Manuel d'utilisation / d'entretien du produit 683XXB du fabricant Anritsu
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SERIES 682XXB/683XXB SYNTHESIZED SIGNAL GENERA TORS MAINTENANCE MANUAL P/N: 10370-10290 REVISION: H PRINTED: AUGUST 2003 COPYRIGHT 2003 ANRITSU CO. 490 JARVIS DRIVE MORGAN HILL, CA 95037-2809.
W ARRANTY The ANRITSU product(s) listed on the title page is (are) warranted against defects in materials and workmanship for one year from the date of shipment. ANRITSU’ s obligation covers repairing or replacing products which prove to be defective during the warranty period.
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T able Of Contents Chapter 1 - General Information 1-1 SCOPE OF MANUAL ................. 1-3 1-2 INTRODUCTION ................... 1-3 1-3 DESCRIPTION .................... 1-3 1-4 IDENTIFICA TION NUMBER ............ 1-5 1-5 ELECTRONIC MANUAL ..........
ALC/AM/Pulse Modulation ............ 2-8 RF Deck ..................... 2-8 Power Supply .................. 2-8 Inputs/Outputs ................. 2-8 Motherboard/Interconnections .......... 2-9 2-3 FREQUENCY SYNTHESIS ............. 2-9 Phase-Lock Loops .
3-7 FREQUENCY SYNTHESIS TESTS ........ 3-1 1 T est Setup ................... 3-1 1 Coarse Loop/YIG Loop T est Procedure ...... 3-12 Fine Loop T est Procedure ............ 3-13 3-8 SPURIOUS SIGNALS TEST : RF OUTPUT SIGNALS £ 2 GHz ( £ 2.2 GHz for 68XX5B MODELS) .
3-16 PULSE MODULA TION TEST : RF ON/OFF RA TIO 3-45 T est Setup ................... 3-45 T est Procedure ................. 3-45 3-17 PHASE MODULA TION TESTS ........... 3-48 T est Setup ................... 3-48 F M Input Sensitivity Procedure ........
4-12 AM CALIBRA TION ................. 4-33 Equipment Setup ................ 4-33 AM Calibration Procedure ........... 4-34 4-13 FM CALIBRA TION ................. 4-37 Equipment Setup ................ 4-37 FM Calibration Procedure ........... 4-38 4-14 PHASE MODULA TION ( F M) CALIBRA TION .
6-5 REMOVING AND REPLACING THE A7 PCB ... 6-10 Preliminary .................. 6-10 Procedure ................... 6-10 6-6 REMOVING AND REPLACING THE A8, A9, A10, A1 1, OR A12 PCB .................. 6-10 Preliminary .................. 6-10 Procedure ..
T able of Contents 1-1 SCOPE OF MANUAL ................. 1-3 1-2 INTRODUCTION ................... 1-3 1-3 DESCRIPTION .................... 1-3 1-4 IDENTIFICA TION NUMBER ............ 1-5 1-5 ELECTRONIC MANUAL ...............1 - 6 1-6 RELA TED MANUALS .
Figure 1-1. T ypical Series 682XXB/683XXB Synthesized Signal Generator (Model 68369B Shown).
Chapter 1 General Information 1-1 SCOPE OF MANUAL This manual provides service information for all models of the Series 682XXB/683XXB Synthesized Signal Generators.
1-4 682XXB/683XXB MM GENERAL 682XXB/683XXB INFORMATION MODELS 68XXXB Model Frequency (GHz) Output Power Output Power w/Step Attenuator 68X37B 2.0 – 20.0 GHz +13.0 dBm +1 1.0 dBm 68X45B 0.5 – 20.0 GHz +13.0 dBm +1 1.0 dBm 68X47B 0.01 – 20.0 GHz +13.
1-4 IDENTIFICA TION NUMBER All ANRITSU instruments are assigned a unique six-digit ID number , such as “403002.” The ID number is imprinted on a decal that is af - fixed to the rear panel of the unit. Special-order instrument configura - tions also have an additional special serial number tag attached to the rear panel of the unit.
When ordering parts or corresponding with ANRITSU Customer Serv - ice, please use the correct serial number with reference to the specific instrument’ s model number (i.e., Model 68347B Synthesized Signal Generator , Serial No. 403002). 1-5 ELECTRONIC MANUAL This manual is available on CD ROM as an Adobe Acrobat Portable Document Format ( * .
1-7 OPTIONS The following instrument options are available. Option 1, Rack Mounting . Rack mount kit containing a set of track slides (90 ° tilt capability), mounting ears, and front panel handles for mounting the instrument in a standard 19-inch equipment rack.
Option 17A, No Front Panel . Deletes the front panel for use in remote control applications where a front panel display or key - board control are not needed. Option 18, mmW ave Module Bias Output. Provides bias out - put for 54000-xWRxx Millimeter W ave Source Modules.
1-9 PREVENTIVE MAINTENANCE The 682XXB/683XXB must always receive adequate ventilation. A blocked fan filter can cause the instrument to overheat and shut down. Check and clean the rear panel fan honeycomb filter periodically . Clean the fan honeycomb filter more frequently in dusty environ - ments.
1-10 682XXB/683XXB MM GENERAL STATIC-SENSITIVE COMPONENT INFORMATION HANDLING PRECAUTIONS 1. Do not touch exposed contacts on any static sensitive component.
1-1 1 ST ARTUP CONFIGURA TIONS The 682XXB/683XXB comes from the factory with a jumper across pins 2 and 3 of front panel connector J12 (Figure 1-4). In this configu - ration, connecting the instrument to line power automatically places it in operate mode (front panel OPERA TE LED on).
1-12 RECOMMENDED TEST EQUIPMENT T able 1-2 provides a list of recommended test equipment needed for the performance verification, calibration, and troubleshooting proce - dures presented in this manual.
682XXB/683XXB MM 1-13 INSTRUMENT CRITICAL SPECIFICA TION RECOMMENDED MANUF ACTURER/MODEL USAGE (1) Modulation Analyzer Frequency Input: 10 MHz (or the IF of the Spectrum Analyzer) AM Depth: 0% to 90% .
1-13 EXCHANGE ASSEMBL Y PROGRAM ANRITSU maintains an exchange assembly program for selected 682XXB/683XXB subassemblies and RF components. If a malfunction occurs in one of these subassemblies, the defective unit can be ex- changed.
682XXB/683XXB MM 1-15 SUBASSEMBL Y OR P ART NAME ANRITSU P ART NUMBER Printed Circuit Board Assemblies Front Panel Assy 683XXB ND40832 Front Panel Assy 682XXB ND40833 A3 Reference Loop PCB Assy D37436.
1-16 682XXB/683XXB MM GENERAL INFORMATION PARTS LIST SUBASSEMBL Y OR P ART NAME ANRITSU P ART NUMBER RF Components YIG-T uned Oscillator , 2 to 20 GHz C27327 Down Converter D27330 Pulsed Digital Down Converter D27370 Switched Doubler Module, 20 to 26.
682XXB/683XXB MM 1-17 GENERAL INFORMATION PARTS LIST SUBASSEMBL Y OR P ART NAME ANRITSU P ART NUMBER Fan Assembly A40513 Fan Mount 790-425 Fan Membrane (Honey Comb Filter) C37137 Fan Grill 790-426 Fasteners (for Fan Grill) 790-433 Fuse, 5A, 3AG Slow Blow (1 10 V ac) 631-33 Fuse, 2.
1-18 682XXB/683XXB MM UNITED STATES ANRITSU COMPANY 490 Jarvis Drive Morgan Hill, CA 95037-2809 Telephone: (408) 776-8300 1-800-ANRITSU FAX: 408-776-1744 FRANCE ANRITSU S.A 9 Avenue du Quebec Zone de Courtaboeuf 91951 Les Ulis Cedex Telephone: 016-09-21-550 FAX: 016-44-61-065 JAPAN ANRITSU CUSTOMER SERVICE LTD.
T able of Contents 2-1 INTRODUCTION ................... 2-3 2-2 682XXB/683XXB MAJOR SUBSYSTEMS ...... 2-3 Digital Control ..................2 - 3 Front Panel ...................2 - 4 Frequency Synthesis ...............2 - 4 Analog Instruction ........
0.01 to 2 GHz Down Converter ......... 2-24 0.5 to 2.2 GHz Digital Down Converter ..... 2-25 Switched Doubler Module ............ 2-26 Source Quadrupler Module ........... 2-29 Power Level Detection/ALC Loop ........ 2-30 Step Attenuator .............
Chapter 2 Functional Description 2-1 INTRODUCTION This chapter provides brief functional descriptions of the major sub - systems that are contained in each model of the Series 682XXB/ 683XXB Synthesized Signal Generators.
The CPU is indirectly linked via the A16 CPU Inter - face PCB to the A3 Reference Loop PCB, the A4 Coarse Loop PCB, the A5 Fine Loop PCB, and the A6 Pulse Generator PCB. The A16 PCB contains cir - cuitry to perform parallel-to-serial and serial-to- parallel data conversion.
used to fine tune and phase lock the YIG-tuned oscillator . The A1 1 PCB also contains circuitry for frequency modulation of the YIG-tuned os - cillator RF output. The CPU sends control data to the A3 Reference Loop PCB, the A4 Coarse Loop PCB, and the A5 Fine Loop PCB via the A16 PCB as serial data words.
A21-1 BNC / AUX I/0 CONNECTOR PCB AM IN EXT ALC IN DWELL IN AM OUT V/GHz OUT FM OUT SEQ SYNC OUT SERIAL I/O 10 MHz REF IN From RF Deck (Option 9) From A3 Reference Loop To A3 Reference Loop RF OUTPUT .
A14 SDM, SQM Driver A9 PIN Control 10 MHz HI-STAB XTAL OSC (Option) 10 MHz REF OUT Real Panel BNC Serial Data 10 MHz REF IN Rear Panel BNC 0.01 - 2 GHz RF Output 0.
ALC/AM/Pulse Modulation This circuit subsystem consists of the A6 Pulse Gen - erator PCB, the A9 PIN Control PCB, the A10 ALC PCB, and the A14 SDM, SQM Driver PCB. It pro - vides the following: Level control of the RF output power . AM and pulse modulation of the RF output.
inputs are coupled directly via coaxial cables to their destination PCBs—the FM input to A1 1 FM PCB and the Pulse/T rigger input to the A6 Pulse Generator PCB.
signal that (depending on polarity) causes the VCO frequency to increase or decrease to reduce any phase difference. When the two inputs match, the loop is said to be locked . The variable input from the VCO then equals the reference input in phase, fre - quency , accuracy , and stability .
26.84 MHz VCXO Digital Synthesizer Frequency Synthesizer 206 - 391 MHz VCO Fine Loop Oscilator Phase/ Frequency Detector 100 kHz Phase Error Phase Error Phase/ Frequency Detector 9 - 10 MHz Phase Error 10 MHz A5 Fine Loop 100 kHz 9 - 10 MHz 215 - 400 MHz 21.
output signal sample with the adjacent coarse-loop harmonic produces a low frequency difference signal that is the YIG IF signal (21.5 to 40 MHz). The 682XXB/683XXB CPU programs the coarse-loop oscillator ’ s output frequency so that one of its har - monics will be within 21.
requiring even greater stability , the 100 MHz refer - ence oscillator can be phase locked to an optional 10 MHz reference (internal or external). RF Outputs 0.01 to 65 GHz Refer to the RF Deck block diagram shown in Fig - ure 2-1 (page 2-7) for the following description.
Frequency Modulation Frequency modulation (FM) of the YIG-tuned oscil - lator RF output is achieved by summing an external or internal modulating signal into the FM control path of the YIG loop.
Step Sweep Mode Step (digital) frequency sweeps of the YIG-tuned os - cillator RF output consist of a series of discrete, syn - thesized steps between a start and stop frequency .
NOTE The instrument uses two internal level de - tection circuits. For frequencies <2 GHz ( £ 2.2 GHz for 682X5B/683X5B models), the level detector is part of the Down Con - verter . The signal from this detector is routed to the A10 ALC PCB as the Detector 0 input.
P/O RF Deck Detector 0 Sample/Hold Detector 1 ALC Control Modulator Control Internal AM (From A8 PCB) D0 - D15 L_SEL3 A01 - A03 From CPU Pulse Level Amp Serial Data (From A16 PCB) Detector 1 2 - 20 GH.
Power Sweep In this mode, the CPU has the ALC step the RF out - put through a range of levels specified by the user . This feature can be used in conjunction with the sweep mode to produce a set of identical frequency sweeps, each with a different RF power output level.
struments to the internally generated pulse; the video pulse is a TTL level copy of the RF output pulse; and the sample/hold signal synchronizes the ALC loop to the ON portion of the pulse modulating waveform.
RF Deck Con - figurations All 682XXB/683XXB RF deck assemblies contain a 2 to 20 GHz YIG-tuned oscillator , a switched filter as - sembly , and a directional coupler . Beyond that, the configuration of the RF deck assembly varies accord - ing to the particular instrument model.
FM MAIN BIAS Modulator Control Switch Control >+17 dBm 500 MHz Down Converter Assy. D27330 8.4-20 GHz 2-8.4 GHz >+4dBm 0.01 - 40 GHz 110 dB Step Attenuator (Option) Directional Coupler Control 3.3 GHz LPF 5.5 GHz LPF 8.4 GHz LPF 13.5 GHz LPF Level Control 6.
FM MA I N BI AS Mo d u l a t o r Co n t r o l Sw i t c h Co n t r o l >+ 17 dB m 500 M H z Do wn Co n v e r t e r A s s y . D 27330 8. 4- 20 G H z 2- 8. 4 G H z >+4d B m 3. 3 G H z LP F 5. 5 G H z LP F 8. 4 G H z LP F 1 3 .5 G H z L P F Lev el Co n t r o l 6 .
When the 683XXB is generating broad-band analog frequency sweeps (>100 MHz wide), the main tun - ing coil current tunes the oscillator through the sweep frequency range. Phase locking to fine adjust the oscillator ’ s output frequency is only done at the bottom and top of the sweep ramp and on both sides of each band switch point.
coupler in the switched filter path of high power switched filter assemblies provides the RF signal for the source quadrupler module (refer to Figure 2-5). Whenever an instrument is generating RF signals of >40 GHz, a RF signal is coupled out via J4 to the source quadrupler module.
amplified, and coupled out for use in internal level - ing. The detected RF sample is routed to the A10 ALC PCB. The 0.01 to 2 GHz RF output from the down con - verter goes to input connector J1 of the switched fil - ter assembly . There, the 0.01 to 2 GHz RF signal is multiplexed into the switched filter ’ s output path.
ters. PIN switch drive current is generated by inter - nal drivers that are controlled by signals received from the A12 Analog Instruction PCB. The switched low-pass filters provide rejection of unwanted har - monics. The 0.5 to 2.2 GHz RF signal has four filter - ing paths—700 MHz, 1000 MHz, 1400 MHz, and 2200 MHz.
FM MAIN BIAS Modulator Control Switch Control >+17 dBm 8.4-20 GHz 2-8.4 GHz >+4dBm 0.5 - 40 GHz 110 dB Step Attenuator (Option) Directional Coupler Control 3.3 GHz LPF 5.5 GHz LPF 8.4 GHz LPF 13.5 GHz LPF J5 J3 J1 Sampler (-20 dBm to -27dBm) J6 J2 Level Control RF Output 2-20 GHz YIG Oscillator Switch Control Bias 20 - 40 GHz >+8.
FM MA I N BI AS Mo d u l a t o r Co n t r o l Sw i t c h Co n t r o l >+ 17 dB m Pu l s e 8. 4- 20 G H z 2- 8. 4 G H z >+4d B m 3. 3 G H z LP F 5.
RF signal is amplified, then doubled in frequency . From the doubler , the 20 to 40 GHz RF signal is routed by PIN switches to the bandpass filters. There are three bandpass filter paths to provide good harmonic performance. The frequency ranges of the three paths are 20 to 25 GHz, 25 to 32 GHz, and 32 to 40 GHz.
60 GHz RF signal goes via a band-pass filter to the output connector of the SQM. From the SQM, the 40 to 60 GHz RF output signal goes to input connector J1 of the forward coupler , P/N C27184. The other input to the forward coupler at connector J2 is the 0.
(for 682X5B/683X5B models) to adjust the RF out - put power level. Step Attenuator The optional step attenuator provides up to 1 10 dB (90 dB for 50 GHz and 60 GHz models) attenuation of the RF output in 10 dB steps. The step attenuator drive current is supplied by the A9 PIN Control PCB.
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T able of Contents 3-1 INTRODUCTION ................... 3-3 3-2 RECOMMENDED TEST EQUIPMENT .......3 - 3 3-3 TEST RECORDS ...................3 - 3 3-4 CONNECTOR AND KEY LABEL NOT A TION . . . 3-3 3-5 682XXB/683XXB POWER LEVELS .........3 - 6 3-6 INTERNAL TIME BASE AGING RA TE TEST .
3-1 1 POWER LEVEL TESTS ............... 3-26 T est Setup ................... 3-26 Power Level Accuracy T est Procedure ...... 3-27 Power Level Flatness T est Procedure ...... 3-27 3-12 AMPLITUDE MODULA TION TEST ........ 3-30 T est Setup .............
