calibrating f or Non-Coaxial De vices (ES Analyzers Onl y) 6. F or the purposes of th is example , change the na me of the sta ndard by pressi ng: and modi f ying the name to "LINE.
6-52 Cali brat ing for Increased Measur ement Accuracy Calibrati ng f or Non-Coaxial D evices (ES Analyzers O nly) P erform the TRL Calibration 1. P ress . 2. T o measure the "TRL THRU ," connec t the "zero l ength" tran s mission line b etween the two test p orts .
6- 53 Calibrating f or Increased M easurement Accuracy Calibrating f or Non-Coaxial De vices (ES Analyzers Onl y) NO TE Y ou can sa v e or st or e the measur em ent correc tion to use for later measurements . Refer t o Chapter 4 , “Printin g, Plotting, a nd Savi ng Measurement Results” f or procedures .
6-54 Cali brat ing for Increased Measur ement Accuracy LRM Erro r Co rr e cti on LRM Erro r C orre ction Create a User -Defined L RM Calibration K it In or d er to use the L RM technique , the c a libration s tandards c ha racteri s tics must b e entered i nto the anal yzer’s user d efined c a libration ki t.
6- 55 Calibrating f or Increased M easurement Accuracy LR M E rror Co rrect ion Assign the Standards to the V arious LRM C lasse s 8. T o assig n the calibrati on standards t o the various T RL calibr a tion cl asses, press: 9. Since you p r eviously d esignated sta nd ard #1 f or the REFLECT standard, press: 10.
6-56 Cali brat ing for Increased Measur ement Accuracy LRM Erro r Co rr e cti on P erform the LRM Calibration 1. Y ou must ha ve a LRM cali bration kit d efined and sa ved in the USER KIT , as shown i n "Modifying Calibration Kits" on pa ge 7-57 .
6- 57 Calibrating f or Increased M easurement Accuracy LR M E rror Co rrect ion NO TE Y ou should per form the is ol ation measur em ent when the hi ghest dynamic rang e is desire d. T o perform the b est isolati on measurements , you s hould reduce the system bandwidth or a ctivate t he averagi ng function.
6-58 Cali brat ing for Increased Measur ement Accuracy Cali brating U sing El ectroni c Calib r atio n (ECal) Calibr ating Usin g Electron ic Calibr ation (EC al) This sec tion descri bes Electronic Calibrati on (ECal). Use the f ollowing steps to per form the cali b ration.
6- 59 Calibrating f or Increased M easurement Accuracy Calibrat ing Using Elect r o nic C al ibr at ion (ECal) Connect the ECal Equipment 1. Connect the powe r supply to the PC interfa ce unit. Ref er to Fi gur e 6 -21 . Fi gure 6-21 ECal Setup 2. Connect the powe r supply to the ac s our ce.
6-60 Cali brat ing for Increased Measur ement Accuracy Cali brating U sing El ectroni c Calib r atio n (ECal) 5. If y ou need to cal ibrate with a second ECal module , connect one end of another DB25 cable t o the connecto r on the P C interface uni t label ed "DB25 Interf ace to ECal Module B".
6- 61 Calibrating f or Increased M easurement Accuracy Calibrat ing Using Elect r o nic C al ibr at ion (ECal) • ECal using isol ation aver aging During the isolati on m easurement p ortion of ECa l, you are a ctually measuring instr ument crosstalk.
6-62 Cali brat ing for Increased Measur ement Accuracy Cali brating U sing El ectroni c Calib r atio n (ECal) P erform the Calibration 1. P ress . When ECal i s fi rst sele cte d (or when you select m.
6- 63 Calibrating f or Increased M easurement Accuracy Calibrat ing Using Elect r o nic C al ibr at ion (ECal) Figure 6 -22 M anual T hru S etup 5. After you c onnect the manual thr u, press to complet e the manual thru por tion of the ECal.
6-64 Cali brat ing for Increased Measur ement Accuracy Cali brating U sing El ectroni c Calib r atio n (ECal) 7. After you connect the sec ond ECal module , press to continue the ECal. 8. Repeat st ep s 4 and 5 if you sel ec ted to ca librate usi ng the manual thru op tion.
6- 65 Calibrating f or Increased M easurement Accuracy Calibrat ing Using Elect r o nic C al ibr at ion (ECal) P erform the Confiden ce Check The confi d ence check i s a means of vi sually checking the quality of the ca l ibration.
6-66 Cali brat ing for Increased Measur ement Accuracy Cali brating U sing El ectroni c Calib r atio n (ECal) 5. Press unt il the cal ibration conf idence check tr ace that you w a nt to view is di spla yed . Pressing the softkey toggles between the five tr a ce-type displa y options.