Chapter 3 Performance V erification 3-1 INTRODUCTION This chapter contains tests that can be used to verify the performance of the Series 682XXB/683XXB Synthesized Signal Generators to speci - fications. These tests support all instrument models having any ver - sion of firmware.
3-4 682XXB/683XXB MM INSTRUMENT CRITCAL SPECIFICA TION RECOMMENDED MANUF ACTURER/MODEL TEST NUMBER Spectrum Analyzer , with External Mixers and Diplexer Assy Frequency Resolution: 0.01 to 65 GHz Resolution Bandwidth: 10 Hz T ektronix, Model 2794, with External Mixers: WM780K (18 to 26.
682XXB/683XXB MM 3-5 INSTRUMENT CRITCAL SPECIFICA TION RECOMMENDED MANUF ACTURER/MODEL TEST NUMBER Adapter WR15 to V (male) Adapts the MP716A4 Power Sensor to the 682XXB/683XXB RF OUTPUT connector (&g.
3-5 682XXB/683XXB POWER LEVELS T able 3-2 is a listing of the Series 682XXB and 683XXB Synthesized Signal Generator models and their maximum leveled ouput power lev - els. Certain test procedures will refer you to this table for the maxi - mum leveled output power level setting of the instrument model being tested.
682XXB/683XXB MM 3-7 PERFORMANCE 682XXB/683XXB VERIFICATION POWER LEVELS 68XXXB Model Frequency (GHz) Max Leveled Output Power Max Leveled Output Power w/Step Attenuator 68X95B 0.5 – 2.2 GHz 2.2 – 20.0 GHz 20.0 – 40.0 GHz 40.0 – 50.0 GHz 50.0 – 65.
3-6 INTERNAL TIME BASE AGING RA TE TEST (Optional) The following test can be used to verify that the 682XXB/683XXB 10 MHz time base is within its aging specification. The instrument de - rives its frequency accuracy from an internal 100 MHz crystal oscilla - tor standard.
T est Procedure The frequency error is measured at the start and finish of the test time period of 24 hours. The aging rate is the difference between the two error read - ings. 1. Set up the Frequency Reference as follows: a. Press the ESC key until the MAIN MENU is displayed.
4. Record the frequency error value, displayed on the Frequency Reference , on the T est Record. 5. W ait for 24 hours , then record the current fre - quency error value on the T est Record. 6. The aging rate is the difference between the two frequency error values.
3-7 FREQUENCY SYNTHESIS TESTS The following tests can be used to verify correct operation of the fre - quency synthesis circuits. Frequency synthesis testing is divided into two parts—coarse loop/YIG loop tests and fine loop tests. T est Setup Connect the equipment, shown in Figure 3-2, as fol- lows: 1.
Coarse Loop/ YIG Loop T est Procedure The following procedure tests both the coarse loop and YIG loop by stepping the signal generator through its full frequency range in 1 GHz steps and measuring the RF output at each step. 1. Set up the 682XXB/683XXB as follows: a.
Fine Loop T est Procedure The following procedure tests the fine loop by step - ping the instrument through ten 1 kHz steps (ten 100 Hz steps for instruments with Option 1 1) and measuring the RF output at each step. 1. Set up the 682XXB/683XXB as follows: a.
3-8 SPURIOUS SIGNALS TEST : RF OUTPUT SIGNALS £ 2 GHz ( £ 2.2 GHz for 68XX5B MODELS) The following test can be used to verify that the signal generator meets its spurious signals specifications for RF output signals from 0.01 to 2 GHz (0.5 to 2.2 GHz for 682X5B/683X5B Models).
2. Set up the 682XXB/683XXB as follows: a. Reset the instrument by pressing SYSTEM , then Reset . Upon reset the CW Menu is dis - played. b. Press Edit L1 to open the current power level parameter for editing. c. Set L1 to the lesser of +10 dBm or the maxi - mum leveled power level for the instrument being tested (refer to T able 3-2, page 3-6).
presence by entering their levels on the T est Re - cord. 9. Set F1 to 1.6 GHz. Measure the worst case non- harmonic signal for the 1.6 GHz carrier and rec - ord its presence by entering its level on the T est Record. 10. Change the Spectrum Analyzer setup as follows: a.
0.5 - 2.2 GHz T est Procedure The following procedure lets you measure the 0.5 to 2.2 GHz RF output harmonic levels to verify that they meet specifications. 1. Set up the 682X5B/683X5B as follows: a. Reset the instrument by pressing SYSTEM , then Reset .
3-9 HARMONIC TEST : RF OUTPUT SIGNALS FROM 2 TO 20 GHz The following test can be used to verify that the 682XXB/683XXB meets its harmonic specifications for RF output signals from 2 to 20 GHz (2.2 to 20 GHz for 68XX5B Models). T est record entries are supplied for harmonics up to a frequency limit of 40 GHz.
T est Procedure (2 to 10 GHz) The following procedure lets you measure the 2 to 10 GHz (2.2 to 10 GHz for 68XX5Bs) RF output har - monic levels to verify that they meet specifications. 1. Set up the 682XXB/683XXB as follows: a. Reset the instrument by pressing SYSTEM , then Reset .
T est Procedure (1 1 to 20 GHz) The following procedure lets you measure the 1 1 to 20 GHz RF output harmonic levels to verify that they meet specifications.
slightly to accomplish this; however , do not exceed –-20 dBm output power . 4. Remove Connection A and connect the 682XXB/ 683XXB RF OUTPUT to the waveguide mixer in - put of the Spectrum Analyzer as shown in Con - nection B. 5. On the 682XXB/683XXB, remove 30 dB of at - tenuation from the RF output.
3-10 SINGLE SIDEBAND PHASE NOISE TEST The following test can be used to verify that the signal generator meets its single sideband phase noise specifications. For this test, a second 682XXB/683XXB is required. This additional instrument acts as a local oscillator (LO).
T est Procedure The following procedure lets you measure the RF output single sideband phase noise levels to verify that they meet specifications. NOTE The following technique is a measurement of phase noise and AM noise.
NOTE If the 682XXB/683XXB LO output is less than 10 dBm, the Mixer ’ s local oscillator port will not be saturated and the resulting measurements may be in error . 3. Set up the Spectrum Analyzer as follows: a. Center Frequency: 1 MHz b. Frequency Span: 300 Hz c.
9. On the Spectrum Analyzer: a. Deselect NOISE L VL. b. Set Frequency Span to 300 kHz. c. Adjust the Marker for a 100 kHz offset. d. Select NOISE L VL. 10. Measure the phase noise level 100 kHz offset from the carrier frequency . Record the level on the T est Record.
3-1 1 POWER LEVEL ACCURACY AND FLA TNESS TESTS The following tests can be used to verify that the 682XXB/683XXB meets its power level specifications. Power level verification testing is divided into two parts—power level accuracy tests and power level flatness tests.
Power Level Accuracy T est Procedure Power level accuracy is tested by stepping the out - put power level down in 1 dB increments from its maximum rated power level and measuring the out - put power level at each step. 1. Set up the 682XXB/683XXB as follows: a.
c. W ith the Step Sweep Menu displayed, press the main menu key FREQUENCY CONTROL The Sweep Frequency Control Menu is then displayed. d. Press Full to select a full range frequency sweep. e. Press Edit L1 to open the current power level parameter for editing.
3. Set up the 683XXB as follows for an analog sweep power level flatness test: a. Reset the instrument by pressing SYSTEM , then Reset . The CW Menu is displayed. b. Press Analog to place the 683XXB in the ana - log sweep frequency mode and display the Analog Sweep Menu.
3-12 AMPLITUDE MODULA TION TEST This procedure verifies the operation of the 682XXB/683XXB ampli - tude modulation input sensitivity circuit. The RF OUTPUT of the 682XXB/683XXB is monitored on a Spectrum Analyzer display . The (modulated) IF Output of the Spectrum Ana - lyzer is monitored with a Modulation Analyzer .
AM Input Sensitivity Procedure The following procedure lets you measure the abso - lute peak AM values for a 50% AM signal and calcu - late the actual modulation value. 1. Set up the 682XXB/683XXB as follows: a. Reset the instrument by pressing SYSTEM , then Reset .
8. Compute the actual AM input sensitivity with the following formula: % |( ) | |( – ) | |( ) | |( – ) | AM AM PK AM PK AM PK AM PK =´ ++ ++ - 100 200 é ë ê ù û ú 9. The calculated result should be between 45% and 55% AM. Record this result in the T est Record.
3-13 FREQUENCY MODULA TION TESTS This procedure verifies the operation of the 682XXB/683XXB fre - quency modulation input sensitivity circuitry . The RF OUTPUT of the 682XXB/683XXB is monitored on a Spectrum Analyzer display .
Unlocked W ide FM Mode 1. Set up the 682XXB/683XXB as follows: a. Reset the instrument by pressing SYSTEM , then Reset . Upon reset, the CW Menu is dis - played. b. Press Edit F1 to open the current frequency parameter for editing. c. Set F1 to 5.0 GHz.
5. The difference between these two frequencies is the actual peak-to-peak frequency deviation. It should be between 190 MHz and 210 MHz. Record the difference on the T est Record. Unlocked Narrow FM Mode 1. Set up the 682XXB/683XXB as follows: a. Reset the instrument by pressing SYSTEM , then Reset .
7. Compute the FM accuracy with the following for - mula: Accuracy in FM Deviation in kHz (% ) () = æ è ç ö ø ÷ ´ 240 100 8. The calculated result should be between 93.7% and 106.3%. Record this result on the T est Re - cord. Locked FM Mode 1. Set up the 682XXB/683XXB as follows: a.
6. Compute the FM accuracy with the following for - mula: Accuracy in FM Deviation in kHz (% ) () = æ è ç ö ø ÷ ´ 240 100 7. The calculated result should be between 93.7% and 106.3%. Record this result on the T est Re - cord. Locked Low-Noise FM Mode 1.
6. Compute the FM accuracy with the following for - mula: Accuracy in FM Deviation in kHz (% ) () = æ è ç ö ø ÷ ´ 240 100 7. The calculated result should be between 93.
3-14 PULSE MODULA TION TESTS: RISE TIME, F ALL TIME, OVER- SHOOT , AND LEVEL Pulse modulation tests verify correct operation as well as rise time, fall time, overshoot, and level.
Rise/Fall T ime and Overshoot The following procedure lets you measure the rise time, fall time, and overshoot parameters of the pulse modulation waveform. 1. Set up the 682XXB/683XXB as follows: a. Reset the instrument by pressing SYSTEM , then Reset .
Pulse Leveling Accuracy The following procedure lets you measure the pulsed RF output level and CW output level and compare them to verify pulse leveling accuracy . 1. On the 682XXB/683XXB: a. Press On/Off (Internal Pulse Status menu) to turn off pulse modulation.
3. On the 682XXB/683XXB: a. Press MODULA TION , then Pulse to go to the Internal Pulse Status Menu display . b. Press Edit Width and set W1 to the pulse width noted in the T est Record.
3-15 PULSE MODULA TION TEST : VIDEO FEEDTHROUGH This pulse modulation test verifies that video feedthrough is within specifications. T est Setup Connect the equipment, shown in Figure 3-12, as follows: 1. Connect the 682XXB/683XXB rear panel PULSE SYNC OUT to the Oscilloscope T rigger Input.
T est Procedure The following procedure lets you measure the video feedthrough that occurs during pulse modulation. 1. Set up the 682XXB/683XXB as follows: a. Reset the instrument by pressing SYSTEM , then Reset . Upon reset, the CW Menu is dis - played.
3-16 PULSE MODULA TION TEST : RF ON/OFF RA TIO This pulse modulation test verifies that the ratio of RF on power to RF off power is within specifications. T est Setup Connect the equipment, shown in Figure 3-13, as follows: 1. Connect the 682XXB/683XXB rear panel 10 MHZ REF OUT to the Spectrum Analyzer External Ref- erence Input.
e. Press More to go to the additional Internal Pulse Status Menu display . g. Press Internal/External to select the external source for the modulation signal. The External Pulse Status Menu is displayed. h. Press Front/Rear to select the rear panel PULSE TRIGGER IN connector .
7. Repeat steps 1 through 6 for any other frequen - cies noted on the T est Record. Record the results on the T est Record. 682XXB/683XXB MM 3-47 PERFORMANCE PULSE MODULATION TEST: VERIFICATION RF ON/.
3-17 PHASE MODULA TION TESTS This procedure verifies the operation of the phase modulation ( F M) in - put sensitivity circuits in 682XXB/683XXBs with Option 6. The carrier level of the 682XXB/683XXB RF output is monitored on a Spectrum Analyzer display .
WIDE F M Mode 1. Set up the 682XXB/683XXB as follows: a. Reset the instrument by pressing SYSTEM , then Reset . Upon reset, the CW Menu is dis - played. b. Press Edit F1 to open the current frequency parameter for editing. c. Set F1 to 5.0 GHz. 2. Set up the Spectrum Analyzer as follows: a.
Narrow F M Mode 1. Set up the 682XXB/683XXB as follows: a. Reset the instrument by pressing SYSTEM , then Reset . Upon reset, the CW Menu is dis - played. b. Press Edit F1 to open the current frequency parameter for editing. c. Set F1 to 5.0 GHz. 2. Set up the Spectrum Analyzer as follows: a.
T able of Contents 4-1 INTRODUCTION ................... 4-3 4-2 RECOMMENDED TEST EQUIPMENT ....... 4-3 4-3 TEST RECORDS ...................4 - 3 4-4 CALIBRA TION FOLLOWING SUBASSEMBL Y REPLACEMENT ...................4 - 4 4-5 CONNECTOR AND KEY LABEL NOT A TION .
ALC Slope DAC Adjustment .......... 4-28 4-1 1 ALC BANDWIDTH CALIBRA TION ........ 4-31 Equipment Setup ................ 4-31 Bandwidth Calibration ............. 4-31 4-12 AM CALIBRA TION ................. 4-33 Equipment Setup ................ 4-33 AM Calibration Procedure .
Chapter 4 Calibration 4-1 INTRODUCTION This chapter contains procedures for calibrating the Series 682XXB/ 683XXB Synthesized Signal Generators. These procedures are typi - cally performed because out.
4-4 CALIBRA TION FOLLOWING SUBASSEMBL Y REPLACEMENT T able 4-2 (page 4-6) lists the calibration that should be performed fol - lowing the replacement of 682XXB/683XXB subassemblies or RF com - ponents. 4-5 CONNECTOR AND KEY LABEL NOT A TION The calibration procedures include many references to equipment in - terconnections and control settings.
682XXB/683XXB MM 4-5 RECOMMENDED CALIBRATION TEST EQUIPMENT INSTRUMENT CRITICAL SPECIFICA TION RECOMMENDED MANUF ACTURER/MODEL PROCEDURE NUMBER Scalar Network Analyzer , with RF Detector Frequency Range: 0.01 to 50 GHz ANRITSU Model 562, with RF Detector: 560-7K50 (0.
4-6 682XXB/683XXB MM Subassembly/RF Component Replaced Perform the Following Calibration(s) in Paragraph(s): A1, A2 Front Panel Assy None A3 Reference Loop PCB 4-7 A4 Coarse Loop PCB 4-7 A5 Fine Loop .
4-6 INITIAL SETUP The 682XXB/683XXB is calibrated using an IBM compatible PC and external test equipment. The PC must have the W indows 3.1 or W in - dows 95 operating system installed and be equipped with a mouse. Initial setup consists of interfacing the PC to the signal generator .
PC Setup — W indows 3.1 Configure the PC with Windows 3.1 operating sys - tem to interface with the 682XXB/683XXB as fol - lows: 1. Power up the 682XXB/683XXB. 2. Power up the PC and place it in W indows. 3. Double click on the T erminal Icon to bring up the T erminal (Untitled) window .
5. Click on Communications. 6. At the Communications Dialog box, select the fol- lowing options: B aud Rate 9600 (See Note) D ata Bits 8 S top Bits 1 P arity None F low Control Xon/Xoff C onnector Sel.
7. After making the selections, click on the OK but - ton. 8. Press <ENTER> on the keyboard. 9. V erify that a $ prompt appears on the PC display . 10. This completes the initial setup for calibration. PC Setup — W indows 95 Configure the PC with W indows 95 operating sys - tem to interface with the 682XXB/683XXB as fol - lows: 1.
7. In the New Connection Name box, type a name for the connection, then click on the OK button. The window below is now displayed. 8. In the Connect using box, type Direct to Com “_” . Enter the number of the communica - tions port being used, for example: Com1.
10. In the Properties window , make the following se- lections: B its per second 19200 (See Note) D ata bits 8 P arity None S top bits 1 F low control Xon / Xoff 1 1. After making the selections, click on the OK but - ton. 12. Press <ENTER> on the keyboard.
4-7 PRELIMINARY CALIBRA TION This procedure provides the steps necessary to initially calibrate the coarse loop, fine loop, frequency instruction, and internal DVM cir - cuitry and the 100 MHz reference oscillator of the 682XXB/683XXB. Equipment Setup Connect the equipment, shown in Figure 4-2, as fol- lows: 1.
Calibration Steps Each of the steps in this procedure provides initial calibration of a specific 682XXB/683XXB circuit or component. T o ensure accurate instrument calibra - tion, each step of this procedure must be performed in sequence. 1. Calibrate the internal DVM circuitry as follows: a.
6. Calibrate the YIG Frequency Linearizer DACs as follows: a. At the $ prompt, type: calterm 127 and press <ENTER>. b. Follow the instructions on the screen. Enter the value of the frequency counter reading as XXXX MHz. c Record step completion on the T est Record.
10. Calibrate the Center Frequency DAC as follows: a. At the $ prompt, type: calterm 114 and press <ENTER>. (The $ prompt will appear on the screen when the calibration is complete.) b. Record step completion on the T est Record. 1 1. Store the calibration data as follows: a.
4-8 SWITCHED FIL TER SHAPER CALIBRA TION This procedure provides the steps necessary to adjust the Switched Filter Shaper Amplifier gain to produce a more constant level ampli - fier gain with power level changes. Equipment Setup Connect the equipment, shown in Figure 4-3, as fol- lows: 1.
Log Amplifier Zero Calibra - tion Before the Switched Filter Shaper Amplifier can be adjusted, zero calibration of the ALC Log amplifier must be performed to eliminate any DC offsets. 1. Perform ALC Log amplifier zero calibration as follows: a. At the $ prompt on the PC display , type: calterm 115 and press <ENTER>.
2. Adjust the Switched Filter Limiter DAC for each of the frequency bands as follows: a. At the $ prompt on the PC display , type: calterm 145 and press <ENTER>. b. On the 562 Network Analyzer , set the Resolu - tion to 0.2 dB and adjust the offset to center the top of the triangle waveform on the display .
c. Press CHANNEL 2 DISPLA Y : OFF . d. Press CHANNEL 1 DISPLA Y : ON. e. Press CHANNEL 1 MENU key . f. From the Channel 1 Menu display , select POWER. g. Press OFFSET/RESOLUTION. b. Set Resolution to 5 dB/Div . c. Adjust Offset to center the display .
Shaper DAC Adjustment For Models 682XXB with Firmware V ersion 2.39 and above; Models 683XXB with Firmware V ersion 2.46 and above; Models 682X5B with Firmware V ersion 1.
4-9 RF LEVEL CALIBRA TION RF level calibration requires the use of an automated test system. A computer-controlled power meter measures the 682XXB/683XXB power output at many frequencies throughout the frequency range of the instrument. Correction factors are then calculated and stored in non-volatile memory (EEPROM) located on the A17 CPU PCB.
4-10 ALC SLOPE CALIBRA TION Models 683XXB with Firmware V ersion 1.01 to 2.00 This procedure provides the steps necessary to perform ALC Slope calibration. The ALC Slope DAC is calibrated to adjust for an increas - ing or decreasing output power-vs-output frequency in the analog sweep mode.
NOTE Before beginning this calibration proce - dure, always let the 683XXB warm up for a minimum of one hour . ALC Slope DAC Adjustment The following procedure lets you adjust the ALC Slope DAC to compensate for decreasing output power-vs-frequency for frequencies £ 2 GHz and for frequencies >2 GHz.
3. Make the following selections on the 562 Network Analyzer to normalize the step sweep. a. Press CALIBRA TION and follow the menu on the display . b. Press AUTOSCALE. c. Press OFFSET/RESOLUTION and set the Resolution to 0.2 dB. 4. On the 683XXB, press Analog to select the ana - log sweep mode.
f. Press Sweep Ramp . At the resulting Step Sweep Ramp Menu, press Num of Steps and set the number of steps to 200. g. Press Step to return to the Step Sweep Menu display . 7. Make the following selections on the 562 Network Analyzer to normalize the step sweep.
Models 683XXB with Firmware V ersion 2.00 and above (Models 683X5B with Firmware V ersion 1.00 and above) This procedure provides the steps necessary to perform ALC Slope calibration. The ALC Slope is calibrated to adjust for decreasing out - put power-vs-output frequency in full band analog sweep.
NOTE Before beginning this calibration proce - dure, always let the 682XXB/683XXB warm up for a minimum of one hour . ALC Slope DAC Adjustment The following procedure lets you adjust the ALC Slope over individual frequency ranges to compen - sate for decreasing output power-vs-frequency in analog sweep.
d. Press CW/SWEEP SELECT to return to the Step Sweep Menu display . e. Press Sweep Ramp . At the resulting Step Sweep Ramp Menu, press Num of Steps and set the number of steps to 400. 3. Make the following selections on the 562 Network Analyzer to normalize the step sweep.
b. Adjust the ALC Slope so that the power at the start and stop frequencies (of the analog sweep for band 0) match as closely as possible the normalized straight line in step sweep mode. When completed, press n for the next band. c. Using the Slope and Offset adjustment keys, continue until the ALC Slope for all bands has been adjusted.
4-1 1 ALC BANDWIDTH CALIBRA TION This procedure provides the steps necessary to perform ALC Band - width calibration. The ALC Bandwidth is adjusted to compensate for gain variations of the modulator . The adjustment is performed for each frequency band.
The $ prompt will appear on the screen when the ALC Bandwidth calibration is complete. (This can take up to 15 minutes depending on the frequency range of the 682XXB/683XXB.) b. Record step completion on the T est Record. 2. Store the calibration data as follows: a.
4-12 AM CALIBRA TION This procedure provides the steps necessary to perform AM calibra - tion. This consists of calibrating the AM Calibration DAC, the AM Me - ter circuit, and the AM Function Generator .
4. Using the K (male) to 2.4 mm (female) adapter , connect the Power Sensor to the RF OUTPUT of the 682XXB/683XXB. NOTE Before beginning this calibration proce - dure, always let the 682XXB/683XXB warm up for a minimum of one hour .
e. When the DAC has been adjusted, press Q on the keyboard to exit the program. (If the in - strument has a Down Converter installed, you will be returned to the start of the program to perform this calibration for frequencies of >2 GHz.) When the DAC has been completely adjusted, the program will exit to the $ prompt.
5. Perform AM Function Generator calibration as follows: a. At the $ prompt, type: calterm 146 and press <ENTER>. (The $ prompt will appear on the screen when the calibration is complete.) b. Record step completion on the T est Record. 6. Store the calibration data as follows: a.
4-13 FM CALIBRA TION Models 682XXB/683XXB with Firmware V ersions 1.01 to 2.10 Models 682X5B/683X5B with Firmwave V ersion 1.00 This procedure provides the steps necessary to perform FM calibra - tion. This consists of calibrating the FM Meter circuit, the Offset Bal - ance DAC, and the FM Gain Control DAC.
4. Connect the 682XXB/683XXB RF OUTPUT to the Spectrum Analyzer RF Input. NOTE Before beginning this calibration proce - dure, always let the 682XXB/683XXB warm up for a minimum of one hour .
Perform the calibration as follows: a. At the $ prompt, type: calterm 124 and press <ENTER>. b. Set up the Function Generator for a 0.4 Hz square wave with an output level of 2 volts peak to peak. c. On the Spectrum Analyzer , set the Span/Div to 50 MHz per division.
m. Now , adjust the center frequency control to po - sition the high carrier at the center of the dis - play . Note the frequency reading. n. The difference between these two frequencies is the actual peak-to-peak frequency deviation. It should be 20 MHz ± 0.
f. When finished setting the DAC, press Q on the keyboard to go to the next calibration step. When the DAC has been completely adjusted, the program will exit to the $ prompt.
quency control to position the high (or low) car - rier at the center of the display . Note the frequency reading. j. On the keyboard, enter 1 to toggle the polarity . k. Now , adjust the center frequency control to po - sition the low (or high) carrier at the center of the display .
w. When finished setting the DAC, press Q on the keyboard to return to the menu. Then, enter 3 to go to the next calibration step (adjusting the DAC to obtain 200 MHz deviation at 15 GHz). When the DAC has been completely adjusted, the program will exit to the $ prompt.
Models 682XXB with Firmware V ersion 2.18 and above Models 683XXB with Firmwave V ersion 2.20 and above Models 682X5B/683X5B with Firmware V ersion 1.07 and above This procedure provides the steps necessary to perform FM calibra - tion. This consists of calibrating the FM Meter circuit and the FM V ariable Gain Control DAC.
4. Connect the 682XXB/683XXB RF OUTPUT to the Spectrum Analyzer RF Input. NOTE Before beginning this calibration proce - dure, always let the 682XXB/683XXB warm up for a minimum of one hour .
3. External Unlocked W ide FM Mode Sensitivity calibration is accomplished by adjusting the FM V ariable Gain Control DAC to obtain a 200 MHz FM deviation at frequencies of 5 GHz and 15 GHz. The modulating signal input is from the external Function Generator .
4. Internal Unlocked W ide FM Mode Sensitivity calibration is accomplished by adjusting the FM V ariable Gain Control DAC to obtain a 200 MHz FM deviation at frequencies of 5 GHz and 15 GHz. The modulating signal input is from the internal Function Generator .
k. Now adjust the center frequency control to po - sition the low (or high) carrier at the center of the display . Note the frequency reading. l. The difference between these two frequencies should be 200 MHz ± 0.5 MHz. If not, enter 2 and fine adjust the DAC to obtain this devia - tion.
When the DAC has been completely adjusted, the program will exit to the $ prompt. g. Record step completion on the T est Record. 6. Internal Locked, Locked Low-Noise, and Un - locked Narrow FM Mode Se.
c. Set up the Function Generator for a 99.8 kHz sine wave with an output level of 0.707 volts RMS (2 volts peak to peak). Use a frequency counter to verify the output frequency of your function generator is set to ± 1%. d. On the Spectrum Analyzer , set the Span/Div to 50 kHz per division.
4-14 PHASE MODULA TION ( F M) CALIBRA TION This procedure provides the steps necessary to perform phase modula - tion ( F M) calibration for 682XXB/683XXBs with Option 6. This con - sists of calibrating the FM V ariable Gain Control DAC and the F M Flatness DAC for input sensitivities in Narrow and W ide F M modes.
4. Connect the 682XXB/683XXB RF OUTPUT to the Spectrum Analyzer RF Input. NOTE Before beginning this calibration proce - dure, always let the 682XXB/683XXB warm up for a minimum of one hour .
When the DAC has been completely adjusted, the program will exit to the $ prompt. g. Record step completion on the T est Record. 2. Internal W ide F M Mode Sensitivity calibration is accomplished by adjusting the FM V ariable Gain Control DAC to reduce the carrier level as low as possible at frequencies of 5 GHz and 20 GHz.
c. On the Spectrum Analyzer , set the Span/Div to 50 kHz per division. d. On the computer keyboard, use the ‘, 1, 2, and 3 keys to increment and the 7, 8, 9, and 0 keys to decrement the value of the DAC’ s setting. Start calibration by pressing an increment key .
When the DAC has been completely adjusted, the program will exit to the $ prompt. g. Record step completion on the T est Record. 5. Internal Narrow F M Mode Sensitivity calibration is accomplished by adjusting the FM V ariable Gain Control DAC to reduce the carrier level as low as possible at frequencies of 5 GHz and 20 GHz.
c. On the Spectrum Analyzer , set the Span/Div ot 50 kHz per division. d. On the computer keyboard, use the ‘, 1, 2, and 3 keys to increment and the 7, 8, 9, and 0 keys to decrement the value of the DAC’ s setting. Start the calibration by pressing an increment key .
T able of Contents 5-1 INTRODUCTION ................... 5-3 5-2 RECOMMENDED TEST EQUIPMENT ....... 5-3 5-3 ERROR AND W ARNING/ST A TUS MESSAGES. . . 5-3 Self-T est Error Messages .............5 - 3 Normal Operation Error and W arning/Status Messages .
The majority of the troubleshooting procedures presented in this chapter require the removal of the instrument covers to gain access to test points on printed circuit boards and other subassemblies. W ARNING Hazardous voltages are present inside the 682XXB/683XXB whenever ac line power is connected.
Chapter 5 T r oubleshooting 5-1 INTRODUCTION This chapter provides information for troubleshooting signal generator malfunctions. The troubleshooting procedures presented in this chap - ter support fault isolation to a replaceable subassembly or RF compo - nent.
5-4 682XXB/683XXB MM Error Message T roubleshooting T able Page Number Error 100 DVM Ground Offset Failed 5-5 5-18 Error 101 DVM Positive 10V Reference 5-5 5-18 Error 102 DVM Negative 10V Reference 5-.
682XXB/683XXB MM 5-5 Error Message T roubleshooting T able Page Number Error 120 Delta-F Circuits Failed 5-16 5-36 Error 121 Unleveled Indicator Failed 5-17 5-37 Error 122 Level Reference Failed 5-17 5-37 Error 123 Detector Log Amp Failed 5-17 5-37 Error 124 Full Band Unlocked and Unleveled 5-18 5-39 Error 125 8.
5-6 682XXB/683XXB MM SELF-TEST TROUBLESHOOTING ERROR MESSAGES Error Message T roubleshooting T able Page Number Error 144 RF was Off when Selftest started.
Normal Operation Error and W arning/ Status Messages When an abnormal condition is detected during op - eration, the 682XXB/683XXB displays an error mes - sage to indicate that the output is abnormal or that a signal input or data entry is invalid.
5-8 682XXB/683XXB MM Error Message Description ERR Continued: (2) The external FM modulating signal exceeds the input voltage range. In addition, the message “ Reduce FM Input Level ” appears at the bottom of the FM status display .
682XXB/683XXB MM 5-9 ERROR AND WARNING/ TROUBLESHOOTING STATUS MESSAGES W arning/Status Message Description OVN COLD This warning message indicates that the 100 MHz Crystal oven (or the 10 MHz Crystal oven if Option 16 is installed) has not reached operating temperature.
5-4 MALFUNCTIONS NOT DISPLA YING AN ERROR MESSAGE The 682XXB/683XXB must be operating to run self-test. Therefore, malfunctions that cause the instrument to be non-operational do not produce error messages. These problems generally are a failure of the 682XXB/683XXB to power up properly .
682XXB/683XXB MM 5-11 J1 J2 J3 J4 J5 J6 J7 J1 J2 J3 J4 J5 J6 J7 J 1 J2 J3 J4 J5 J6 J7 J1 J2 J3 J4 J5 J6 J7 T est P oints Rear P anel A15 Regulator PCB A3 A4 A5 A6 A7 A9 A8 A10 A11 A12 A13 A14 A15 A16 .
5-12 682XXB/683XXB MM TROUBLESHOOTING TROUBLESHOOTING TABLES Signal Generator W ill Not T urn On ( OPERA TE light is OFF ) Normal Operation: When the 682XXB/683XXB is connected to the power source, the OPERA TE light should illuminate and the instru - ment should power up.
682XXB/683XXB MM 5-13 TROUBLESHOOTING TROUBLESHOOTING TABLES If the voltage is correct, the Front Panel assembly or the cable between Motherboard connector A20J22 and the Front Panel assembly may be defective.
5-14 682XXB/683XXB MM TROUBLESHOOTING TROUBLESHOOTING TABLES No Pulse Modulation of the RF Output Description: The signal generator does not display any error messages during self-test; however , there is no pulse modulation of the RF out - put. Step 1.
682XXB/683XXB MM 5-15 TROUBLESHOOTING TROUBLESHOOTING TABLES If the signals are present and correct, go to step 8. If the signals are not present or are incorrect, replace the A6 PCB. Step 8. Disconnect the cable, W123, from J7 of the Pulsed Switched Filter assembly .
5-16 682XXB/683XXB MM Output Power Related Problems (>40 GHz) 682XXB/683XXB Models with SQM Description: The signal generator does not display any error message during self-test; however , there is no or low RF output above 40 GHz. Step 1. Set up the 682XXB/683XXB as follows: a.
682XXB/683XXB MM 5-17 TROUBLESHOOTING TROUBLESHOOTING TABLES Step 4. Connect a 562 Scalar Network Analyzer to the 682XXB/ 683XXB as follows: a. Connect the 682XXB/683XXB AUX I/O to the 562 AUX I/O . b. Connect the 562 DEDICA TED GPIB to the 682XXB/ w683XXB IEEE-488 GPIB .
5-18 682XXB/683XXB MM Internal DVM T ests Error 100 DVM Ground Offset Failed, or Error 101 DVM Positive 10V Reference, or Error 102 DVM Negative 10V Reference Description: The DVM circuitry , located on the A16 CPU Interface PCB, is calibrated using the ± 10 volts from the reference supplies on the A12 Analog Instruction PCB.
682XXB/683XXB MM 5-19 TROUBLESHOOTING TROUBLESHOOTING TABLES Power Supply T ests W ARNING V oltages hazardous to life are present throughout the power supply circuits, even when the front panel LINE switch is in the ST ANDBY postion. When performing maintenance, use utmost care to avoid electrical shock.
5-20 682XXB/683XXB MM TROUBLESHOOTING TROUBLESHOOTING TABLES Step 2. Perform the following procedure to isolate malfunctions when the voltages from several regulated supplies are incorrect. a. Place the LINE switch to ST ANDBY . b. Replace the A15 PCB assembly .
682XXB/683XXB MM 5-21 ± 15VG Supply Problems This supply provides ± 15 volts to the YIG Driver; SDM, SQM Driver; CPU; and CPU I/O circuits andw the Switched Filter and Down Con - verter assemblies. Step 4. Perform the following procedure to isolate malfunctions to the ± 15VG supply and outlying load circuits.
5-22 682XXB/683XXB MM ± 15V A Supply Problems This supply provides ± 15 volts to the Function Generator , PIN Control, ALC, FM, and Analog Instruction circuits. Step 5. Perform the following procedure to isolate malfunctions to the ± 15V A supply and outlying load circuits.