6- 67 Calibrating f or Increased M easurement Accuracy Calibrat ing Using Elect r o nic C al ibr at ion (ECal) Investigating th e Calibra tion Results Using the ECal Service M enu CAUTI ON The confidence c heck described in t he p revi ous section disp lays the ECal data of a sing le state.
6-68 Cali brat ing for Increased Measur ement Accuracy Cali brating U sing El ectroni c Calib r atio n (ECal) NO TE W hen returning to the Conf idence Check m enu from the ECal Se r vice menu, pres s the softkey on the ECal Confidence Check menu.
6- 69 Calibrating f or Increased M easurement Accuracy Adapter Removal Using ECal ( ES Analyzers O nly) Ada pter Remov al Using EC al ( ES Analyz ers Only) A device under test (DUT) w hose connector s cannot be co nnected direct ly to a t es t configura tion is consi d ered to b e a noninsertable de vice .
6-70 Cali brat ing for Increased Measur ement Accuracy Adapter Remov al Using ECal (ES Analyzers Only) Figur e 6-2 6 Adap ters N eed ed The fol lowing requir ements must also b e met: • An ECal module f or performing a 2-por t error corr ec tion for e ach connector type must be avai la ble.
6- 71 Calibrating f or Increased M easurement Accuracy Adapter Removal Using ECal ( ES Analyzers O nly) P erform the 2-P ort Error Corrections 1. Connect ada pter A3 to a da pter A2 on port 2 as shown in Figur e 6-27 . Fi gure 6-27 Two-P ort Cal Set 1 2.
6-72 Cali brat ing for Increased Measur ement Accuracy Adapter Remov al Using ECal (ES Analyzers Only) Fi gu re 6-28 Two-P ort Cal Set 2 7. Connect the ECal module betwee n a dapter A3 and adapter A2. 8. P ress . 9. Press to p erform t he second 2-port error corr ec tion using the ECal mod ule.
6- 73 Calibrating f or Increased M easurement Accuracy Adapter Removal Using ECal ( ES Analyzers O nly) Determine the Electric al Delay This proced ure determines the el ectrical delay of a dapter A3 usi ng a short. 1. Refer to Figu re 6-29 while perf or ming the s teps in t his procedure .
6-74 Cali brat ing for Increased Measur ement Accuracy Adapter Remov al Using ECal (ES Analyzers Only) Remove the Adapter When the t wo sets of er ror cor r ection f iles have b een creat ed (now referred to as "cali bration sets "), the A3 ada pter ma y be removed.
6- 75 Calibrating f or Increased M easurement Accuracy Adapter Removal Using ECal ( ES Analyzers O nly) 10.Connect t he DUT to the netw ork analyzer as s hown in Figure 6- 30 to perfor m cali brat ed measurements .
6-76 Cali brat ing for Increased Measur ement Accuracy Adapter Remov al Using ECal (ES Analyzers Only).
7- 1 7 Oper ati ng Co ncepts.
7- 2 Operating Concept s Using This C hapter Using This C hapter This cha pter provides conceptual i nformation o n how speci f ic funct ions of the netw ork analyzer o p erate .
7- 3 Operati ng Concepts System Operation System Operati on Network analyzer s measure the r eflec ti on and t r ansmission cha racteristi c s of devices and networks .
7- 4 Operating Concept s System Operation The RF outp ut power i s leveled by an int ernal ALC (autom a tic l ev eling contr ol) c ircuit. T o achie ve frequency acc uracy and phase mea suring capa b ility , the analy zer is phase locked to a highly sta b le crystal os cillator .
7- 5 Operati ng Concepts Processing Proc e ssing The analyzer ’s receiver converts the R, A, and B input signals i nto useful me asurement informati on. This conv er sion occ ur s in two m a in steps: • The swept high frequency i nput signals are tra nslated to fixe d l ow frequency IF signals , using analog sampling or mixing tec hni ques .
7- 6 Operating Concept s Pr ocessi n g While onl y a s ingle flow p ath is s hown, two identical p aths are a vailable , corr esponding to channel 1 and c hannel 2. Eac h channel al so has an auxilia r y channel f or which the d ata is proce s sed along w i th the pr imary channel’ s data.
7- 7 Operati ng Concepts Processing Pre-Raw Data Arrays Th e se dat a a rray s store the re su l ts of all the pr ec eding data processing oper ations . (Up to this point, a ll process ing is perf ormed real-ti m e with the swe ep by the IF process or .
7- 8 Operating Concept s Pr ocessi n g Tran sform (Option 010 Only) This t ransform converts frequency do m a in inf or mation into the time do m a in when i t is activ a ted. The r esults r esemble time domain reflectometry (TDR) or impul se-response measurements .