682XXB/683XXB MM 5-23 ± 15VLP Supply Problems This supply provides ± 15 volts to the Pulse Generator and the Refer - ence, Coarse, Fine, and YIG Loop circuits. Step 6. Perform the following procedure to isolate malfunctions to the ± 15VLP supply and outlying load circuits.
5-24 682XXB/683XXB MM ± 15VFM Supply Problems This supply provides ± 15 volts to the FM circuits. Step 7. Perform the following procedure to isolate malfunctions to the ± 15VFM supply and its outlying load circuit. a. Place the LINE switch to ST ANDBY .
682XXB/683XXB MM 5-25 –18VT Supply Problems This supply provides –18 volts to the front panel LCD contrast circuit and to drive the YIG-tuned oscillator main tuning coil during CW and slow analog sweeps. Step 8. Perform the following procedure to isolate malfunctions to the –18VT supply and its outlying load circuit.
5-26 682XXB/683XXB MM –43VT Supply Problems This supply provides –43 volts to drive the YIG-tuned oscillator main tuning coil during bandswitching, fast analog sweeps, and digital sweeps. Step 9. Perform the following procedure to isolate malfunctions to the –43VT supply and its outlying load circuit.
682XXB/683XXB MM 5-27 +24VH Supply Problems This supply provides +24 volts for the YIG-tuned oscillator heater , the V/GHz circuit on the A12 PCB, and the coarse, fine, and YIG loop circuits.
5-28 682XXB/683XXB MM Power Supply Not Phase-Locked Error 106 Power Supply not Locked Description: The switching power supply is not phase locked to the 400 kHz reference signal from the A6 Pulse Generator PCB. Error 106 may be displayed alone or it may be accompanied by error 148 (Pulse 40 MHz reference circuitry failed).
682XXB/683XXB MM 5-29 A3 Reference Loop Error 108 Crystal Oven Cold Description: The oven of the 100 MHz crystal oscillator or the Option 16 high-stability 10 MHz crystal oscillator has not reached operating temperature. Step 1. Allow a 30 minute warm up, then run self-test again.
5-30 682XXB/683XXB MM Error 1 10 The 100MHz Reference is not Locked to the High Stability 10MHz Crystal Oscillator Description: The reference loop is not phase-locked to the Option 16 high stability 10 MHz crystal oscillator . Step 1. Disconnect the cable from A3J6.
682XXB/683XXB MM 5-31 Step 6. Using the spectrum analyzer , verify the presence of the +3 dBm ± 5 dB, 10 MHz signal at the end of the cable. If present, replace the A4 PCB. If not present, go to step 7. Step 7. Disconnect cable W105 at A3J4. Step 8. Using the spectrum analyzer , verify the presence of the +3 dBm ± 5 dB, 10 MHz signal at A3J4.
5-32 682XXB/683XXB MM A4 Coarse Loop Error 1 12 Coarse Loop Osc Failed Description: The coarse loop oscillator is not phase-locked. Step 1. Disconnect cable W103 at A4J1 and cable W105 at A4J6.
682XXB/683XXB MM 5-33 A7 YIG Loop Error 1 13 YIG Loop Osc Failed Error 1 15 Not Locked Indicator Failed Description: Error 1 13 indicates that the YIG loop is not phase- locked. Error 1 15 indicates a failure of the not phased-lock indicator circuit. Step 1.
5-34 682XXB/683XXB MM Step 8. Run self-test. If error 1 13 or 1 15 is not displayed, the problem is cleared. If either error 1 13 or 1 15 is displayed, contact your local ANRITSU service center for assistance.
682XXB/683XXB MM 5-35 A1 1 FM PCB Error 1 16 FM Loop Gain Check Failed Description: The FM loop has failed or the loop gain is out of toler - ance. Step 1. Perform a preliminary calibration. (Refer to chapter 4 for the calibration procedure.) Step 2. Run self-test.
5-36 682XXB/683XXB MM TROUBLESHOOTING TROUBLESHOOTING TABLES A12 Analog Instruction Error 107 Sweep T ime Check Failed Error 1 17 Linearizer Check Failed Error 1 18 Switchpoint DAC Failed Error 1 19 C.
682XXB/683XXB MM 5-37 A10 ALC Error 121 Unleveled Indicator Failed Error 122 Level Reference Failed Error 123 Detector Log Amp Failed Error 127 Detector Input Circuit Failed Description: Error 121 indicates a failure of the circuit that alerts the CPU whenever the RF output power becomes unleveled.
5-38 682XXB/683XXB MM If present, replace the A10 PCB. If not present, replace the cable W122. Error 143 Slope DAC Failed Description: Error 143 indicates a problem with the level slope DAC circuitry on the A10 PCB. NOTE When troubleshooting this error in a 682XXB model, begin at step 3 of the procedure.
682XXB/683XXB MM 5-39 YIG-tuned Oscillator Error 124 Full Band Unlocked and Unleveled Error 125 8.4-20 GHz Unlocked and Unleveled Error 126 2-8.4 GHz Unlocked and Unleveled Description: These error messages indicate either a failure of one or both of the oscillators in the 2-20 GHz YIG-tuned oscillator assembly .
5-40 682XXB/683XXB MM If the RF signal is correct in both frequency and ampli - tude throughout the full sweep, go to step 8. If there is no RF signal for all or part of the sweep or if the amplitude of the RF signal is low , go to step 5. Step 5. Connect the X input of an oscilloscope to the 682XXB/ 683XXB rear panel HORIZ OUT connector .
682XXB/683XXB MM 5-41 Output Power Level Related Problems (0.01 to 20 GHz) Error 128 .01-2 GHz Unleveled Description: Error 128 indicates a failure of of the down converter leveling circuitry . The 682XXB/683XXB may or may not produce an RF output in the 0.
5-42 682XXB/683XXB MM Unleveled with no/low output power: Step 1. Set up the 682XXB/683XXB as follows: a. 682XXB Setup: CW/SWEEP SELECT : Step F1: 0.010 GHz F2: 2.000 GHz Number of Steps: 400 L1: +1.00 dBm 683XXB Setup: CW/SWEEP SELECT : Analog F1: 0.
682XXB/683XXB MM 5-43 Step 7. Connect a 562 Scalar Network Analyzer to the 682XXB/ 683XXB as follows: a. Connect the 682XXB/683XXB AUX I/O to the 562 AUX I/O . b. Connect the 562 DEDICA TED GPIB to the 682XXB/ 683XXB IEEE-488 GPIB . c. Connect the RF Detector to the 562 Channel A Input.
5-44 682XXB/683XXB MM Error 129 Switched Filter or Level Detector Failed Description: Error 129 indicates a failure of either the switched filter or level detector circuitry . The 682XXB/683XXB may or may not pro - duce an RF output in the 2 to 20 GHz frequency range.
682XXB/683XXB MM 5-45 Unleveled with no/low output power: Step 1. Set up the 682XXB/683XXB as follows: a. 682XXB Setup: CW/SWEEP SELECT : Step F1: 0.010 GHz F2: 20.000 GHz Number of Steps: 400 L1: +1.00 dBm 683XXB Setup: CW/SWEEP SELECT : Analog F1: 0.
5-46 682XXB/683XXB MM Step 5. Set up the 562 Scalar Network Analyzer as follows: a. Press SYSTEM MENU key . b. From System Menu display , select RESET . c. Press CHANNEL 2 DISPLA Y : OFF . d. Press CHANNEL 1 DISPLA Y : ON. e. Press CHANNEL 1 MENU key .
682XXB/683XXB MM 5-47 TROUBLESHOOTING TROUBLESHOOTING TABLES Error 130 2-3.3 GH Switched Filter Error 131 3.3-5.5 GH Switched Filter Error 132 5.5-8.4 GH Switched Filter Error 133 8.
5-48 682XXB/683XXB MM TROUBLESHOOTING TROUBLESHOOTING TABLES Error 135 Modulator or Driver Failed Description: Error 135 indicates a failure of the modulator in the switched filter assembly or the modulator driver circuitry on the A9 PIN Control PCB. Step 1.
682XXB/683XXB MM 5-49 Output Power Level Related Problems (20 to 40 GHz) 682XXB/683XXB Models with SDM Error 138 SDM Unit or Driver Failed Description: Error 138 indicates a failure of the SDM, a fail.
5-50 682XXB/683XXB MM Error 139 32-40 GHz SDM Section Failed Error 140 25-32 GHz SDM Section Failed Error 141 20-25 GHz SDM Section Failed Description: Each of these error messages indicates a failure in a switched doubler filter path within the SDM.
682XXB/683XXB MM 5-51 Error 144 RF was Off when Selftest started. Some tests where not performed Description: Indicates that some self-tests where not performed be - cause the RF Output was selected OFF on the front panel. Step 1. Press the OUTPUT key on the front panel to turn the RF Output ON .
5-52 682XXB/683XXB MM TROUBLESHOOTING TROUBLESHOOTING TABLES Error 147 Internal FM circuitry failed Description: Indicates a failure of the internal frequency modulation function. The 682XXB/683XXB may or may not provide frequency modulation of the RF output signal using modulating signals from an external source.
682XXB/683XXB MM 5-53/5-54 TROUBLESHOOTING TROUBLESHOOTING TABLES Step 5. Reconnect cable W108 to A5J4 and disconnect cable W121 at A5J5. Step 6. Using the oscilloscope, verify the presence of a 10 MHz TTL signal at the end of cable W121. If present, replace the A5 PCB.
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T able of Contents 6-1 INTRODUCTION ................... 6-3 6-2 REMOVING AND REPLACING THE CHASSIS COVERS .......................6 - 4 Preliminary ...................6 - 4 Procedure ....................6 - 4 6-3 REMOVING AND REPLACING THE FRONT P ANEL ASSEMBL Y .
6-8 REMOVING AND REPLACING THE A16 OR A17 PCB ....................... 6-1 1 Preliminary ................... 6-1 1 Procedure ................... 6-1 1 6-9 REMOVING AND REPLACING THE A18 OR A19 PCB ....................... 6-12 Preliminary ..............
Chapter 6 Removal and Replacement Pr ocedur es 6-1 INTRODUCTION This chapter provides procedures for gaining access to the major 682XXB/683XXB assemblies, subassemblies, and components for troubleshooting or replacement. W ARNING Hazardous voltages are present inside the 682XXB/683XXB whenever ac line power is connected.
6-2 REMOVING AND REPLACING THE CHASSIS COVERS T roubleshooting procedures require removal of the top cover . Replace - ment of some 682XXB/683XXB assemblies and parts require removal of all covers. The following procedure describes this process. Preliminary Disconnect the power cord from the unit.
Step 12 Remove the screw that fastens the other side cover to the chassis. (The screw is lo - cated at the rear of the instrument.) Step 13 Remove the side cover and set it aside. Step 14 T o replace the chassis covers, reverse the procedure used to remove them.
6-3 REMOVING AND REPLACING THE FRONT P ANEL ASSEMBL Y This paragraph provides instructions for removing and replacing the front panel assembly of the 682XXB/683XXB. The front panel assem - bly contains the A1 and A2 Front Panel PCBs. Refer to Figure 6-2 dur - ing this procedure.
682XXB/683XXB MM 6-7 REMOVAL AND FRONT PANEL ASSEMBLY REPLACEMENT PROCEDURES REMOVAL DIAGRAM Figure 6-2. Front Panel Assembly Removal.
6-4 REMOVING AND REPLACING THE A3, A4, A5, OR A6 PCB This paragraph provides instructions for removing and replacing the A3 Reference Loop PCB, the A4 Coarse Loop PCB, the A5 Fine Loop PCB, or the A6 Pulse Generator PCB, all of which are located in the RF housing (see Figure 6-3).
682XXB/683XXB MM 6-9 REMOVAL AND PCB AND COMPONENT REPLACEMENT PROCEDURES LOCATOR DIAGRAM J1 J2 J3 J4 J5 J6 J7 J1 J2 J3 J4 J5 J6 J7 J 1 J2 J3 J4 J5 J6 J7 J1 J2 J3 J4 J5 J6 J7 T est P oints Rear P anel.
6-5 REMOVING AND REPLACING THE A7 PCB This paragraph provides instructions for removing and replacing the A7 YIG Loop PCB, which is located in the main card cage (see Figure 6-3). Preliminary Disconnect the power cord from the unit and remove the top cover as described in paragraph 6-2.
6-7 REMOVING AND REPLACING THE A13, A14, OR A15 PCB This paragraph provides instructions for removing and replacing the A13 YIG Driver PCB, the A14 SDM, SQM Driver PCB, or the A15 Regulator PCB, all of which are located in the main card cage (see Fig - ure 6-3).
6-9 REMOVING AND REPLACING THE A18 OR A19 PCB This paragraph provides instructions for removing and replacing the A18 Power Supply PCB or the A19 AC Line Conditioner PCB, both of which are located in the power supply housing assembly (see Figure 6-3).
6-10 REMOVING AND REPLACING THE REAR P ANEL ASSEMBL Y This paragraph provides instructions for removing and replacing the rear panel assembly of the 682XXB/683XXB. The rear panel assembly contains the A21 Line Filter/Rectifier PCB, the A21-1 BNC/AUX I/O Connector PCB, the line module assembly , and the fan assembly .
Step 9 Disconnect the cable assembly from the A21 Line Filter/Rectifier PCB at connec - tor P2 on the A19 PCB. Step 10 Carefully pull the rear panel assembly away from the signal generator chassis until the cable connections to the Mother - board are accessable.
682XXB/683XXB MM 6-15 REMOVAL AND REAR PANEL ASSEMBLY REPLACEMENT PROCEDURES REMOVAL DIAGRAM Figure 6-4. Rear Panel Assembly Removal.
6-1 1 REMOVING AND REPLACING THE A21 PCB This paragraph provides instructions for removing and replacing the A21 Line Filter/Rectifier PCB, which is located on the rear panel as - sembly (see Figure 6-4). Preliminary Disconnect the power cord from the unit.
6-12 REMOVING AND REPLACING THE A21-1 PCB This paragraph provides instructions for removing and replacing the A21-1 BNC/AUX I/O Connector PCB, which is located on the rear panel assembly (see Figure 6-4). Preliminary Disconnect the power cord from the unit.
6-13 REMOVING AND REPLACING THE F AN ASSEMBL Y This paragraph provides instructions for removing and replacing the fan assembly , which is located on the rear panel assembly (see Figure 6-4). Preliminary Disconnect the power cord from the unit. Remove the chassis covers as described in paragraph 6-2.
Appendix A T est Records A-1 INTRODUCTION This appendix provides test records for recording the results of the Performance V erification tests (Chapter 3) and the Calibration proce - dures (Chapter 4). They jointly provide the means for maintaining an accurate and complete record of instrument performance.
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ANRITSU Model 68237B/68337B Date: __________________________ Serial Number __________________ Tested By: __________________________ 682XXB/683XXB MM A-3 3-6 Internal Time Base Aging Rate Test Test Procedure Measured V alue Upper Limit Record frequency error value .
A-4 682XXB/683XXB MM 3-7 Frequency Synthesis Tests Coarse Loop/YIG Loop Test Procedure Fine Loop Test Procedure (Standard 68X37B) T est Frequency (in GHz) Measured V alue * T est Frequency (in GHz) Measured V alue ** 2.000 000 000 3.000 000 000 4.000 000 000 5.
682XXB/683XXB MM A-5 3-8 Spurious Signals Test: RF Output Signals <2 GHz This test is not applicable to the 68237B/68337B model. 3-9 Harmonic Test: RF Output Signals From 2 to 20 GHz Test Procedure (2 to 10 GHz) Measured V alue Upper Limit Set F1 to 2.
A-6 682XXB/683XXB MM TEST MODEL RECORD 68237B/68337B 3-9 Harmonic Test: RF Output Signals From 2 to 20 GHz (Continued) Test Procedure (11 to 20 GHz) Measured V alue Upper Limit Set F1 to 12.4 GHz Record the level of all harmonics of the 12.4 GHz carrier: 24.
682XXB/683XXB MM A-7 TEST MODEL RECORD 68237B/68337B 3-10 Single Sideband Phase Noise Test Test Procedure Measured V alue Upper Limit Set F1 to 2.0 GHz Record the phase noise levels at these offsets: 100 Hz ............................... 1 kHz ......
A-8 682XXB/683XXB MM 3-11 Power Level Accuracy and Flatness Tests (Model 68237B/68337B without Option 2A Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 5.
682XXB/683XXB MM A-9 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68237B/68337B with Option 2A Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 5.
A-10 682XXB/683XXB MM 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68237B/68337B with Option 15B High Power & without Option 2A Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 5.
682XXB/683XXB MM A-11 3-11 Power Level Accuracy And Flatness Tests (Continued) (Model 68237B/68337B with Option 15B High Power & Option 2A Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 5.
A-12 682XXB/683XXB MM TEST MODEL RECORD 68237B/68337B 3-12 Amplitude Modulation Test AM Imput Sensitivity Procedure Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the Modulation Analyzer AM PK(+) reading ........... Measure and record the Modulation Analyzer AM PK(–) reading .
682XXB/683XXB MM A-13 TEST MODEL RECORD 68237B/68337B 3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level Rise Time, Fall Time, and Overshoot Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the following: Rise T ime .