7- 9 Operati ng Concepts Out put Power Output P owe r Understanding the P ow er Ranges The built - in synthes ized source c ontains a progr am mable step at tenuator that a llows you to directl y and accur a tely set p ow er lev el s in twel ve different power ranges .
7- 10 Operating Concept s Out put Power NO TE After measureme nt c a libra tion, you can c ha nge the pow er w ithi n a r a nge and still maintain near ly full a c curacy . In some cases b etter accuracy can be achiev ed by changi ng the power wit hin a range .
7- 11 Operati ng Concepts Sweep Time Swe ep Ti me The softkey se l ects sweep time as the act ive entry and s hows whether the automati c or manual mode is active . The fol lowing explains the diffe r ence between automatic a nd manual sweep t ime: • Ma nual swee p time.
7- 12 Operating Concept s Sweep Time In additio n to the these parameters , the actual cycle time of the analyzer is also dependent on the f ollowing meas urement parameters: • smoothing • l im it.
7- 13 Operati ng Concepts Sour ce Atten uator Sw i tc h Pr ot ection Sourc e At tenuator Switch Pr otection The programmable step attenuator o f the source can be s witched bet ween port 1 and port 2 when the test port power i s uncoupled, or between cha nnel 1 and cha nnel 2 when the channel pow er is uncouple d.
7- 14 Operating Concept s Channel Stim ulus Cou pling Cha nnel Sti mulus Coupl ing toggles the channe l coupling of stimulus v alues. With ( the preset c ondition), both c hannels have the sa m e stimulus val ues. (The ina ctive cha nnel takes on the stimulus v a lues of the active channel.
7- 15 Operati ng Concepts Sweep T ypes Swe ep Types The foll ow ing sweep types will f unc tion wit h the interpol ated error -cor rection fea tur e (describ ed in “ Interpolated Er ror Correcti on.
7- 16 Operating Concept s Sweep T ypes NO TE Earlier 8719, 8 720, and 8722 mo d els all ow ed a maximum of 1 632 points , but this v alue was reduced to 1601 to a dd the 4 channels in the 4 -parameter dis play feat u re. One l ist is common to both channels .
7- 17 Operati ng Concepts Sweep T ypes The frequenc y subsweeps , or seg m ents, can be define d in any of the follo w ing terms: • start/stop/number of points • start /stop/step • center/span/ number of points • center/s pan/step • CW frequency The subsweeps c a n overl a p, a nd do not ha ve to be entered in any pa r ticular or d er .
7- 18 Operating Concept s Sweep T ypes The fr equency subsweeps , or segm ents , can be d efined i n a ny of t he following terms: • start/sto p/number of points /power/IFBW • start/sto p/step/pow.
7- 19 Operati ng Concepts Sweep T ypes Sett ing Segm ent IF Band widt h T o enable th e func tion, you must f irst selec t in the edit s ubsweep menu. List IF b a ndwidth is of f by d efault and the a.
7- 20 Operating Concept s S-P ara meter s S-P a ra me t ers The key acc ess es the S- parameter menu whic h contains s oftkeys tha t can be used to s elect the para meters or inp uts that define the type of m easurement b eing perfor med.
7- 21 Operati ng Concepts S-Para me ters Fi gu re 7-3 S-P arameters of a Two-P ort D evic e S-parameter s are exactl y equivalent to these more common desc ription ter m s , requiri ng only that t he measurements be ta ken with all test devic e ports properl y terminated.
7- 22 Operating Concept s S-P ara meter s The S-P arameter Menu The S-p a rameter menu al lows you to d efine the input ports a nd test set direction f or S-para m eter measurement s. Th e a nalyzer a utom atically s witches the direction of the measurement a ccording t o the selec tions you made i n this menu.
7- 23 Operati ng Concepts S-Para me ters Fi gu re 7-4 Reflection Impedance and Admittance Conversions In a tra ns mission meas ur ement, the d ata can be c onv erted t o its equiv a lent serie s impedance or a dmittance us ing the model a nd equatio ns shown in Figure 7-5 .
7- 24 Operating Concept s Anal yz er Displa y Formats Analyzer Dis play F o rmats The key a c cesses the f ormat menu. This m enu allows you to select the appropri ate displa y format for the measured dat a . The anal y zer automati c ally c ha nges the units of measu r ement to co r respond with the displ ayed format.
7- 25 Operati ng Concepts Analyzer D i splay Formats Fi gu re 7-7 Phase F ormat Group Delay F ormat The sof tkey selec ts the g roup delay format, with marker v alues giv en in seconds. The bandpass filte r r esponse f ormatted as group del ay is shown in Fig ure 7-8 .
7- 26 Operating Concept s Anal yz er Displa y Formats Smith Chart F ormat The softke y displa y s a Smith ch art format. Ref er to Figur e 7-9 . Thi s is used i n reflecti on m easurements t o provide a rea dout of the data in terms o f impedance .