A-14 682XXB/683XXB MM TEST MODEL RECORD 68237B/68337B 3-15 Pulse Modulation Test: Video Feedthrough Test Procedure Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Set pulse width W1 to 5.0 s Set PRI (period) to 0.01 ms Measure and record the Video Feedthrough voltage spikes .
ANRITSU Model 68237B/68337B Date: __________________________ Serial Number __________________ Calibrated By: __________________________ 682XXB/683XXB MM A-15 4-7 Preliminary Calibration Procedure Step Step Completion 1. Internal DVM Calibration (calterm1 19) .
A-16 682XXB/683XXB MM TEST MODEL RECORD 68237B/68337B 4-10 ALC Slope Calibration (68337B having Firmware Version 1.01 to 2.00) Procedure Step Step Completion 5. ALC Slope DAC adjustment for 2 GHz ( This step is not applicable to the 68337B ) .........
682XXB/683XXB MM A-17 TEST MODEL RECORD 68237B/68337B 4-13 FM Calibration (68237B/68337B with Firmware Version 1.01 to 2.10) Procedure Step Step Completion 1. FM Meter Calibration (calterm 123) ............................ ______________ 2. FM Of fset Balance Calibration (calterm 126) .
A-18 682XXB/683XXB MM 4-14 Phase Modulation ( F M) Calibration (Option 6) Procedure Step Step Completion 1. External Wide M Mode Sensitivity Calibration (calterm 149) .............. ______________ 2. Internal Wide M Mode Sensitivity Calibration (calterm 151) .
ANRITSU Model 68245B/68345B Date: __________________________ Serial Number __________________ Tested By: __________________________ 682XXB/683XXB MM A-19 3-6 Internal Time Base Aging Rate Test Test Procedure Measured V alue Upper Limit Record frequency error value .
A-20 682XXB/683XXB MM TEST MODEL RECORD 68245B/68345B 3-7 Frequency Synthesis Tests Coarse Loop/YIG Loop Test Procedure Fine Loop Test Procedure (Standard 68X45B) T est Frequency (in GHz) Measured V alue * T est Frequency (in GHz) Measured V alue ** 1.
682XXB/683XXB MM A-21 3-8 Spurious Signals Test: RF Output Signals £ 2.2 GHz Test Procedure Measured V alue Upper Limit Set F1 to 500 MHz Record the level of all harmonics of the 500 MHz carrier 1.0 GHz (2nd harmonic) ..................... 1.5 GHz (3rd harmonic) .
A-22 682XXB/683XXB MM 3-9 Harmonic Test: RF Output Signals From 2.2 to 20 GHz Test Procedure (2.2 to 10 GHz) Measured V alue Upper Limit Set F1 to 2.4 GHz Record the level of all harmonics of the 2.4 GHz carrier: 4.8 GHz (2nd harmonic) ...............
682XXB/683XXB MM A-23 3-9 Harmonic Test: RF Output Signals From 2.2 to 20 GHz (Continued) Test Procedure (11 to 20 GHz) Measured V alue Upper Limit Set F1 to 12.4 GHz Record the level of all harmonics of the 12.4 GHz carrier: 24.8 GHz (2nd harmonic) .
A-24 682XXB/683XXB MM 3-10 Single Sideband Phase Noise Test Test Procedure Measured V alue Upper Limit Set F1 to 0.6 GHz Record the phase noise levels at these offsets: 100 Hz ............................... 1 kHz .............................. 10 kHz .
682XXB/683XXB MM A-25 3-11 Power Level Accuracy and Flatness Tests (Model 68245B/68345B without Option 2A Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 1.
A-26 682XXB/683XXB MM 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68245B/68345B with Option 2A Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 1.
682XXB/683XXB MM A-27 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68245B/68345B with Option 15B High Power & without Option 2A Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 1.
A-28 682XXB/683XXB MM 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68245B/68345B with Option 15B High Power & Option 2A Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 1.
682XXB/683XXB MM A-29 3-12 Amplitude Modulation Test AM Imput Sensitivity Procedure Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the Modulation Analyzer AM PK(+) reading ........... Measure and record the Modulation Analyzer AM PK(–) reading .
A-30 682XXB/683XXB MM 3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level Rise Time, Fall Time, and Overshoot Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the following: Rise T ime ..................
682XXB/683XXB MM A-31 3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level (Continued) Pulse Level Accuracy (5 GHz, Pulse Width = 0.5 m s) Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Set pulse width W1 to 5.0 s Record the displayed output level L1 (step 5.
A-32 682XXB/683XXB MM 3-16 Pulse Modulation Test: RF On/Off Ratio Test Procedure (1 GHz) Lower Limit Measured V alue Upper Limit Set F1 to 1.10 GHz Measure and record the peak of the signal on the Spectrum Analyzer . (Measured signal must be >60 dB below top graticule to meet specification; this represents an On/Off Ratio of >80 dB.
ANRITSU Model 68245B/68345B Date: __________________________ Serial Number __________________ Calibrated By: __________________________ 682XXB/683XXB MM A-33 4-7 Preliminary Calibration Procedure Step Step Completion 1. Internal DVM Calibration (calterm1 19) .
A-34 682XXB/683XXB MM 4-10 ALC Slope Calibration (68345B having Firmware Version 1.00 and above) Procedure Step Step Completion 5. ALC Slope DAC adjustment ................................ ______________ 6. Store the DAC setting value(s) .............
682XXB/683XXB MM A-35 4-13 FM Calibration (68245B/68345B with Firmware Version 1.00) Procedure Step Step Completion 1. FM Meter Calibration (calterm 123) ............................ ______________ 2. FM Of fset Balance Calibration (calterm 126) .....
A-36 682XXB/683XXB MM TEST MODEL RECORD 68245B/68345B 4-14 Phase Modulation ( F M) Calibration (Option 6) Procedure Step Step Completion 1. External Wide M Mode Sensitivity Calibration (calterm 149) .............. ______________ 2. Internal Wide M Mode Sensitivity Calibration (calterm 151) .
ANRITSU Model 68247B/68347B Date: __________________________ Serial Number __________________ Tested By: __________________________ 682XXB/683XXB MM A-37 3-6 Internal Time Base Aging Rate Test Test Procedure Measured V alue Upper Limit Record frequency error value .
A-38 682XXB/683XXB MM TEST MODEL RECORD 68247B/68347B 3-7 Frequency Synthesis Tests Coarse Loop/YIG Loop Test Procedure Fine Loop Test Procedure (Standard 68X47B) T est Frequency (in GHz) Measured V alue * T est Frequency (in GHz) Measured V alue ** 1.
682XXB/683XXB MM A-39 3-8 Spurious Signals Test: RF Output Signals <2 GHz Test Procedure Measured V alue Upper Limit Set F1 to 10 MHz Record the presence of the worst case harmonic .......... Record the presence of the worst case non-harmonic .....
A-40 682XXB/683XXB MM TEST MODEL RECORD 68247B/68347B 3-9 Harmonic Test: RF Output Signals From 2 to 20 GHz Test Procedure (2 to 10 GHz) Measured V alue Upper Limit Set F1 to 2.1 GHz Record the level of all harmonics of the 2.1 GHz carrier: 4.2 GHz (2nd harmonic) .
682XXB/683XXB MM A-41 TEST MODEL RECORD 68247B/68347B 3-9 Harmonic Test: RF Output Signals From 2 to 20 GHz (Continued) Test Procedure (11 to 20 GHz) Measured V alue Upper Limit Set F1 to 12.4 GHz Record the level of all harmonics of the 12.4 GHz carrier: 24.
A-42 682XXB/683XXB MM TEST MODEL RECORD 68247B/68347B 3-10 Single Sideband Phase Noise Test Test Procedure Measured V alue Upper Limit Set F1 to 0.6 GHz Record the phase noise levels at these offsets: 100 Hz ............................... 1 kHz .....
682XXB/683XXB MM A-43 3-11 Power Level Accuracy and Flatness Tests (Model 68247B/68347B without Option 2A Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 1.
A-44 682XXB/683XXB MM 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68247B/68347B with Option 2A Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 1.
682XXB/683XXB MM A-45 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68247B/68347B with Option 15B High Power & without Option 2A Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 1.
A-46 682XXB/683XXB MM 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68247B/68347B with Option 15B High Power & Option 2A Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 1.
682XXB/683XXB MM A-47 3-12 Amplitude Modulation Test AM Imput Sensitivity Procedure Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the Modulation Analyzer AM PK(+) reading ........... Measure and record the Modulation Analyzer AM PK(–) reading .
A-48 682XXB/683XXB MM TEST MODEL RECORD 68247B/68347B 3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level Rise Time, Fall Time, and Overshoot Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the following: Rise T ime .
682XXB/683XXB MM A-49 TEST MODEL RECORD 68247B/68347B 3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level (Continued) Pulse Level Accuracy (5 GHz, Pulse Width = 0.5 m s) Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Set pulse width W1 to 5.
A-50 682XXB/683XXB MM TEST MODEL RECORD 68247B/68347B 3-16 Pulse Modulation Test: RF On/Off Ratio Test Procedure (1 GHz) Lower Limit Measured V alue Upper Limit Set F1 to 1.
ANRITSU Model 68247B/68347B Date: __________________________ Serial Number __________________ Calibrated By: __________________________ 682XXB/683XXB MM A-51 4-7 Preliminary Calibration Procedure Step Step Completion 1. Internal DVM Calibration (calterm1 19) .
A-52 682XXB/683XXB MM TEST MODEL RECORD 68247B/68347B 4-10 ALC Slope Calibration (68347B having Firmware Version 1.01 to 2.00) Procedure Step Step Completion 5. ALC Slope DAC adjustment for 2 GHz ......................... ______________ 9. ALC Slope DAC adjustment for >2 GHz .
682XXB/683XXB MM A-53 TEST MODEL RECORD 68247B/68347B 4-13 FM Calibration (68247B/68347B with Firmware Version 1.01 to 2.10) Procedure Step Step Completion 1. FM Meter Calibration (calterm 123) ............................ ______________ 2. FM Of fset Balance Calibration (calterm 126) .
A-54 682XXB/683XXB MM TEST MODEL RECORD 68247B/68347B 4-14 Phase Modulation ( F M) Calibration (Option 6) Procedure Step Step Completion 1. External Wide M Mode Sensitivity Calibration (calterm 149) .............. ______________ 2. Internal Wide M Mode Sensitivity Calibration (calterm 151) .
ANRITSU Model 68253B/68353B Date: __________________________ Serial Number __________________ Tested By: __________________________ 682XXB/683XXB MM A-55 3-6 Internal Time Base Aging Rate Test Test Procedure Measured V alue Upper Limit Record frequency error value .
A-56 682XXB/683XXB MM 3-7 Frequency Synthesis Tests Coarse Loop/YIG Loop Test Procedure T est Frequency (in GHz) Measured V alue * T est Frequency (in GHz) Measured V alue * 2.000 000 000 3.000 000 000 4.000 000 000 5.000 000 000 6.000 000 000 7.000 000 000 8.
682XXB/683XXB MM A-57 TEST MODEL RECORD 68253B/68353B 3-7 Frequency Synthesis Tests Fine Loop Test Procedure (Standard 68X53B) Fine Loop Test Procedure (68X53B with Option 11) T est Frequency (in GHz) Measured V alue ** T est Frequency (in GHz) Measured Value *** 2.
A-58 682XXB/683XXB MM TEST MODEL RECORD 68253B/68353B 3-9 Harmonic Test: RF Output Signals From 2 to 20 GHz Test Procedure (2 to 10 GHz) Measured V alue Upper Limit Set F1 to 2.1 GHz Record the level of all harmonics of the 2.1 GHz carrier: 4.2 GHz (2nd harmonic) .
682XXB/683XXB MM A-59 TEST MODEL RECORD 68253B/68353B 3-9 Harmonic Test: RF Output Signals From 2 to 20 GHz (Continued) Test Procedure (11 to 20 GHz) Measured V alue Upper Limit Set F1 to 12.4 GHz Record the level of all harmonics of the 12.4 GHz carrier: 24.
A-60 682XXB/683XXB MM TEST MODEL RECORD 68253B/68353B 3-10 Single Sideband Phase Noise Test Test Procedure Measured V alue Upper Limit Set F1 to 2.0 GHz Record the phase noise levels at these offsets: 100 Hz ............................... 1 kHz .....
682XXB/683XXB MM A-61 TEST MODEL RECORD 68253B/68353B 3-11 Power Level Accuracy and Flatness Tests (Model 68253B/68353B without Option 2A Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 5.
A-62 682XXB/683XXB MM TEST MODEL RECORD 68253B/68353B 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68253B/68353B with Option 2A Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 5.
682XXB/683XXB MM A-63 TEST MODEL RECORD 68253B/68353B 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68253B/68353B with Option 15B High Power & without Option 2A Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 5.0 GHz Set F1 to 22.
A-64 682XXB/683XXB MM TEST MODEL RECORD 68253B/68353B 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68253B/68353B with Option 15B High Power & Option 2A Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 5.0 GHz Set F1 to 22.
682XXB/683XXB MM A-65 TEST MODEL RECORD 68253B/68353B 3-12 Amplitude Modulation Test AM Imput Sensitivity Procedure Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the Modulation Analyzer AM PK(+) reading ........... Measure and record the Modulation Analyzer AM PK(–) reading .
A-66 682XXB/683XXB MM TEST MODEL RECORD 68253B/68353B 3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level Rise Time, Fall Time, and Overshoot Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the following: Rise T ime .
682XXB/683XXB MM A-67/A-68 TEST MODEL RECORD 68253B/68353B 3-15 Pulse Modulation Test: Video Feedthrough Test Procedure Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Set pulse width W1 to 5.0 s Set PRI (period) to 0.01 ms Measure and record the Video Feedthrough voltage spikes .
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ANRITSU Model 68253B/68353B Date: __________________________ Serial Number __________________ Calibrated By: __________________________ 682XXB/683XXB MM A-69 4-7 Preliminary Calibration Procedure Step Step Completion 1. Internal DVM Calibration (calterm1 19) .
A-70 682XXB/683XXB MM TEST MODEL RECORD 68253B/68353B 4-10 ALC Slope Calibration (68353B having Firmware Version 1.01 to 2.00) Procedure Step Step Completion 5. ALC Slope DAC adjustment for 2 GHz ( This step is not applicable to the 68353B) ..........
682XXB/683XXB MM A-71 TEST MODEL RECORD 68253B/68353B 4-13 FM Calibration (68253B/68353B with Firmware Version 1.01 to 2.10) Procedure Step Step Completion 1. FM Meter Calibration (calterm 123) ............................ ______________ 2. FM Of fset Balance Calibration (calterm 126) .
A-72 682XXB/683XXB MM TEST MODEL RECORD 68253B/68353B 4-14 Phase Modulation ( F M) Calibration (Option 6) Procedure Step Step Completion 1. External Wide M Mode Sensitivity Calibration (calterm 149) .............. ______________ 2. Internal Wide M Mode Sensitivity Calibration (calterm 151) .
ANRITSU Model 68255B/68355B Date: __________________________ Serial Number __________________ Tested By: __________________________ 682XXB/683XXB MM A-73 3-6 Internal Time Base Aging Rate Test Test Procedure Measured V alue Upper Limit Record frequency error value .
A-74 682XXB/683XXB MM 3-7 Frequency Synthesis Tests Coarse Loop/YIG Loop Test Procedure T est Frequency (in GHz) Measured V alue * T est Frequency (in GHz) Measured V alue * 1.000 000 000 2.000 000 000 3.000 000 000 4.000 000 000 5.000 000 000 6.000 000 000 7.
682XXB/683XXB MM A-75 3-7 Frequency Synthesis Tests Fine Loop Test Procedure (Standard 68X55B) Fine Loop Test Procedure (68X55B with Option 11) T est Frequency (in GHz) Measured V alue ** T est Frequency (in GHz) Measured V alue *** 1.000 001 000 1.000 002 000 1.
A-76 682XXB/683XXB MM 3-8 Spurious Signals Test: RF Output Signals £ 2.2 GHz Test Procedure Measured V alue Upper Limit Set F1 to 500 MHz Record the level of all harmonics of the 500 MHz carrier 1.0 GHz (2nd harmonic) ..................... 1.5 GHz (3rd harmonic) .
682XXB/683XXB MM A-77 3-9 Harmonic Test: RF Output Signals From 2.2 to 20 GHz Test Procedure (2.2 to 10 GHz) Measure V alue Upper Limit Set F1 to 2.4 GHz Record the level of all harmonics of the 2.4 GHz carrier: 4.8 GHz (2nd harmonic) ................
A-78 682XXB/683XXB MM Test Procedure (11 to 20 GHz) Measure V alue Upper Limit Set F1 to 12.4 GHz Record the level of all harmonics of the 12.4 GHz carrier: 24.8 GHz (2nd harmonic) ..................... 37.2 GHz (3rd harmonic) ...................... _______________dBc _______________dBc –60 dBc* –60 dBc* Set F1 to 16.
682XXB/683XXB MM A-79 3-10 Single Sideband Phase Noise Test (Continued) Test Procedure Measured V alue Upper Limit Set F1 to 6.0 GHz Record the phase noise levels at these offsets: 100 Hz ............................... 1 kHz .........................
A-80 682XXB/683XXB MM 3-11 Power Level Accuracy and Flatness Tests (Model 68255B/68355B without Option 2A Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 1.
682XXB/683XXB MM A-81 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68255B/68355B with Option 2A Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 1.
A-82 682XXB/683XXB MM 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68255B/68355B with Option 15B High Power & without Option 2A Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 1.0 GHz Set F1 to 5.0 GHz Set F1 to 22.
682XXB/683XXB MM A-83 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68255B/68355B with Option 15B High Power & Option 2A Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 1.
A-84 682XXB/683XXB MM 3-12 Amplitude Modulation Test AM Imput Sensitivity Procedure Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the Modulation Analyzer AM PK(+) reading ........... Measure and record the Modulation Analyzer AM PK(–) reading .
682XXB/683XXB MM A-85 3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level Rise Time, Fall Time, and Overshoot Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the following: Rise T ime ..................
A-86 682XXB/683XXB MM 3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level (Continued) Pulse Level Accuracy (5 GHz, Pulse Width = 0.5 m s) Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Set pulse width W1 to 5.0 s Record the displayed output level L1 (step 5.
682XXB/683XXB MM A-87/A-88 TEST MODEL RECORD 68255B/68355B 3-16 Pulse Modulation Test: RF On/Off Ratio Test Procedure (1 GHz) Lower Limit Measured V alue Upper Limit Set F1 to 1.10 GHz Measure and record the peak of the signal on the Spectrum Analyzer .
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ANRITSU Model 68255B/68355B Date: __________________________ Serial Number __________________ Calibrated By: __________________________ 682XXB/683XXB MM A-89 4-7 Preliminary Calibration Procedure Step Step Completion 1. Internal DVM Calibration (calterm1 19) .
A-90 682XXB/683XXB MM 4-10 ALC Slope Calibration (68355B having Firmware Version 1.00 and above) Procedure Step Step Completion 5. ALC Slope DAC adjustment ................................ ______________ 6. Store the DAC setting value(s) .............
682XXB/683XXB MM A-91 4-13 FM Calibration (68255B/68355B with Firmware Version 1.00) Procedure Step Step Completion 1. FM Meter Calibration (calterm 123) ............................ ______________ 2. FM Of fset Balance Calibration (calterm 126) .....
A-92 682XXB/683XXB MM TEST MODEL RECORD 68255B/68355B 4-14 Phase Modulation ( F M) Calibration (Option 6) Procedure Step Step Completion 1. External Wide Μ Μοδε Σενσιτιϖιτψ Χαλιβρατιον (χαλτερµ 149) .............. ______________ 2.
ANRITSU Model 68259B/68359B Date: __________________________ Serial Number __________________ Tested By: __________________________ 682XXB/683XXB MM A-93 3-6 Internal Time Base Aging Rate Test Test Procedure Measured V alue Upper Limit Record frequency error value .
A-94 682XXB/683XXB MM TEST MODEL RECORD 68259B/68359B 3-7 Frequency Synthesis Tests Coarse Loop/YIG Loop Test Procedure T est Frequency (in GHz) Measured V alue * T est Frequency (in GHz) Measured V alue * 1.000 000 000 2.000 000 000 3.000 000 000 4.000 000 000 5.
682XXB/683XXB MM A-95 TEST MODEL RECORD 68259B/68359B 3-7 Frequency Synthesis Tests Fine Loop Test Procedure (Standard 68X59B) Fine Loop Test Procedure (68X59B with Option 11) T est Frequency (in GHz) Measured V alue ** T est Frequency (in GHz) Measured V alue *** 1.
A-96 682XXB/683XXB MM 3-8 Spurious Signals Test: RF Output Signals <2 GHz Test Procedure Measured V alue Upper Limit Set F1 to 10 MHz Record the presence of the worst case harmonic .......... Record the presence of the worst case non-harmonic .....
682XXB/683XXB MM A-97 3-9 Harmonic Test: RF Output Signals From 2 to 20 GHz Test Procedure (2 to 10 GHz) Measure V alue Upper Limit Set F1 to 2.1 GHz Record the level of all harmonics of the 2.1 GHz carrier: 4.2 GHz (2nd harmonic) ....................
A-98 682XXB/683XXB MM 3-10 Single Sideband Phase Noise Test Test Procedure Measured V alue Upper Limit Set F1 to 0.6 GHz Record the phase noise levels at these offsets: 100 Hz ............................... 1 kHz .............................. 10 kHz .
682XXB/683XXB MM A-99 TEST MODEL RECORD 68259B/68359B 3-10 Single Sideband Phase Noise Test (Continued) Test Procedure Measured V alue Upper Limit Set F1 to 6.0 GHz Record the phase noise levels at these offsets: 100 Hz ...............................
A-100 682XXB/683XXB MM TEST MODEL RECORD 68259B/68359B 3-11 Power Level Accuracy and Flatness Tests (Model 68259B/68359B without Option 2A Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 1.
682XXB/683XXB MM A-101 TEST MODEL RECORD 68259B/68359B 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68259B/68359B with Option 2A Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 1.
A-102 682XXB/683XXB MM TEST MODEL RECORD 68259B/68359B 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68259B/68359B with Option 15B High Power & without Option 2A Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 1.0 GHz Set F1 to 5.
682XXB/683XXB MM A-103 TEST MODEL RECORD 68259B/68359B 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68259B/68359B with Option 15B High Power & Option 2A Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 1.0 GHz Set F1 to 5.
A-104 682XXB/683XXB MM TEST MODEL RECORD 68259B/68359B 3-12 Amplitude Modulation Test AM Imput Sensitivity Procedure Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the Modulation Analyzer AM PK(+) reading ........... Measure and record the Modulation Analyzer AM PK(–) reading .
682XXB/683XXB MM A-105 TEST MODEL RECORD 68259B/68359B 3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level Rise Time, Fall Time, and Overshoot Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the following: Rise T ime .
A-106 682XXB/683XXB MM TEST MODEL RECORD 68259B/68359B 3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level (Continued) Pulse Level Accuracy (5 GHz, Pulse Width = 0.5 m s) Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Set pulse width W1 to 5.
682XXB/683XXB MM A-107/A-108 TEST MODEL RECORD 68259B/68359B 3-16 Pulse Modulation Test: RF On/Off Ratio Test Procedure (1 GHz) Lower Limit Measured V alue Upper Limit Set F1 to 1.10 GHz Measure and record the peak of the signal on the Spectrum Analyzer .
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ANRITSU Model 68259B/68359B Date: __________________________ Serial Number __________________ Calibrated By: __________________________ 682XXB/683XXB MM A-109 4-7 Preliminary Calibration Procedure Step Step Completion 1. Internal DVM Calibration (calterm1 19) .
A-110 682XXB/683XXB MM TEST MODEL RECORD 68259B/68359B 4-10 ALC Slope Calibration (68359B having Firmware Version 1.01 to 2.00) Procedure Step Step Completion 5. ALC Slope DAC adjustment for 2 GHz ......................... ______________ 9. ALC Slope DAC adjustment for >2 GHz .
682XXB/683XXB MM A-111 4-13 FM Calibration (68259B/68359B with Firmware Version 1.01 to 2.10) Procedure Step Step Completion 1. FM Meter Calibration (calterm 123) ............................ ______________ 2. FM Of fset Balance Calibration (calterm 126) .
A-112 682XXB/683XXB MM TEST MODEL RECORD 68259B/68359B 4-14 Phase Modulation ( F M) Calibration (Option 6) Procedure Step Step Completion 1. External Wide M Mode Sensitivity Calibration (calterm 149) .............. ______________ 2. Internal Wide M Mode Sensitivity Calibration (calterm 151) .
ANRITSU Model 68263B/68363B Date: __________________________ Serial Number __________________ Tested By: __________________________ 682XXB/683XXB MM A-113 3-6 Internal Time Base Aging Rate Test Test Procedure Measured V alue Upper Limit Record frequency error value .
A-114 682XXB/683XXB MM TEST MODEL RECORD 68263B/68363B 3-7 Frequency Synthesis Tests Coarse Loop/YIG Loop Test Procedure T est Frequency (in GHz) Measured V alue * T est Frequency (in GHz) Measured V alue * 2.000 000 000 3.000 000 000 4.000 000 000 5.
682XXB/683XXB MM A-115 TEST MODEL RECORD 68263B/68363B 3-7 Frequency Synthesis Tests Fine Loop Test Procedure (Standard 68X63B) Fine Loop Test Procedure (68X63Bwith Option 11) T est Frequency (in GHz) Measured V alue ** T est Frequency (in GHz) Measured V alue *** 2.
A-116 682XXB/683XXB MM TEST MODEL RECORD 68263B/68363B 3-9 Harmonic Test: RF Output Signals From 2 to 20 GHz Test Procedure (2 to 10 GHz) Measured V alue Upper Limit Set F1 to 2.1 GHz Record the level of all harmonics of the 2.1 GHz carrier: 4.2 GHz (2nd harmonic) .
682XXB/683XXB MM A-117 TEST MODEL RECORD 68263B/68363B 3-9 Harmonic Test: RF Output Signals From 2 to 20 GHz (Continued) Test Procedure (11 to 20 GHz) Measured V alue Upper Limit Set F1 to 12.4 GHz Record the level of all harmonics of the 12.4 GHz carrier: 24.
A-118 682XXB/683XXB MM TEST MODEL RECORD 68263B/68363B 3-10 Single Sideband Phase Noise Test Test Procedure Measured V alue Upper Limit Set F1 to 2.0 GHz Record the phase noise levels at these offsets: 100 Hz ............................... 1 kHz ....
682XXB/683XXB MM A-119 TEST MODEL RECORD 68263B/68363B 3-11 Power Level Accuracy and Flatness Tests (Model 68263B/68363B without Option 2B Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 5.
A-120 682XXB/683XXB MM 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68263B/68363B with Option 2B Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 5.
682XXB/683XXB MM A-121 TEST MODEL RECORD 68263B/68363B 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68263B/68363B with Option 15B High Power & without Option 2B Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 5.0 GHz Set F1 to 25.
A-122 682XXB/683XXB MM TEST MODEL RECORD 68263B/68363B 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68263B/68363B with Option 15B High Power & Option 2B Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 5.0 GHz Set F1 to 25.
682XXB/683XXB MM A-123 TEST MODEL RECORD 68263B/68363B 3-12 Amplitude Modulation Test AM Imput Sensitivity Procedure Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the Modulation Analyzer AM PK(+) reading ........... Measure and record the Modulation Analyzer AM PK(–) reading .
A-124 682XXB/683XXB MM TEST MODEL RECORD 68263B/68363B 3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level Rise Time, Fall Time, and Overshoot Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the following: Rise T ime .
682XXB/683XXB MM A-125/A-126 TEST MODEL RECORD 68263B/68363B 3-15 Pulse Modulation Test: Video Feedthrough Test Procedure Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Set pulse width W1 to 5.0 s Set PRI (period) to 0.01 ms Measure and record the Video Feedthrough voltage spikes .
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ANRITSU Model 68263B/68363B Date: __________________________ Serial Number __________________ Calibrated By: __________________________ 682XXB/683XXB MM A-127 4-7 Preliminary Calibration Procedure Step Step Completion 1. Internal DVM Calibration (calterm1 19) .
A-128 682XXB/683XXB MM TEST MODEL RECORD 68263B/68363B 4-10 ALC Slope Calibration (68363B having Firmware Version 1.01 to 2.00) Procedure Step Step Completion 5. ALC Slope DAC adjustment for 2 GHz ( This step is not applicable to the 68363B ) ........
682XXB/683XXB MM A-129 TEST MODEL RECORD 68263B/68363B 4-13 FM Calibration (68263B/68363B with Firmware Version 1.01 to 2.10) Procedure Step Step Completion 1. FM Meter Calibration (calterm 123) ............................ ______________ 2. FM Of fset Balance Calibration (calterm 126) .
A-130 682XXB/683XXB MM TEST MODEL RECORD 68263B/68363B 4-14 Phase Modulation ( F M) Calibration (Option 6) Procedure Step Step Completion 1. External Wide M Mode Sensitivity Calibration (calterm 149) .............. ______________ 2. Internal Wide M Mode Sensitivity Calibration (calterm 151) .
ANRITSU Model 68265B/68365B Date: __________________________ Serial Number __________________ Tested By: __________________________ 682XXB/683XXB MM A-131 3-6 Internal Time Base Aging Rate Test Test Procedure Measured V alue Upper Limit Record frequency error value .
A-132 682XXB/683XXB MM 3-7 Frequency Synthesis Tests Coarse Loop/YIG Loop Test Procedure T est Frequency (in GHz) Measured V alue * T est Frequency (in GHz) Measured V alue * 1.000 000 000 2.000 000 000 3.000 000 000 4.000 000 000 5.000 000 000 6.000 000 000 7.
682XXB/683XXB MM A-133 3-7 Frequency Synthesis Tests Fine Loop Test Procedure (Standard 68X65B) Fine Loop Test Procedure (68X65B with Option 11) T est Frequency (in Ghz) Measured Value ** T est Frequency (in Ghz) Measured V alue *** 1.000 001 000 1.000 002 000 1.
A-134 682XXB/683XXB MM 3-8 Spurious Signals Test: RF Output Signals £ 2.2 GHz Test Procedure Measured V alue Upper Limit Set F1 to 500 MHz Record the level of all harmonics of the 500 MHz carrier 1.0 GHz (2nd harmonic) ..................... 1.5 GHz (3rd harmonic) .
682XXB/683XXB MM A-135 3-9 Harmonic Test: RF Output Signals From 2.2 to 20 GHz Test Procedure (2.2 to 10 GHz) Measure V alue Upper Limit Set F1 to 2.4 GHz Record the level of all harmonics of the 2.4 GHz carrier: 4.8 GHz (2nd harmonic) ...............
A-136 682XXB/683XXB MM 3-9 Harmonic Test: RF Output Signals From 2.2 to 20 GHz (Continued) Test Procedure (11 to 20 GHz) Measure V alue Upper Limit Set F1 to 12.4 GHz Record the level of all harmonics of the 12.4 GHz carrier: 24.8 GHz (2nd harmonic) .
682XXB/683XXB MM A-137 3-10 Single Sideband Phase Noise Test (Continued) Test Procedure Measured V alue Upper Limit Set F1 to 6.0 GHz Record the phase noise levels at these offsets: 100 Hz ............................... 1 kHz ........................
A-138 682XXB/683XXB MM 3-11 Power Level Accuracy and Flatness Tests (Model 68265B/68365B without Option 2B Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 1.
682XXB/683XXB MM A-139 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68265B/68365B with Option 2B Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 1.
A-140 682XXB/683XXB MM 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68265B/68365B with Option 15B High Power & without Option 2B Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 1.0 GHz Set F1 to 5.0 GHz Set F1 to 25.
682XXB/683XXB MM A-141 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68265B/68365B with Option 15B High Power & Option 2B Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 1.
A-142 682XXB/683XXB MM 3-12 Amplitude Modulation Test AM Imput Sensitivity Procedure Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the Modulation Analyzer AM PK(+) reading ........... Measure and record the Modulation Analyzer AM PK(–) reading .
682XXB/683XXB MM A-143 3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level Rise Time, Fall Time, and Overshoot Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the following: Rise T ime .................
A-144 682XXB/683XXB MM 3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level (Continued) Pulse Level Accuracy (5 GHz, Pulse Width = 0.5 m s) Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Set pulse width W1 to 5.0 s Record the displayed output level L1 (step 5.
682XXB/683XXB MM A-145/A-146 TEST MODEL RECORD 68265B/68365B 3-16 Pulse Modulation Test: RF On/Off Ratio Test Procedure (1 GHz) Lower Limit Measured V alue Upper Limit Set F1 to 1.10 GHz Measure and record the peak of the signal on the Spectrum Analyzer .
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ANRITSU Model 68265B/68365B Date: __________________________ Serial Number __________________ Calibrated By: __________________________ 682XXB/683XXB MM A-147 4-7 Preliminary Calibration Procedure Step Step Completion 1. Internal DVM Calibration (calterm1 19) .
A-148 682XXB/683XXB MM 4-10 ALC Slope Calibration (68365B having Firmware Version 1.00 and above) Procedure Step Step Completion 5. ALC Slope DAC adjustment ................................ ______________ 6. Store the DAC setting value(s) ............
682XXB/683XXB MM A-149 4-13 FM Calibration (68265B/68365B with Firmware Version 1.00) Procedure Step Step Completion 1. FM Meter Calibration (calterm 123) ............................ ______________ 2. FM Of fset Balance Calibration (calterm 126) ....
A-150 682XXB/683XXB MM TEST MODEL RECORD 68265B/68365B 4-14 Phase Modulation ( F M) Calibration (Option 6) Procedure Step Step Completion 1. External Wide M Mode Sensitivity Calibration (calterm 149) .............. ______________ 2. Internal Wide M Mode Sensitivity Calibration (calterm 151) .
ANRITSU Model 68269B/68369B Date: __________________________ Serial Number __________________ Tested By: __________________________ 682XXB/683XXB MM A-151 3-6 Internal Time Base Aging Rate Test Test Procedure Measured V alue Upper Limit Record frequency error value .
A-152 682XXB/683XXB MM TEST MODEL RECORD 68269B/68369B 3-7 Frequency Synthesis Tests Coarse Loop/YIG Loop Test Procedure T est Frequency (in GHz) Measured V alue * T est Frequency (in GHz) Measured V alue * 1.000 000 000 2.000 000 000 3.000 000 000 4.