7- 27 Operati ng Concepts Analyzer D i splay Formats P olar F orma t Th e soft k e y disp lay s a pola r form at as show n in Fig ure 7- 10 . Eac h point on the polar fo rm at corres p onds to a p articular v alue of both m agnitude and phase .
7- 28 Operating Concept s Anal yz er Displa y Formats Figure 7-11 Li nea r Mag nitude Format SWR F ormat The sof tkey reformats a reflec tion measurement i nto its equi valent SWR (stan d ing wav e ratio) v alue. S ee Fig u re 7- 12 . SWR is equivalent to (1 + ρ )/(1 − ρ ), whe r e ρ is the reflec tion coeff icient.
7- 29 Operati ng Concepts Analyzer D i splay Formats Real F ormat The soft k ey displa ys only the r eal (resisti ve) porti on of the meas ur ed data on a Cartesi a n format. See Fig ure 7 -1 3 . This is simi lar to the linea r magnitude format, bu t can show both positive and negati ve values .
7- 30 Operating Concept s Anal yz er Displa y Formats Fi gure 7-14 Constant Group Delay Note, how ever , tha t the p hase cha r acteristi c typicall y consists of both linea r and higher order (deviations from linear) comp onents .
7- 31 Operati ng Concepts Analyzer D i splay Formats Fi gu re 7-16 Rate of Phase Change V ersus Fre q ue nc y When deviatio ns from li near phase are p resent, changing the frequency step ca n result i n different values fo r group dela y . Note that i n this case the computed sl ope varies a s the aperture ∆ f is incr eased .
7- 32 Operating Concept s Anal yz er Displa y Formats The def a ult gro up delay a perture i s the fr eq uency span di vided by the num b er of poi nts across the display . T o set the ape r ture to a different v alue, tur n on smoothing in the av er age menu, and v ary the smoothing aperture .
7- 33 Operati ng Concepts Electrical Delay Electrical Delay The softkey adjusts the electri cal dela y to balance the phase of the test dev ice. T hi s softkey m ust be us ed in conj unc tion wit h or (with c ut-off f r equency) i n order to i d entify whi ch type of transmission l ine the d elay is b eing added t o.
7- 34 Operating Concept s Noise Reduction T ec hniques Nois e Reductio n T echniq ues The key is used to a c cess thr ee d iff er ent noi se reduction tec hni ques: sweep-t o- sweep av er aging , displ ay smoothing , and var i able IF ba nd width. All of these can b e used simul ta neously .
7- 35 Operati ng Concepts Noise R ed uction T echniques Smoothing Smoothing ( similar to video filter ing) avera ges the formatt ed acti v e channel d a ta over a portion of the dis played tra ce.
7- 36 Operating Concept s Noise Reduction T ec hniques Another d ifference b etween sweep-to- sweep averag ing and variable IF bandwidth i s the sweep ti me. A veraging di s plays the first c omplete tra c e faster b ut takes severa l sweeps to reac h a fully av eraged trac e.
7- 37 Operati ng Concepts Measurement Calibr ation Measurement Calibr atio n Measurement calibrati on is an a ccura cy enhancement procedure that effecti ve ly removes the syst em errors tha t cause uncer tainty i n m easuring a t est device.
7- 38 Operating Concept s Measurement Calibr ation What Causes Measurement Errors? Network analysi s measurement errors ca n be separated into sy stematic , random, and drif t error s. Correct able systemati c er ror s are the repeatable errors that the system c an measure .
7- 39 Operati ng Concepts Measurement Calibr ation However , an actual coupler is no t per fec t, a s shown in Figure 7- 21 b. A smal l a mount of the incident signal appear s at the coupled output d ue to lea k age as wel l as reflec tion from t he termination in the coupled arm.
7- 40 Operating Concept s Measurement Calibr ation Load Match Load match error res ults from an imp erfect matc h at the outp ut of the t est device . It is caused b y impedance m ismatches bet ween the test d evice o utput port and p ort 2 of the measurement system.
7- 41 Operati ng Concepts Measurement Calibr ation Frequency Response (T rac king) This is the vector sum of all test setup variatio ns in which magnitude and phase change as a functi on of freque nc y .
7- 42 Operating Concept s Measurement Calibr ation T o c ha racterize the er rors , the reflec tion coef f icient is measured by f irst separ a ting the inc ident si gnal (I) f rom the reflec ted s ig nal ( R) , the n taking the ratio of the tw o values .
7- 43 Operati ng Concepts Measurement Calibr ation This re-ref lection ef fect and the resulta nt incident powe r variation a re caused b y the source match error , E SF as show n in Figure 7- 27 .