682XXB/683XXB MM A-153 TEST MODEL RECORD 68269B/68369B 3-7 Frequency Synthesis Tests Fine Loop Test Procedure (Standard 68X69B) Fine Loop Test Procedure (68X69B with Option 11) T est Frequency (in Ghz) Measured V alue ** T est Frequency (in Ghz) Measured V alue *** 1.
A-154 682XXB/683XXB MM TEST MODEL RECORD 68269B/68369B 3-8 Spurious Signals Test: RF Output Signals <2 GHz Test Procedure Measured V alue Upper Limit Set F1 to 10 MHz Record the presence of the worst case harmonic .......... Record the presence of the worst case non-harmonic .
682XXB/683XXB MM A-155 TEST MODEL RECORD 68269B/68369B 3-9 Harmonic Test: RF Output Signals From 2 to 20 GHz Test Procedure (2 to 10 GHz) Measure V alue Upper Limit Set F1 to 2.1 GHz Record the level of all harmonics of the 2.1 GHz carrier: 4.2 GHz (2nd harmonic) .
A-156 682XXB/683XXB MM TEST MODEL RECORD 68269B/68369B 3-10 Single Sideband Phase Noise Test Test Procedure Measured V alue Upper Limit Set F1 to 0.6 GHz Record the phase noise levels at these offsets: 100 Hz ............................... 1 kHz ....
682XXB/683XXB MM A-157 TEST MODEL RECORD 68269B/68369B 3-10 Single Sideband Phase Noise Test (Continued) Test Procedure Measured V alue Upper Limit Set F1 to 6.0 GHz Record the phase noise levels at these offsets: 100 Hz ..............................
A-158 682XXB/683XXB MM 3-11 Power Level Accuracy and Flatness Tests (Model 68269B/68369B without Option 2B Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 1.
682XXB/683XXB MM A-159 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68269B/68369B with Option 2B Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 1.
A-160 682XXB/683XXB MM TEST MODEL RECORD 68269B/68369B 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68269B/68369B with Option 15B High Power & without Option 2B Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 1.0 GHz Set F1 to 5.
682XXB/683XXB MM A-161 TEST MODEL RECORD 68269B/68369B 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68269B/68369B with Option 15B High Power & Option 2B Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 1.0 GHz Set F1 to 5.
A-162 682XXB/683XXB MM TEST MODEL RECORD 68269B/68369B 3-12 Amplitude Modulation Test AM Imput Sensitivity Procedure Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the Modulation Analyzer AM PK(+) reading ........... Measure and record the Modulation Analyzer AM PK(–) reading .
682XXB/683XXB MM A-163 TEST MODEL RECORD 68269B/68369B 3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level Rise Time, Fall Time, and Overshoot Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the following: Rise T ime .
A-164 682XXB/683XXB MM TEST MODEL RECORD 68269B/68369B 3-15 Pulse Modulation Test: Video Feedthrough Test Procedure Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Set pulse width W1 to 5.0 s Set PRI (period) to 0.01 ms Measure and record the Video Feedthrough voltage spikes .
682XXB/683XXB MM A-165/A-166 TEST MODEL RECORD 68269B/68369B 3-16 Pulse Modulation Test: RF On/Off Ratio Test Procedure (1 GHz) Lower Limit Measured V alue Upper Limit Set F1 to 1.10 GHz Measure and record the peak of the signal on the Spectrum Analyzer .
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ANRITSU Model 68269B/68369B Date: __________________________ Serial Number __________________ Calibrated By: __________________________ 682XXB/683XXB MM A-167 4-7 Preliminary Calibration Procedure Step Step Completion 1. Internal DVM Calibration (calterm1 19) .
A-168 682XXB/683XXB MM TEST MODEL RECORD 68269B/68369B 4-10 ALC Slope Calibration (68369B having Firmware Version 1.01 to 2.00) Procedure Step Step Completion 5. ALC Slope DAC adjustment for 2 GHz .......................... ______________ 9. ALC Slope DAC adjustment for >2 GHz .
682XXB/683XXB MM A-169 TEST MODEL RECORD 68269B/68369B 4-13 FM Calibration (68269B/68369B with Firmware Version 1.01 to 2.10) Procedure Step Step Completion 1. FM Meter Calibration (calterm 123) ............................ ______________ 2. FM Of fset Balance Calibration (calterm 126) .
A-170 682XXB/683XXB MM TEST MODEL RECORD 68269B/68369B 4-14 Phase Modulation ( F M) Calibration (Option 6) Procedure Step Step Completion 1. External Wide M Mode Sensitivity Calibration (calterm 149) .............. ______________ 2. Internal Wide M Mode Sensitivity Calibration (calterm 151) .
ANRITSU Model 68275B/68375B Date: __________________________ Serial Number __________________ Tested By: __________________________ 682XXB/683XXB MM A-171 3-6 Internal Time Base Aging Rate Test Test Procedure Measured V alue Upper Limit Record frequency error value .
A-172 682XXB/683XXB MM TEST MODEL RECORD 68275B/68375B 3-7 Frequency Synthesis Tests Coarse Loop/YIG Loop Test Procedure T est Frequency (in GHz) Measured V alue * T est Frequency (in GHz) Measured V alue * 1.000 000 000 2.000 000 000 3.000 000 000 4.
682XXB/683XXB MM A-173 3-7 Frequency Synthesis Tests Fine Loop Test Procedure (Standard 68X75B) Fine Loop Test Procedure (68X75B with Option 11) T est Frequency (in Ghz) Measured V alue ** T est Frequency (in Ghz) Measured V alue *** 1.000 001 000 1.000 002 000 1.
A-174 682XXB/683XXB MM 3-8 Spurious Signals Test: RF Output Signals £ 2.2 GHz Test Procedure Measured V alue Upper Limit Set F1 to 500 MHz Record the level of all harmonics of the 500 MHz carrier 1.0 GHz (2nd harmonic) ..................... 1.5 GHz (3rd harmonic) .
682XXB/683XXB MM A-175 3-9 Harmonic Test: RF Output Signals From 2.2 to 20 GHz Test Procedure (2.2 to 10 GHz) Measure V alue Upper Limit Set F1 to 2.4 GHz Record the level of all harmonics of the 2.4 GHz carrier: 4.8 GHz (2nd harmonic) ...............
A-176 682XXB/683XXB MM 3-10 Single Sideband Phase Noise Test Test Procedure Measured V alue Upper Limit Set F1 to 0.6 GHz Record the phase noise levels at these offsets: 100 Hz ............................... 1 kHz .............................. 10 kHz .
682XXB/683XXB MM A-177 3-10 Single Sideband Phase Noise Test (Continued) Test Procedure Measured V alue Upper Limit Set F1 to 26.5 GHz Record the phase noise levels at these offsets: 100 Hz ............................... 1 kHz .......................
A-178 682XXB/683XXB MM 3-11 Power Level Accuracy and Flatness Tests (Model 68275B/68375B without Option 2C Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 5.
682XXB/683XXB MM A-179 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68275B/68375B with Option 2C Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 5.0 GHz Set F1 to 25.0 GHz Set F1 to 45.0 GHz Set L1 to: Measured Power * Set L1 to: Measured Power * Set L1 to: Measured Power * + 8.
A-180 682XXB/683XXB MM 3-12 Amplitude Modulation Test AM Imput Sensitivity Procedure Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the Modulation Analyzer AM PK(+) reading ........... Measure and record the Modulation Analyzer AM PK(–) reading .
682XXB/683XXB MM A-181 3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level Rise Time, Fall Time, and Overshoot Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the following: Rise T ime .................
A-182 682XXB/683XXB MM 3-15 Pulse Modulation Test: Video Feedthrough Test Procedure Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Set pulse width W1 to 5.0 s Set PRI (period) to 0.01 ms Measure and record the Video Feedthrough voltage spikes .
682XXB/683XXB MM A-183/A-184 TEST MODEL RECORD 68275B/68375B 3-16 Pulse Modulation Test: RF On/Off Ratio Test Procedure (1 GHz) Lower Limit Measured V alue Upper Limit Set F1 to 1.10 GHz Measure and record the peak of the signal on the Spectrum Analyzer .
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ANRITSU Model 68275B/68375B Date: __________________________ Serial Number __________________ Calibrated By: __________________________ 682XXB/683XXB MM A-185 4-7 Preliminary Calibration Procedure Step Step Completion 1. Internal DVM Calibration (calterm1 19) .
A-186 682XXB/683XXB MM 4-10 ALC Slope Calibration (68375B having Firware Version 1.00 and above) Procedure Step Step Completion 5. ALC Slope DAC adjustment ................................ ______________ 6. Store the DAC setting value(s) .............
682XXB/683XXB MM A-187 4-13 FM Calibration (68275B/68375B with Firmware Version 1.00) Procedure Step Step Completion 1. FM Meter Calibration (calterm 123) ............................ ______________ 2. FM Of fset Balance Calibration (calterm 126) ....
A-188 682XXB/683XXB MM TEST MODEL RECORD 68275B/68375B 4-14 Phase Modulation ( F M) Calibration (Option 6) Procedure Step Step Completion 1. External Wide M Mode Sensitivity Calibration (calterm 149) .............. ______________ 2. Internal Wide M Mode Sensitivity Calibration (calterm 151) .
ANRITSU Model 68277B/68377B Date: __________________________ Serial Number __________________ Tested By: __________________________ 682XXB/683XXB MM A-189 3-6 Internal Time Base Aging Rate Test Test Procedure Measured V alue Upper Limit Record frequency error value .
A-190 682XXB/683XXB MM 3-7 Frequency Synthesis Tests Coarse Loop/YIG Loop Test Procedure T est Frequency (in GHz) Measured V alue * T est Frequency (in GHz) Measured V alue * 1.000 000 000 2.000 000 000 3.000 000 000 4.000 000 000 5.000 000 000 6.000 000 000 7.
682XXB/683XXB MM A-191 TEST MODEL RECORD 68277B/68377B 3-7 Frequency Synthesis Tests Fine Loop Test Procedure (Standard 68X77B) Fine Loop Test Procedure (68X77B with Option 11) T est Frequency (in Ghz) Measured V alue ** T est Frequency (in Ghz) Measured V alue *** 1.
A-192 682XXB/683XXB MM TEST MODEL RECORD 68277B/68377B 3-8 Spurious Signals Test: RF Output Signals <2 GHz Test Procedure Measured V alue Upper Limit Set F1 to 10 MHz Record the presence of the worst case harmonic .......... Record the presence of the worst case non-harmonic .
682XXB/683XXB MM A-193 TEST MODEL RECORD 68277B/68377B 3-9 Harmonic Test: RF Output Signals From 2 to 20 GHz Test Procedure (2 to 10 GHz) Measure V alue Upper Limit Set F1 to 2.1 GHz Record the level of all harmonics of the 2.1 GHz carrier: 4.2 GHz (2nd harmonic) .
A-194 682XXB/683XXB MM TEST MODEL RECORD 68277B/68377B 3-10 Single Sideband Phase Noise Test Test Procedure Measured V alue Upper Limit Set F1 to 0.6 GHz Record the phase noise levels at these offsets: 100 Hz ............................... 1 kHz ....
682XXB/683XXB MM A-195 3-10 Single Sideband Phase Noise Test (Continued) Test Procedure Measured V alue Upper Limit Set F1 to 26.5 GHz Record the phase noise levels at these offsets: 100 Hz ............................... 1 kHz .......................
A-196 682XXB/683XXB MM TEST MODEL RECORD 68277B/68377B 3-11 Power Level Accuracy and Flatness Tests (Model 68277B/68377B without Option 2C Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 5.
682XXB/683XXB MM A-197 TEST MODEL RECORD 68277B/68377B 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68277B/68377B with Option 2C Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 5.0 GHz Set F1 to 25.0 GHz Set F1 to 45.
A-198 682XXB/683XXB MM 3-12 Amplitude Modulation Test AM Imput Sensitivity Procedure Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the Modulation Analyzer AM PK(+) reading ........... Measure and record the Modulation Analyzer AM PK(–) reading .
682XXB/683XXB MM A-199 TEST MODEL RECORD 68277B/68377B 3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level Rise Time, Fall Time, and Overshoot Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the following: Rise T ime .
A-200 682XXB/683XXB MM TEST MODEL RECORD 68277B/68377B 3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level (Continued) Pulse Level Accuracy (5 GHz, Pulse Width = 0.5 m s) Lower Limit Measured Value Upper Limit Set F1 to 5.0 GHz Set pulse width W1 to 5.
682XXB/683XXB MM A-201/A-202 TEST MODEL RECORD 68277B/68377B 3-16 Pulse Modulation Test: RF On/Off Ratio Test Procedure (1 GHz) Lower Limit Measured V alue Upper Limit Set F1 to 1.10 GHz Measure and record the peak of the signal on the Spectrum Analyzer .
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ANRITSU Model 68277B/68377B Date: __________________________ Serial Number __________________ Calibrated By: __________________________ 682XXB/683XXB MM A-203 4-7 Preliminary Calibration Procedure Step Step Completion 1. Internal DVM Calibration (calterm1 19) .
A-204 682XXB/683XXB MM TEST MODEL RECORD 68277B/68377B 4-10 ALC Slope Calibration (68377B having Firmware Version 1.01 to 2.00) Procedure Step Step Completion 5. ALC Slope DAC adjustment for 2 GHz .......................... ______________ 9. ALC Slope DAC adjustment for >2 GHz .
682XXB/683XXB MM A-205 TEST MODEL RECORD 68277B/68377B 4-13 FM Calibration (68277B/68377B with Firmware Version 1.01 to 2.10) Procedure Step Step Completion 1. FM Meter Calibration (calterm 123) ............................ ______________ 2. FM Of fset Balance Calibration (calterm 126) .
A-206 682XXB/683XXB MM TEST MODEL RECORD 68277B/68377B 4-14 Phase Modulation ( F M) Calibration (Option 6) Procedure Step Step Completion 1. External Wide M Mode Sensitivity Calibration (calterm 149) .............. ______________ 2. Internal Wide M Mode Sensitivity Calibration (calterm 151) .
ANRITSU Model 68285B/68385B Date: __________________________ Serial Number __________________ Tested By: __________________________ 682XXB/683XXB MM A-207 3-6 Internal Time Base Aging Rate Test Test Procedure Measured V alue Upper Limit Record frequency error value .
A-208 682XXB/683XXB MM TEST MODEL RECORD 68285B/68385B 3-7 Frequency Synthesis Tests Coarse Loop/YIG Loop Test Procedure T est Frequency (in GHz) Measured V alue * T est Frequency (in GHz) Measured Value * 1.000 000 000 2.000 000 000 3.000 000 000 4.000 000 000 5.
682XXB/683XXB MM A-209 3-7 Frequency Synthesis Tests (Continued) Coarse Loop/YIG Loop Test Procedure (Continued) T est Frequency (in GHz) Measured Value * T est Frequency (in GHz) Measured V alue * 51.000 000 000 52.000 000 000 53.000 000 000 54.000 000 000 55.
A-210 682XXB/683XXB MM 3-8 Spurious Signals Test: RF Output Signals £ 2.2 GHz Test Procedure Measured V alue Upper Limit Set F1 to 500 MHz Record the level of all harmonics of the 500 MHz carrier 1.0 GHz (2nd harmonic) ..................... 1.5 GHz (3rd harmonic) .
682XXB/683XXB MM A-211 3-9 Harmonic Test: RF Output Signals From 2.2 to 20 GHz Test Procedure (2.2 to 10 GHz) Measure V alue Upper Limit Set F1 to 2.4 GHz Record the level of all harmonics of the 2.4 GHz carrier: 4.8 GHz (2nd harmonic) ...............
A-212 682XXB/683XXB MM 3-10 Single Sideband Phase Noise Test Test Procedure Measured V alue Upper Limit Set F1 to 0.6 GHz Record the phase noise levels at these offsets: 100 Hz ............................... 1 kHz .............................. 10 kHz .
682XXB/683XXB MM A-213 3-10 Single Sideband Phase Noise Test (Continued) Test Procedure Measured V alue Upper Limit Set F1 to 26.5 GHz Record the phase noise levels at these offsets: 100 Hz ............................... 1 kHz .......................
A-214 682XXB/683XXB MM 3-11 Power Level Accuracy and Flatness Tests (Model 68285B/68385B without Option 2D Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 5.
682XXB/683XXB MM A-215 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68285B/68385B with Option 2D Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 5.0 GHz Set F1 to 25.0 GHz Set F1 to 55.0 GHz Set L1 to: Measured Power * Set L1 to: Measured Power * Set L1 to: Measured Power * + 8.
A-216 682XXB/683XXB MM 3-12 Amplitude Modulation Test AM Imput Sensitivity Procedure Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the Modulation Analyzer AM PK(+) reading ........... Measure and record the Modulation Analyzer AM PK(–) reading .
682XXB/683XXB MM A-217 3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level Rise Time, Fall Time, and Overshoot Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the following: Rise T ime .................
A-218 682XXB/683XXB MM 3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level (Continued) Pulse Level Accuracy (5 GHz, Pulse Width = 0.5 m s) Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Set pulse width W1 to 5.0 s Record the displayed output level L1 (step 5.
682XXB/683XXB MM A-219/A-220 TEST MODEL RECORD 68285B/68385B 3-16 Pulse Modulation Test: RF On/Off Ratio Test Procedure (1 GHz) Lower Limit Measured V alue Upper Limit Set F1 to 1.10 GHz Measure and record the peak of the signal on the Spectrum Analyzer .