7- 44 Operating Concept s Measurement Calibr ation If the value of t hese three "E" errors and the measured test device resp onse were known for ea ch frequency , this e q uation could b e solved for S 11A to obtain the a ctual test d evice resp ons e.
7- 45 Operati ng Concepts Measurement Calibr ation Fi gu re 7-30 Measu r e d Effec t ive Directivity Next, a short ci rcuit te r mination whos e response i s known to a very hi gh degree i s used t o establish a nother conditi on as shown in F ig u re 7- 31 .
7- 46 Operating Concept s Measurement Calibr ation Fi gure 7-32 Open C ir cuit T e rmination This compl etes the c alibration pr oc edure for one port d evices . Device Measurement Now the unknown i s measured t o obtain a v a lue for the measured resp onse, S 11M , at ea ch frequency .
7- 47 Operati ng Concepts Measurement Calibr ation Two-P ort Error Model (ES Models Only) The error mo d el for m easurement of the transmissi on coeffic i ents (magnit ude and phase) of a two-p ort device i s derived i n a similar m a nner .
7- 48 Operating Concept s Measurement Calibr ation As in t he reflection mo del, source match can cause the incident s ig nal to vary as a f unction of t es t device S 11 A .
7- 49 Operati ng Concepts Measurement Calibr ation NO TE It is very i mportant tha t the exact ele ctrical len gth of the thr u be known. Most calib r ation ki ts assume a zero l ength thru. F or some connecti on types such a s Type-N , this impl ies one mal e and one f emale port.
7- 50 Operating Concept s Measurement Calibr ation The anal yzer’s tes t set can meas ure both the fo rward and rev erse ch aract eris tics of the test devic e without you ha ving to manua l ly remove and physically r everse the dev ice. A f ull two-po r t error mo d el illus trated in Figu re 7-3 8 .
7- 51 Operati ng Concepts Measurement Calibr ation Fi gu re 7-39 Full Two-P ort Error Model Equations How Effective Is Accuracy Enhancement? In additi on to the er rors removed by accuracy enhanc em ent, other s y stematic er rors exist due to li mitations of d ynamic accur a cy , tes t set switch repeatability , and te s t cable stabili ty .
7- 52 Operating Concept s Measurement Calibr ation Figu re 7-4 0 a shows a measurement i n log magnit ud e format w ith a response c alibration only . Fi gur e 7 -40 b shows th e improvement in the same measurement using an S11 one-por t c a li bra tion.
7- 53 Operati ng Concepts Measurement Calibr ation The response of a devic e in a lo g m agnitude for mat is shown in Fig ure 7-4 2 . Figu re 7-4 2 a shows the response using a response calibrati on and Fi gure 7-42 b the response usi ng a ful l two-port c a libration.
7- 54 Operating Concept s Cali bration R outines Ca libr ati o n Ro ut in es There are tw elve diffe r ent error te rms for a tw o-port measurement tha t can be c or rected by accur acy enhanc ement in the anal yzer .
7- 55 Operati ng Concepts Calib r atio n Routines Enh anc ed Ref lec tion Calibr ation The enhanced r eflection c a librat ion is activ a ted by s electing under the menu. The enhanced r eflection c a librat ion effecti v ely removes l oad match er r or from the enhanced res ponse calibr a tion perf or med on a bil ateral device .
7- 56 Operating Concept s Cali bration R outines E-CAL The E-Cal calibrat i on menu is acti vated by pr essing in the c alibratio n menu. The E-Cal (Elec tronic Ca libration) system determi nes systemic err ors of the analyzer throug h a one-time connec tion of a n E-Cal module to the network a na lyzer ports .
7- 57 Operati ng Concepts Modi fyi ng Calibrati on Ki ts M odi fying C alib ration K its Modifying ca libration ki ts is nec essary only i f unusual standa r ds (suc h as in TRL*) a re used or the very highest accuracy is required.
7- 58 Operating Concept s Modi fying Cali bration Kits Procedure The fol lowing steps a re used t o modify or def ine a use r kit: 1. Select the predefined ki t to be m odified. ( T his is not necessary f or defi ning a new calibration ki t.) 2. Define the standards: • Def ine which "type" of standard it is.
7- 59 Operati ng Concepts Modi fyi ng Calibrati on Ki ts • l eads to a menu for construct i ng a labe l for the user- modified cal kit. If a label is supplied , it will appear as one of the fi v e softkey c hoices in t he select c al kit menu.
7- 60 Operating Concept s Modi fying Cali bration Kits After a standard number i s entered, s electi on of the standa r d type wil l present o ne of five menus f or entering the electri cal character istics ( model coeffi cients) cor r esponding to that stand a rd type, s uch as .
7- 61 Operati ng Concepts Modi fyi ng Calibrati on Ki ts • def ines the s ta ndard type as a transmission l ine of speci fi ed leng th, f or cali brating transmis sion measurements . • de f ines the standard type to be a loa d , but with a n arbi tr ary impedance ( different f rom system Z0) .
7- 62 Operating Concept s Modi fying Cali bration Kits The fol lowing is a descriptio n of the s oftkeys l ocated within the specif y offset m enu: • all o ws you to spe c ify the o n e -way e le c trica l del ay fro m th e measurement (r eference) pl a ne to the standard, in sec onds (s).
7- 63 Operati ng Concepts Modi fyi ng Calibrati on Ki ts A class often c onsists of a si ngle standard, b ut may be composed of more than one sta ndard if band-l imited stand ards are us ed.
7- 64 Operating Concept s Modi fying Cali bration Kits NO TE It is of ten simpler to keep the number o f standards p er clas s to th e b are minimum need ed (often one) to a v oid confu s ion during c alibration. Each c lass can be given a user -definab le label as d escribed under label cl ass menus .
7- 65 Operati ng Concepts Modi fyi ng Calibrati on Ki ts • allows y ou to enter the sta ndard numbers f or a TRL line o r mat ch c alibr ati on. Label Class Menu The label c lass menus a re used t o define meaning f ul label s for t he calibration c lasses .
7- 66 Operating Concept s Modi fying Cali bration Kits Modifying and Saving a Calibration Kit from the Calibration Kit Selection Menu T o modify a c alibration kit from the cali b ration kit selection menu, pr ess : T o sav e the modified calibration ki t, press: or Ensure that is underlined b ef ore sav ing the modifi ed user kit.
7- 67 Operati ng Concepts TRL* /LRM* Cali bration (ES Models Onl y) TRL*/LRM* Calibration ( ES Models On ly) The network anal y zer has the capabilit y of making cali b rations us ing the " TRL " (thru-ref lec t- l ine) method.
7- 68 Operating Concept s TRL* /LRM* Cali bration ( ES Models Only) TRL T erminology Notice that the let ters TRL, LRL, L RM, etc. are often interchanged, depending on the stand a rds used.
7- 69 Operati ng Concepts TRL* /LRM* Cali bration (ES Models Onl y) Also notic e that the f o rwar d source m atch (E SF ) and rev erse lo a d ma tch (E LR ) are both represented by ε 11 , while the reverse source match ( E SR ) an d forward lo ad match (E LF ) ar e both repres ented by ε 22 .
7- 70 Operating Concept s TRL* /LRM* Cali bration ( ES Models Only) Fi gure 7-44 8-term TRL (or TRL*) Error Model an d General ized Coe fficients S our ce ma tch a nd l oad matc h A TRL cal ibrati on .
7- 71 Operati ng Concepts TRL* /LRM* Cali bration (ES Models Onl y) Improving Ra w Sourc e Match and Load Match for TRL*/LR M* Calibration A techn ique that c an be u s ed to i m prove the raw test port mismatc h is to add high q uality fixed attenuato rs .
7- 72 Operating Concept s TRL* /LRM* Cali bration ( ES Models Only) Transmi s sion mag nitude uncertaint y = E X + E T S 21 + E S S 11 S 21 + E L S 22 S 21 where: E D = ef fe ctiv e dir ec t iv ity E .
7- 73 Operati ng Concepts TRL* /LRM* Cali bration (ES Models Onl y) • Attenuati on of the thr u need not be know n. • If the thru is use d to set t he reference p lane, the inser tion phase or electri cal length must be well-known and specif ied.
7- 74 Operating Concept s TRL* /LRM* Cali bration ( ES Models Only) F abricating and defining calibration stand ard s for TRL/LRM When cal ibrating a net w ork analyzer , the ac tua l ca l ibration s tandards must have known physical characteristi cs.
7- 75 Operati ng Concepts TRL* /LRM* Cali bration (ES Models Onl y) where: f = frequency l = length of l ine v = v elocity = speed of l ight × velocity factor which can be reduced to the follo wi n g.
7- 76 Operating Concept s TRL* /LRM* Cali bration ( ES Models Only) The TRM cali bration tec hnique is related to TRL with the difference b eing that i t bases the charac teristic imp edance of the measurement on a matched Z O terminati on instead of a transmiss ion line f or the thi rd measurement stan d ard.
7- 77 Operati ng Concepts TRL* /LRM* Cali bration (ES Models Onl y) The location of the ref erence plane is determine d by the selec tion of and . By def a ult, the refer enc e pla ne i s set w ith the thru sta ndard whic h must have a known inserti on phase or elec trical leng th.
7- 78 Operating Concept s GPI B Op e ra t ion GPIB Operat i on This sec tion conta i ns infor ma tion on the following t op ics: • l ocal ke y • GPIB control ler modes • instrument a d dresses .