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ANRITSU Model 68285B/68385B Date: __________________________ Serial Number __________________ Calibrated By: __________________________ 682XXB/683XXB MM A-221 4-7 Preliminary Calibration Procedure Step Step Completion 1. Internal DVM Calibration (calterm1 19) .
A-222 682XXB/683XXB MM 4-9 RF Level Calibration This calibration is performed using an automatic test system. Contact ANRITSU Customer Service for further information. 4-10 ALC Slope Calibration (68385B having Firmware Version 1.00 and above) Procedure Step Step Completion 5.
682XXB/683XXB MM A-223 4-13 FM Calibration (68285B/68385B with Firmware Version 1.00) Procedure Step Step Completion 1. FM Meter Calibration (calterm 123) ............................ ______________ 2. FM Of fset Balance Calibration (calterm 126) ....
A-224 682XXB/683XXB MM TEST MODEL RECORD 68285B/68385B 4-14 Phase Modulation ( F M) Calibration (Option 6) Procedure Step Step Completion 1. External Wide M Mode Sensitivity Calibration (calterm 149) .............. ______________ 2. Internal Wide M Mode Sensitivity Calibration (calterm 151) .
ANRITSU Model 68287B/68387B Date: __________________________ Serial Number __________________ Tested By: __________________________ 682XXB/683XXB MM A-225 3-6 Internal Time Base Aging Rate Test Test Procedure Measured V alue Upper Limit Record frequency error value .
A-226 682XXB/683XXB MM TEST MODEL RECORD 68287B/68387B 3-7 Frequency Synthesis Tests Coarse Loop/YIG Loop Test Procedure T est Frequency (in GHz) Measured V alue * T est Frequency (in GHz) Measured V alue * 1.000 000 000 2.000 000 000 3.000 000 000 4.
682XXB/683XXB MM A-227 3-7 Frequency Synthesis Tests (Continued) Coarse Loop/YIG Loop Test Procedure (Continued) T est Frequency (in GHz) Measured V alue * T est Frequency (in GHz) Measured V alue * 51.000 000 000 52.000 000 000 53.000 000 000 54.000 000 000 55.
A-228 682XXB/683XXB MM TEST MODEL RECORD 68287B/68387B 3-8 Spurious Signals Test: RF Output Signals <2 GHz Test Procedure Measured V alue Upper Limit Set F1 to 10 MHz Record the presence of the worst case harmonic .......... Record the presence of the worst case non-harmonic .
682XXB/683XXB MM A-229 TEST MODEL RECORD 68287B/68387B 3-9 Harmonic Test: RF Output Signals From 2 to 20 GHz Test Procedure (2 to 10 GHz) Measure V alue Upper Limit Set F1 to 2.1 GHz Record the level of all harmonics of the 2.1 GHz carrier: 4.2 GHz (2nd harmonic) .
A-230 682XXB/683XXB MM TEST MODEL RECORD 68287B/68387B 3-10 Single Sideband Phase Noise Test Test Procedure Measured V alue Upper Limit Set F1 to 0.6 GHz Record the phase noise levels at these offsets: 100 Hz ............................... 1 kHz ....
682XXB/683XXB MM A-231 3-10 Single Sideband Phase Noise Test (Continued) Test Procedure Measured V alue Upper Limit Set F1 to 26.5 GHz Record the phase noise levels at these offsets: 100 Hz ............................... 1 kHz .......................
A-232 682XXB/683XXB MM TEST MODEL RECORD 68287B/68387B 3-11 Power Level Accuracy and Flatness Tests (Model 68287B/68387B without Option 2D Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 5.
682XXB/683XXB MM A-233 TEST MODEL RECORD 68287B/68387B 3-11 Power Level Accuracy and Flatness Tests (Continued) (Model 68287B/68387B with Option 2D Step Attenuator) Power Level Accuracy Test Procedure Set F1 to 5.0 GHz Set F1 to 25.0 GHz Set F1 to 55.
A-234 682XXB/683XXB MM TEST MODEL RECORD 68287B/68387B 3-12 Amplitude Modulation Test AM Imput Sensitivity Procedure Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the Modulation Analyzer AM PK(+) reading ........... Measure and record the Modulation Analyzer AM PK(–) reading .
682XXB/683XXB MM A-235 TEST MODEL RECORD 68287B/68387B 3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level Rise Time, Fall Time, and Overshoot Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the following: Rise T ime .
A-236 682XXB/683XXB MM TEST MODEL RECORD 68287B/68387B 3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level (Continued) Pulse Level Accuracy (5 GHz, Pulse Width = 0.5 m s) Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Set pulse width W1 to 5.
682XXB/683XXB MM A-237/A-238 TEST MODEL RECORD 68287B/68387B 3-16 Pulse Modulation Test: RF On/Off Ratio Test Procedure (1 GHz) Lower Limit Measured V alue Upper Limit Set F1 to 1.10 GHz Measure and record the peak of the signal on the Spectrum Analyzer .
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ANRITSU Model 68287B/68387B Date: __________________________ Serial Number __________________ Calibrated By: __________________________ 682XXB/683XXB MM A-239 4-7 Preliminary Calibration Procedure Step Step Completion 1. Internal DVM Calibration (calterm1 19) .
A-240 682XXB/683XXB MM TEST MODEL RECORD 68287B/68387B 4-10 ALC Slope Calibration (68387B having Firmware Version 2.00 and above) Procedure Step Step Completion 5. ALC Slope DAC adjustment ................................ ______________ 6. Store the DAC setting value(s) .
682XXB/683XXB MM A-241 TEST MODEL RECORD 68287B/68387B 4-13 FM Calibration (68287B/68387B with Firmware Version 1.01 to 2.10) Procedure Step Step Completion 1. FM Meter Calibration (calterm 123) ............................ ______________ 2. FM Of fset Balance Calibration (calterm 126) .
A-242 682XXB/683XXB MM TEST MODEL RECORD 68287B/68387B 4-14 Phase Modulation ( F M) Calibration (Option 6) Procedure Step Step Completion 1. External Wide M Mode Sensitivity Calibration (calterm 149) .............. ______________ 2. Internal Wide M Mode Sensitivity Calibration (calterm 151) .
ANRITSU Model 68295B/68395B Date: __________________________ Serial Number __________________ Tested By: __________________________ 682XXB/683XXB MM A-243 3-6 Internal Time Base Aging Rate Test Test Procedure Measured V alue Upper Limit Record frequency error value .
A-244 682XXB/683XXB MM 3-7 Frequency Synthesis Tests Coarse Loop/YIG Loop Test Procedure T est Frequency (in GHz) Measured V alue * T est Frequency (in GHz) Measured V alue * 1.000 000 000 2.000 000 000 3.000 000 000 4.000 000 000 5.000 000 000 6.000 000 000 7.
682XXB/683XXB MM A-245 3-7 Frequency Synthesis Tests (Continued) Coarse Loop/YIG Loop Test Procedure (Continued) T est Frequency (in GHz) Measured V alue * T est Frequency (in GHz) Measured V alue * 51.000 000 000 52.000 000 000 53.000 000 000 54.000 000 000 55.
A-246 682XXB/683XXB MM 3-8 Spurious Signals Test: RF Output Signals 2.2 GHz Test Procedure Measured V alue Upper Limit Set F1 to 500 MHz Record the level of all harmonics of the 500 MHz carrier 1.0 GHz (2nd harmonic) ..................... 1.5 GHz (3rd harmonic) .
682XXB/683XXB MM A-247 3-9 Harmonic Test: RF Output Signals From 2.2 to 20 GHz Test Procedure (2.2 to 10 GHz) Measure V alue Upper Limit Set F1 to 2.4 GHz Record the level of all harmonics of the 2.4 GHz carrier: 4.8 GHz (2nd harmonic) ...............
A-248 682XXB/683XXB MM TEST MODEL RECORD 68295B/68395B 3-10 Single Sideband Phase Noise Test Test Procedure Measured V alue Upper Limit Set F1 to 0.6 GHz Record the phase noise levels at these offsets: 100 Hz ............................... 1 kHz ....
682XXB/683XXB MM A-249 3-10 Single Sideband Phase Noise Test (Continued) Test Procedure Measured V alue Upper Limit Set F1 to 26.5 GHz Record the phase noise levels at these offsets: 100 Hz ............................... 1 kHz .......................
A-250 682XXB/683XXB MM 3-11 Power Level Accuracy and Flatness Tests (Model 68295B/68395B) Power Level Accuracy Test Procedure Set F1 to 5.0 GHz Set F1 to 25.
682XXB/683XXB MM A-251 3-12 Amplitude Modulation Test AM Imput Sensitivity Procedure Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the Modulation Analyzer AM PK(+) reading ........... Measure and record the Modulation Analyzer AM PK(–) reading .
A-252 682XXB/683XXB MM 3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level Rise Time, Fall Time, and Overshoot Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the following: Rise T ime .................
682XXB/683XXB MM A-253 3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level (Continued) Pulse Level Accuracy (5 GHz, Pulse Width = 0.5 m s) Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Set pulse width W1 to 5.0 s Record the displayed output level L1 (step 5.
A-254 682XXB/683XXB MM TEST MODEL RECORD 68295B/68395B 3-16 Pulse Modulation Test: RF On/Off Ratio Test Procedure (1 GHz) Lower Limit Measured V alue Upper Limit Set F1 to 1.
ANRITSU Model 68295B/68395B Date: __________________________ Serial Number __________________ Calibrated By: __________________________ 682XXB/683XXB MM A-255 4-7 Preliminary Calibration Procedure Step Step Completion 1. Internal DVM Calibration (calterm1 19) .
A-256 682XXB/683XXB MM 4-9 RF Level Calibration This calibration is performed using an automatic test system. Contact ANRITSU Customer Service for further information. 4-10 ALC Slope Calibration (68395B having Firmware Version 1.00 or above) Procedure Step Step Completion 5.
682XXB/683XXB MM A-257 4-13 FM Calibration (68295B/68395B with Firmware Version 1.00) Procedure Step Step Completion 1. FM Meter Calibration (calterm 123) ............................ ______________ 2. FM Of fset Balance Calibration (calterm 126) ....
A-258 682XXB/683XXB MM TEST MODEL RECORD 68295B/68395B 4-14 Phase Modulation ( F M) Calibration (Option 6) Procedure Step Step Completion 1. External Wide M Mode Sensitivity Calibration (calterm 149) .............. ______________ 2. Internal Wide M Mode Sensitivity Calibration (calterm 151) .
ANRITSU Model 68297B/68397B Date: __________________________ Serial Number __________________ Tested By: __________________________ 682XXB/683XXB MM A-259 3-6 Internal Time Base Aging Rate Test Test Procedure Measured V alue Upper Limit Record frequency error value .
A-260 682XXB/683XXB MM TEST MODEL RECORD 68297B/68397B 3-7 Frequency Synthesis Tests Coarse Loop/YIG Loop Test Procedure T est Frequency (in GHz) Measured V alue * T est Frequency (in GHz) Measured Value * 1.000 000 000 2.000 000 000 3.000 000 000 4.000 000 000 5.
682XXB/683XXB MM A-261 3-7 Frequency Synthesis Tests (Continued) Coarse Loop/YIG Loop Test Procedure (Continued) T est Frequency (in GHz) Measured V alue * T est Frequency (in GHz) Measured V alue * 51.000 000 000 52.000 000 000 53.000 000 000 54.000 000 000 55.
A-262 682XXB/683XXB MM TEST MODEL RECORD 68297B/68397B 3-8 Spurious Signals Test: RF Output Signals <2 GHz Test Procedure Measured V alue Upper Limit Set F1 to 10 MHz Record the presence of the worst case harmonic .......... Record the presence of the worst case non-harmonic .
682XXB/683XXB MM A-263 TEST MODEL RECORD 68297B/68397B 3-9 Harmonic Test: RF Output Signals From 2 to 20 GHz Test Procedure (2 to 10 GHz) Measure V alue Upper Limit Set F1 to 2.1 GHz Record the level of all harmonics of the 2.1 GHz carrier: 4.2 GHz (2nd harmonic) .
A-264 682XXB/683XXB MM TEST MODEL RECORD 68297B/68397B 3-10 Single Sideband Phase Noise Test Test Procedure Measured V alue Upper Limit Set F1 to 0.6 GHz Record the phase noise levels at these offsets: 100 Hz ............................... 1 kHz ....
682XXB/683XXB MM A-265 TEST MODEL RECORD 68297B/68397B 3-10 Single Sideband Phase Noise Test (Continued) Test Procedure Measured V alue Upper Limit Set F1 to 26.5 GHz Record the phase noise levels at these offsets: 100 Hz .............................
A-266 682XXB/683XXB MM TEST MODEL RECORD 68297B/68397B 3-11 Power Level Accuracy and Flatness Tests (Model 68297B/68397B) Power Level Accuracy Test Procedure Set F1 to 5.
682XXB/683XXB MM A-267 TEST MODEL RECORD 68297B/68397B 3-12 Amplitude Modulation Test AM Imput Sensitivity Procedure Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the Modulation Analyzer AM PK(+) reading ........... Measure and record the Modulation Analyzer AM PK(–) reading .
A-268 682XXB/683XXB MM TEST MODEL RECORD 68297B/68397B 3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level Rise Time, Fall Time, and Overshoot Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Measure and record the following: Rise T ime .
682XXB/683XXB MM A-269 TEST MODEL RECORD 68297B/68397B 3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level (Continued) Pulse Level Accuracy (5 GHz, Pulse Width = 0.5 m s) Lower Limit Measured V alue Upper Limit Set F1 to 5.0 GHz Set pulse width W1 to 5.
A-270 682XXB/683XXB MM TEST MODEL RECORD 68297B/68397B 3-16 Pulse Modulation Test: RF On/Off Ratio Test Procedure (1 GHz) Lower Limit Measured V alue Upper Limit Set F1 to 1.
ANRITSU Model 68297B/68397B Date: __________________________ Serial Number __________________ Calibrated By: __________________________ 682XXB/683XXB MM A-271 4-7 Preliminary Calibration Procedure Step Step Completion 1. Internal DVM Calibration (calterm1 19) .
A-272 682XXB/683XXB MM TEST MODEL RECORD 68297B/68397B 4-10 ALC Slope Calibration (68397B having Firmware Version 2.00 or above) Procedure Step Step Completion 5. ALC Slope DAC adjustment ................................ ______________ 6. Store the DAC setting value(s) .
682XXB/683XXB MM A-273 TEST MODEL RECORD 68297B/68397B 4-13 FM Calibration (68297B/68397B with Firmware Version 1.01 to 2.10) Procedure Step Step Completion 1. FM Meter Calibration (calterm 123) ............................ ______________ 2. FM Of fset Balance Calibration (calterm 126) .
A-274 682XXB/683XXB MM TEST MODEL RECORD 68297B/68397B 4-14 Phase Modulation ( F M) Calibration (Option 6) Procedure Step Step Completion 1. External Wide M Mode Sensitivity Calibration (calterm 149) .............. ______________ 2. Internal Wide M Mode Sensitivity Calibration (calterm 151) .
Subject Index 0 - 9 682XXB/683XXB Assembly and Component Locator Diagram, 6-9 General Description, 1-3 Major Subsystems Functional Description, 2-3 Manuals, Related, 1-6 Models, List of, 1-4 - 1-5 Opt.
N Normal Operation Error/W arning Messages, 5-7 O Options, List of, 1-7 P Parts and Subassemblies, Replaceable, 1-14 Parts Ordering Information, 1-14 ANRITSU Service Centers, 1-14 Performance V erific.
Un point important après l'achat de l'appareil (ou même avant l'achat) est de lire le manuel d'utilisation. Nous devons le faire pour quelques raisons simples:
Si vous n'avez pas encore acheté Anritsu 683XXB c'est un bon moment pour vous familiariser avec les données de base sur le produit. Consulter d'abord les pages initiales du manuel d'utilisation, que vous trouverez ci-dessus. Vous devriez y trouver les données techniques les plus importants du Anritsu 683XXB - de cette manière, vous pouvez vérifier si l'équipement répond à vos besoins. Explorant les pages suivantes du manuel d'utilisation Anritsu 683XXB, vous apprendrez toutes les caractéristiques du produit et des informations sur son fonctionnement. Les informations sur le Anritsu 683XXB va certainement vous aider à prendre une décision concernant l'achat.
Dans une situation où vous avez déjà le Anritsu 683XXB, mais vous avez pas encore lu le manuel d'utilisation, vous devez le faire pour les raisons décrites ci-dessus,. Vous saurez alors si vous avez correctement utilisé les fonctions disponibles, et si vous avez commis des erreurs qui peuvent réduire la durée de vie du Anritsu 683XXB.
Cependant, l'un des rôles les plus importants pour l'utilisateur joués par les manuels d'utilisateur est d'aider à résoudre les problèmes concernant le Anritsu 683XXB. Presque toujours, vous y trouverez Troubleshooting, soit les pannes et les défaillances les plus fréquentes de l'apparei Anritsu 683XXB ainsi que les instructions sur la façon de les résoudre. Même si vous ne parvenez pas à résoudre le problème, le manuel d‘utilisation va vous montrer le chemin d'une nouvelle procédure – le contact avec le centre de service à la clientèle ou le service le plus proche.