7- 79 Operati ng Concepts GPIB Ope ra t io n GPIB ST A TUS Indicato rs When the anal yzer is con nec ted to ot her instruments over GPIB , the G P IB STA TUS indicator s in the ins trument state function bloc k light up to d isplay the current s tatus of the analyze r .
7- 80 Operating Concept s GPI B Op e ra t ion Address Menu This menu c an be accessed b y pressing the softkey withi n the GPIB menu. In c om m unications through the General Purpos e Inter face Bus (GPIB) , each ins trument on the b us is identi fied by a G P IB address .
7- 81 Operati ng Concepts GPIB Ope ra t io n The GPIO M ode The GPIO mode tur ns the parallel port into a "general p urpose input/o utp ut" por t. In this m od e the por t can be c onnec ted to t est fixtur es, p ow er suppli es, and other peripheral equipment that might be us e d to i nter act with the ana ly zer during measurements .
7- 82 Operating Concept s Limit Line Oper ation Limit Line Operation This menu c an be accessed b y pressing withi n the system menu. Y ou can have limit lines d rawn on the display to represent upper an d lower limits or devic e spec i ficatio ns with which t o compa re the tes t device .
7- 83 Operati ng Concepts Limit Line Oper ation If limit l ines are on, the y are plotted with t he d ata on a plot. If limit testing i s on, the PAS S or FAIL message is plotted, and the failing por tions of the trace tha t are a different col or on the displ ay are also a differ ent color on the plot.
7- 84 Operating Concept s Know ing the I nstrument M odes Knowin g the Instru ment Mod e s There are thre e major instr ument modes of the analy zer : • network analyzer m ode • tuned rec eiver mo.
7- 85 Operati ng Concepts Know ing the I nstrument M odes Fi gu re 7-46 Typical T est Setup for T un ed Receiver Mode Tuned Re ceive r Mo de I n-De pth D es cript ion If you press , the analyz er receiver operates i ndependently of any signal s ource .
7- 86 Operating Concept s Know ing the I nstrument M odes.
8-1 8 Safet y an d Regu latory Infor mati on.
8-2 Saf ety and Regulatory I nf or mation Gene r al Info r mat ion General Inf ormation Maintenance Clean the cabinet, using a dry or d amp cloth only . W ARNI NG T o prevent electrical sh ock, d isc on nect the analyzer fr om m ains before cleanin g.
8- 3 Saf et y and Regulator y Inf orm ation G e ne r a l In for ma t io n T ab le 8-1 C ontact ing Ag ilent Online ass istance: www.agilent.com/f ind/assist Un i ted S tat es (tel) 1 800 452 48 44 Lat.
8-4 Saf ety and Regulatory I nf or mation Sa fety S ym bol s Sa fety Sym b o ls The fol lowing safety symbols are u s ed throughout this manual. F amiliari ze yourself wi th each of the symbol s and its meani ng before op erating thi s instrument . CA UTI ON Cauti on denotes a ha zard.
8- 5 Saf et y and Regulator y Inf orm ation Saf ety C onsi der ati ons Saf ety Cons idera tions NO TE T his instrume nt has been designe d and teste d in accordance w i th IEC Publication 1010, Safety Requirements for Electr onics Measuring Apparatus , and has b een supplied in a s afe conditi on.
8-6 Saf ety and Regulatory I nf or mation Safet y Consi der ati ons Servicing W ARNI NG No operator se rviceable parts inside. Refer servic ing to qualified perso nnel. T o pr even t electr ic al s ho ck, do no t r em ove cov e rs. W ARNI NG The se servicin g in stru c t ions a re for use by qualified person n el only .
8- 7 Saf et y and Regulator y Inf orm ation Saf ety C onsi der ati ons General W A RNING T o p revent electrical shock, d isconnect the analyzer from mains before cl eaning. Use a d ry c loth or one slight ly dampened with wat er to clean the exte rn al c ase part s.
8-8 Saf ety and Regulatory I nf or mation Safet y Consi der ati ons Compliance with German FTZ Emissions Requirements This ne twork analyzer compl ies with German F T Z 526/527 Radia ted Emissions a nd Conducted Em ission req uirements .
8- 9 Saf et y and Regulator y Inf orm ation Decl arat i on of Conf ormity Declarat i on of Confo rmity.
8-10 Saf ety and Regulatory I nf or mation Decl arat i on of Conf ormity.
Index In dex - 1 Numerics 2-por t error co rrecti o ns , pe rfor ming , 6-42 , 6- 71 4 Par am Disp lays soft ke y , 1- 18 A aborting a print or pl ot proc ess , 4-33 absolut e ripple t est value , 1-8.
In dex - 2 Index TRL*/LRM * two-por t cal ib ra tio n , 7- 55 cal ib rat ion s tan d ard s , 6- 5 cal ib ra tio n t ech n iqu es improp er , 5- 4 cal i b ra t io n , me a su r em en t , 7-37 cal i b r.
Index In dex - 3 tit lin g , 1- 11 ad ju s t in g co l o rs of th e di spl a y , 1-22 blanking the dis play , 1-21 d a ta tr a ce savin g to di splay mem ory , 1-19 four -channel d isplay 4 P aram Di .
In dex - 4 Index flat limit lines , 1- 73 f loppy dis k, what you can sa ve , 4- 37 form feed se quen ce , 4-26 sending to the printer , 4-2 6 for ma t , 7-8 form at a rray s , 7- 8 for ma t m a rk er.
Index In dex - 5 improving raw sourc e match and load matc h for TRL*/ LRM* cal ibration , 7-7 1 in crea se s weep sp eed using fast 2-port c alib ration , 5-13 increas ing dynamic rang e , 5- 15 incr.
In dex - 6 Index li ne se gmen ts, ed itin g , 1- 78 delet ing line s egments , 1- 78 li ne type s, sel ecting , 4- 17 li near freq uency sweep , 7-1 5 linear magnitude format , 7-27 li near phas e, d.
Index In dex - 7 insert ion pha se response , 1-7 , 1-8 separ ate trans missi o n paths throug h the te s t dev ic e using l ow pass impul s e mo de , 3-20 small signal tr ansient res pon se usi ng lo.
In dex - 8 Index stor ing the HPGL initia lizat ion seq uenc e , 4-25 P pag e quad rants , plotti ng mea sur ements in , 4-30 par am ete rs lowe r st op band , 1-69 me a sur em en t , 1-4 , 1- 68 , 6-.
Index In dex - 9 scale and off set , 7- 8 smoothing , 7-8 sweep- to-swe ep a veragin g , 7- 6 tra ce ma th op eration , 7- 7 tra nsform , 7-8 vect or error -corr ection , 7- 7 pr ocess ing , d ata , 7.
In dex - 10 Index pl a c es wh e r e you ca n sav e , 4-36 what you ca n sa v e t o a com p ute r , 4-37 what you ca n sa v e t o a f loppy disk , 4- 3 7 what you can sa v e to the an alyzer’ s inte.
Index In dex - 11 swept edit lis t menu , 7-17 swept ed it subs weep me nu , 7-17 swept list mode cali brate , 1- 70 charact erist ics of th e filt er , 1- 68 devic e unde r test, conn ect , 1-6 7 me .
In dex - 12 Index creat ing a user -def ine d TRL cal ib rat ion k it , 6- 50 TRL optio ns , 7-76 TRL terminolo gy , 7- 68 TRL* er ror mod el , 7-6 8 TRL*/LRM* cali br at ion , 7-6 7 fabri cating an d.
Un point important après l'achat de l'appareil (ou même avant l'achat) est de lire le manuel d'utilisation. Nous devons le faire pour quelques raisons simples:
Si vous n'avez pas encore acheté Agilent Technologies MODEL 8719ET c'est un bon moment pour vous familiariser avec les données de base sur le produit. Consulter d'abord les pages initiales du manuel d'utilisation, que vous trouverez ci-dessus. Vous devriez y trouver les données techniques les plus importants du Agilent Technologies MODEL 8719ET - de cette manière, vous pouvez vérifier si l'équipement répond à vos besoins. Explorant les pages suivantes du manuel d'utilisation Agilent Technologies MODEL 8719ET, vous apprendrez toutes les caractéristiques du produit et des informations sur son fonctionnement. Les informations sur le Agilent Technologies MODEL 8719ET va certainement vous aider à prendre une décision concernant l'achat.
Dans une situation où vous avez déjà le Agilent Technologies MODEL 8719ET, mais vous avez pas encore lu le manuel d'utilisation, vous devez le faire pour les raisons décrites ci-dessus,. Vous saurez alors si vous avez correctement utilisé les fonctions disponibles, et si vous avez commis des erreurs qui peuvent réduire la durée de vie du Agilent Technologies MODEL 8719ET.
Cependant, l'un des rôles les plus importants pour l'utilisateur joués par les manuels d'utilisateur est d'aider à résoudre les problèmes concernant le Agilent Technologies MODEL 8719ET. Presque toujours, vous y trouverez Troubleshooting, soit les pannes et les défaillances les plus fréquentes de l'apparei Agilent Technologies MODEL 8719ET ainsi que les instructions sur la façon de les résoudre. Même si vous ne parvenez pas à résoudre le problème, le manuel d‘utilisation va vous montrer le chemin d'une nouvelle procédure – le contact avec le centre de service à la clientèle ou le service le plus proche.
